Logarithmic Cmos Image Sensor Through Multiresolution Analogtodigital Conversion

• doi: 10.1109/VTSA.2003.1252594
• title: Logarithmic CMOS image sensor through multi-resolution analog-to-digital conversion
• publisher: IEEE
• isbn: 0-7803-7765-6
• issn: 1524-766X
• partnum: 03TH8672
• rank: 2904
• access_type: LOCKED
• content_type: Conferences
• abstract: In this paper we present a CMOS image sensor design with a better sensitivity to low light intensity. This feature is achieved through a multi-resolution analog-to-digital converter (ADC). By doing so, the opto-electrical characteristic of a sensor cell can be finely tuned. A cost-effective architecture for realizing the required ADC is also proposed. This architecture leads to a faster conversion time as well as a smaller area. A simulation environment with post-layout accuracy is incorporated to demonstrate the advantages. It shows that a number of images can be captured more clearly than a traditional sensor.
• article_number: 1252594
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1252594
• html_url: https://ieeexplore.ieee.org/document/1252594/
• abstract_url: https://ieeexplore.ieee.org/document/1252594/
• publication_title: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672)
• conference_location: Hsinchu, Taiwan
• conference_dates: 6-8 Oct. 2003
• publication_number: 8875
• is_number: 28033
• publication_year: 2003
• publication_date: 6-8 Oct. 2003
• start_page: 227
• end_page: 230
• citing_paper_count: 3
• citing_patent_count: 2
• download_count: 233
• insert_date: 20041108
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Analog-digital conversion
    • Sensor arrays
    • Sensor phenomena and characterization
    • Image converters
    • Image sensors
    • Charge coupled devices
    • Circuits
    • Pixel
    • Voltage
  • dynamic_index_terms:
    • Light Intensity
    • Low Light Intensity
    • Sensor Design
    • Transfer Function
    • Photodiode
    • Current Source
    • Current Regulations
    • Lookup Table
    • Photocurrent
    • Integration Step
    • Clock Cycles
    • Successive Approximation
    • Digital Code
    • Storage Nodes
    • Output Code
    • Silicon Area
    • SPICE Simulations
• isbn_formats:
  • format: Print ISBN, value: 0-7803-7765-6, isbnType: Historical
• authors:
  • Author Name: Shih-Fang Chen
    Affiliation: Electrical Engineering Department, National Tsing Hua University, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087173371
    ID: 37087173371
    Order: 1
    Author Affiliations:
    • Electrical Engineering Department, National Tsing Hua University, Taiwan
  • Author Name: Ying-Jie Juang
    Affiliation: Electrical Engineering Department, National Tsing Hua University, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087554974
    ID: 37087554974
    Order: 2
    Author Affiliations:
    • Electrical Engineering Department, National Tsing Hua University, Taiwan
  • Author Name: Shi-Yu Huang
    Affiliation: Electrical Engineering Department, National Tsing Hua University, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087149368
    ID: 37087149368
    Order: 3
    Author Affiliations:
    • Electrical Engineering Department, National Tsing Hua University, Taiwan
  • Author Name: Ya-Chin King
    Affiliation: Electrical Engineering Department, National Tsing Hua University, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087148289
    ID: 37087148289
    Order: 4
    Author Affiliations:
    • Electrical Engineering Department, National Tsing Hua University, Taiwan

Image Sensor

• sensor_type: CMOS
• resolution: 176x144
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: The CMOS image sensor enables clearer image capture in low light conditions and implements a multi-resolution ADC for enhanced performance.
• benefits: Improves image quality for low light intensity applications.

Supporting Organizations

• supported_by: TwinHan Technology Corporation, Taiwan.

Manuscript Details

• publication_date: 6-8 Oct. 2003

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • design considerations (microlenses, on-chip colour filters, global or rolling shutters, backside illumination)

Processed JSON Filename

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