Long Exposure Time Noise In Pinned Photodiode Cmos Image Sensors

• doi: 10.1109/LED.2018.2839711
• title: Long Exposure Time Noise in Pinned Photodiode CMOS Image Sensors
• publisher: IEEE
• isbn:
• issn: 1558-0563
• rank: 2905
• access_type: LOCKED
• content_type: Journals
• abstract: This letter focuses on a new noise source within a pinned photodiode in complimentary metal-oxide-semiconductor (CMOS) image sensors. The noise originates from the feedforward effect, which is related to the barrier height under the transfer gate during the exposure phase. TCAD simulations using the Monte Carlo method show that the barrier height varies with CMOS process fluctuations even for the same pixel design and applied voltage. Furthermore, a model extending our previous work is proposed. The model results indicate that a larger barrier height and shorter exposure time improve the noise performance. The same conclusion can also be obtained from the measurements of a prototype image sensor that can adjust the pixel implants.
• article_number: 8362966
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8362966
• html_url: https://ieeexplore.ieee.org/document/8362966/
• abstract_url: https://ieeexplore.ieee.org/document/8362966/
• publication_title: IEEE Electron Device Letters
• conference_location:
• conference_dates:
• publication_number: 55
• is_number: 8398557
• publication_year: 2018
• publication_date: July 2018
• start_page: 979
• end_page: 982
• citing_paper_count: 6
• citing_patent_count: 0
• download_count: 1205
• insert_date: 20180523
• index_terms:
  • ieee_terms:
    • Semiconductor device modeling
    • CMOS image sensors
    • Electric potential
    • Photodiodes
    • Semiconductor process modeling
    • Monte Carlo methods
    • CMOS process
  • author_terms:
    • CMOS image sensor
    • long exposure time noise
    • Monte Carlo simulation
    • feedforward effect
  • dynamic_index_terms:
    • Exposure Time
    • Image Sensor
    • Camera Sensor
    • PIN Photodiode
    • Monte Carlo Simulation
    • Monte Carlo Method
    • Noise Sources
    • Barrier Height
    • Noise Performance
    • Exposure Phase
    • TCAD Simulation
    • Spatial Domain
    • Low Noise
    • Solid Curve
    • Influence Of Noise
    • Dark Current
    • Pixel Array
    • Saturation Region
    • Emission Current
    • Knee Point
    • Temporal Noise
    • Level-2 Model
• authors:
  • Author Name: Liqiang Han
    Affiliation: School of Electrical and Information Engineering, Tianjin University, Tianjin, China
    Author URL: https://ieeexplore.ieee.org/author/37085733626
    ID: 37085733626
    Order: 1
    Author Affiliations:
    • School of Electrical and Information Engineering, Tianjin University, Tianjin, China
  • Author Name: Jiangtao Xu
    Affiliation: School of Microelectronics, Tianjin University, Tianjin, China
    Author URL: https://ieeexplore.ieee.org/author/37577831800
    ID: 37577831800
    Order: 2
    Author Affiliations:
    • School of Microelectronics, Tianjin University, Tianjin, China

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: 15×15 μm²
• dark_current: 5 mV/s (at 301 K)

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• noise: 3.5 mV_rms for Pixel A and 0.02 lux ×s for Pixel B

Applications & Benefits

• cell_imaging: Not specified
• benefits: Not specified

Supporting Organizations

• supported_by: National Natural Science Foundation of China and Tianjin Research Program of Application Foundation and Advanced Technology

Manuscript Details

• publication_date: July 2018

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • cell_imaging
  • benefits

Processed JSON Filename

request_238750cf-5c46-4eb4-8b9c-ddf571fe1eac-long_exposure_time_noise_in_pinned_photodiode_cmos_image_sensors.json