Lownoise Single Photon Avalanche Diodes In 015 M Cmos Technology
- doi: 10.1109/ESSDERC.2011.6044205
-
title: Low-noise single Photon Avalanche Diodes in 0.15
μm CMOS technology
- publisher: IEEE
- isbn: 978-1-4577-0706-3
- issn: 1930-8876
- partnum: 11EX5535
- rank: 2950
- access_type: LOCKED
- content_type: Conferences
-
abstract: Two different Single-Photon Avalanche Diode
(SPAD) structures in a standard 0.15-nm CMOS technology are presented. A
characterization of the two detectors, having a 10-μm active-area
diameter, and monolithically integrated with a passive quenching circuit
and a fast comparator is presented. The two devices exhibit respectively
a typical dark count rate of 230cps and 160cps, an afterpulsing
probability of 2.1% and 1.3% at 30ns dead time, a Photon Detection
Probability of 31% and 26 % at λ=470nm and a timing resolution of 170ps
and 60ps. The adopted technology is therefore promising for the
realization of SPAD-based image sensors with good overall performance.
- article_number: 6044205
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6044205
-
html_url:
https://ieeexplore.ieee.org/document/6044205/
-
abstract_url:
https://ieeexplore.ieee.org/document/6044205/
-
publication_title: 2011 Proceedings of the European
Solid-State Device Research Conference (ESSDERC)
- conference_location: Helsinki, Finland
- conference_dates: 12-16 Sept. 2011
- publication_number: 6034694
- is_number: 6044153
- publication_year: 2011
- publication_date: 12-16 Sept. 2011
- start_page: 179
- end_page: 182
- citing_paper_count: 27
- citing_patent_count: 0
- download_count: 1188
- insert_date: 20111013
-
index_terms:
-
ieee_terms:
- CMOS integrated circuits
- CMOS technology
- Junctions
- Photonics
- Temperature measurement
- Detectors
- Timing
-
dynamic_index_terms:
- CMOS Technology
- Avalanche Diode
- Single-photon Avalanche Diode
- Time Resolution
- Image Sensor
- Camera Sensor
- Dead Time
- Standard Technology
- Dark Count Rate
- Active Area
- High Voltage
- Higher Tendency
- Pulse Width
- Pulsewidth Modulation
- Function Of Voltage
- Readout Circuit
- Buried Layer
-
isbn_formats:
-
format: Online ISBN,
value: 978-1-4577-0706-3,
isbnType: New-2005
-
format: Print ISBN,
value: 978-1-4577-0707-0,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-4577-0708-7,
isbnType: New-2005
-
authors:
-
Author Name: Lucio Pancheri
Affiliation: Integrated Optical Sensors and
Interfaces, Fondazione Bruno Kessler, Trento, Italy
Author URL:
https://ieeexplore.ieee.org/author/37282907500
ID: 37282907500
Order: 1
Author Affiliations:
-
Integrated Optical Sensors and Interfaces, Fondazione Bruno
Kessler, Trento, Italy
-
Author Name: David Stoppa
Affiliation: Integrated Optical Sensors and
Interfaces, Fondazione Bruno Kessler, Trento, Italy
Author URL:
https://ieeexplore.ieee.org/author/37268553400
ID: 37268553400
Order: 2
Author Affiliations:
-
Integrated Optical Sensors and Interfaces, Fondazione Bruno
Kessler, Trento, Italy
Image Sensor
- sensor_type: CMOS
- resolution: not specified
- dynamic_range: not specified
- pixel_size: not specified
-
dark_current: 230 cps (pwell/niso), 160 cps (p+/nwell)
Optical Data
- focal_length: not specified
- aperture: not specified
- field_of_view: not specified
- distortion: not specified
Performance Metrics
Applications & Benefits
-
cell_imaging: time-resolved fluorescence microscopy
-
benefits: SPADs allow for shot-noise limited operation
and excellent timing resolution.
Supporting Organizations
-
supported_by: Provincia Autonoma of Trento, Italy
Manuscript Details
- publication_date: 12-16 Sept. 2011
Relevancy Score
- score: 7
-
missing_fields:
- resolution
- dynamic_range
- pixel_size
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
- focal_length
- aperture
- field_of_view
- distortion
Processed JSON Filename
request_42702e02-67dd-425a-92ff-4a7b600c83dd-lownoise_single_photon_avalanche_diodes_in_015_m_cmos_technology.json