Lowcost Logarithmic Cmos Image Sensing By Nonlinear Analogtodigital Conversion

• doi: 10.1109/TCE.2005.1561846
• title: Low-cost logarithmic CMOS image sensing by nonlinear analog-to-digital conversion
• publisher: IEEE
• isbn:
• issn: 1558-4127
• rank: 2947
• access_type: LOCKED
• content_type: Journals
• abstract: In this paper we present a CMOS image sensor design with a better sensitivity to low light intensity. This feature is achieved through a multi-resolution analog-to-digital converter (ADC). By doing so, the photo-electrical characteristic of a sensor cell can is finely tuned. A cost-effective architecture for realizing the required ADC is also proposed. This architecture leads to a faster conversion time as well as a smaller area. A simulation environment with post-layout accuracy is incorporated to demonstrate the advantages. It shows that a number of images can be captured more clearly than a traditional sensor.
• article_number: 1561846
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1561846
• html_url: https://ieeexplore.ieee.org/document/1561846/
• abstract_url: https://ieeexplore.ieee.org/document/1561846/
• publication_title: IEEE Transactions on Consumer Electronics
• conference_location:
• conference_dates:
• publication_number: 30
• is_number: 33160
• publication_year: 2005
• publication_date: Nov. 2005
• start_page: 1212
• end_page: 1217
• citing_paper_count: 5
• citing_patent_count: 1
• download_count: 282
• insert_date: 20051219
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Analog-digital conversion
    • Sensor arrays
    • Silicon
    • Sensor phenomena and characterization
    • Image converters
    • Charge coupled devices
    • Circuits
    • Pixel
    • Voltage
  • dynamic_index_terms:
    • Small Area
    • Light Intensity
    • Simulation Environment
    • Low Light Intensity
    • Sensor Design
    • Photodiode
    • Voltage Drop
    • Potential Drop
    • IR Drop
    • Lookup Table
    • Photocurrent
    • Integration Step
    • Clock Cycles
    • Successive Approximation
    • Digital Code
    • Storage Nodes
    • Analog Voltage
    • Output Pixel
    • Output Code
    • Silicon Area
• authors:
  • Author Name: Ying-Chieh Chuang
    Affiliation: Silicon Integrated Systems Corporation, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087906463
    ID: 37087906463
    Order: 1
    Author Affiliations:
    • Silicon Integrated Systems Corporation, Taiwan
  • Author Name: Shih-Fang Chen
    Affiliation: Silicon Integrated Systems Corporation, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087173371
    ID: 37087173371
    Order: 2
    Author Affiliations:
    • Silicon Integrated Systems Corporation, Taiwan
  • Author Name: Shi-Yu Huang
    Affiliation: Electrical Engineering Department, National Tsing Hua University, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087149368
    ID: 37087149368
    Order: 3
    Author Affiliations:
    • Electrical Engineering Department, National Tsing Hua University, Hsinchu, Taiwan
  • Author Name: Ya-Chin King
    Affiliation: Electrical Engineering Department, National Tsing Hua University, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087148289
    ID: 37087148289
    Order: 4
    Author Affiliations:
    • Electrical Engineering Department, National Tsing Hua University, Hsinchu, Taiwan

Image Sensor

• sensor_type: CMOS
• resolution: 176 x 144 (QCIF)
• dynamic_range: Lower than CCD
• pixel_size: 7.5 x 7.5 µm²
• dark_current: Not explicitly mentioned, but acknowledged as an issue causing image quality degradation.

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 30 frames/s
• sensitivity: Low light sensitivity improved
• power_consumption: 30 mWatt
• noise: Fixed-pattern noise (FPN) acknowledged as an issue.

Applications & Benefits

• cell_imaging: Enhancement of low light intensity areas in images captured by CMOS sensors.
• benefits: Improved image quality under low light conditions using multi-resolution ADC.

Supporting Organizations

• supported_by: Silicon Integrated Systems Corp. and National Tsing-Hua University

Manuscript Details

• publication_date: Nov. 2005

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • use of microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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