Inpixel Adc In 3D Technology

• doi: 10.1109/NEWCAS.2017.8010103
• title: In-pixel ADC in 3D technology
• publisher: IEEE
• isbn: 978-1-5090-4992-9
• issn:
• rank: 2767
• access_type: LOCKED
• content_type: Conferences
• abstract: Decreasing size of CMOS technology plays a key role in embedding more and more functionalities in CMOS image sensors. By integrating sensing with processing, new types of CMOS imaging systems can be designed and applied in domains such as machine vision, surveillance, or medical imaging. Digital pixel sensors (DPSs) are a good example of smart vision chips including image capturing and processing modules. Indeed, they incorporate, for each pixel, parallel analog-to-digital conversion thus allowing performing such conversion in early stages. Moreover, DPSs offer several benefits such as an improved SNR (Signal Noise Ratio) and a wider dynamic range. In addition, the emergence of new technologies, typically CMOS 3D-IC technology, offers the opportunity to reduce pixel area and improve fill factor, making DPSs suitable for numerous fields of applications. This paper presents a digital pixel sensor (DPS) integrating an in-pixel sigma-delta analog-to-digital converter (ADC). The digital pixel includes a photodiode, a delta-sigma modulation and a digital decimation filter, featuring high-speed conversion, programmable resolutions (up to 10-bit). Based on the CMOS 130 nm 3D-IC Tezzaron technology, an optimized design of the pixel is provided, revealing a high fill-factor of about 90%.
• article_number: 8010103
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8010103
• html_url: https://ieeexplore.ieee.org/document/8010103/
• abstract_url: https://ieeexplore.ieee.org/document/8010103/
• publication_title: 2017 15th IEEE International New Circuits and Systems Conference (NEWCAS)
• conference_location: Strasbourg, France
• conference_dates: 25-28 June 2017
• publication_number: 8001599
• is_number: 8010082
• publication_year: 2017
• publication_date: 25-28 June 2017
• start_page: 53
• end_page: 56
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 564
• insert_date: 20170814
• index_terms:
  • ieee_terms:
    • Image sensors
    • Photodiodes
    • CMOS technology
    • Layout
    • Analog-digital conversion
    • Dynamic range
  • dynamic_index_terms:
    • 3D Technology
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Medical Imaging
    • Clinical Imaging
    • Diagnostic Imaging
    • Dynamic Range
    • Photodiode
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Image Sensor
    • Camera Sensor
    • Fill Factor
    • Machine Vision
    • Visual Navigation
    • Digital Sensor
    • Emergence Of New Technologies
    • Growth Of New Technologies
    • Surveillance Imaging
    • Delta-sigma
    • Sigma-delta
    • High-resolution
    • Image Processing
    • Building Blocks
    • Power Consumption
    • Bottom Layer
    • Sample Holder
    • Voltage Signal
    • Analog Circuits
    • High Dynamic Range
    • Pixel Pitch
    • Bitstream
    • Binary Sequence
    • Digital Circuits
    • Digital Circuitry
    • Pixel Level
    • Digital Architecture
    • Silicon Area
    • High Range Resolution
    • Image Processing Applications
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-4992-9, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-4991-2, isbnType: New-2005
• authors:
  • Author Name: Nicolas Brochard
    Affiliation: Le2i Laboratoire Electronique Informatique et Image CNRS, Arts et Métiers Univ. Bourgogne Franche-Comté, Dijon, France
    Author URL: https://ieeexplore.ieee.org/author/37086196415
    ID: 37086196415
    Order: 1
    Author Affiliations:
    • Le2i Laboratoire Electronique Informatique et Image CNRS, Arts et Métiers Univ. Bourgogne Franche-Comté, Dijon, France
  • Author Name: Dominique Ginhac
    Affiliation: Le2i Laboratoire Electronique Informatique et Image CNRS, Arts et Métiers Univ. Bourgogne Franche-Comté, Dijon, France
    Author URL: https://ieeexplore.ieee.org/author/37550324400
    ID: 37550324400
    Order: 2
    Author Affiliations:
    • Le2i Laboratoire Electronique Informatique et Image CNRS, Arts et Métiers Univ. Bourgogne Franche-Comté, Dijon, France

Image Sensor

• sensor_type: CMOS
• resolution: Not specified in the text
• dynamic_range: 42 dB
• pixel_size: 32.5 x 32.5 µm
• dark_current: Not specified in the text

Optical Data

• focal_length: Not specified in the text
• aperture: Not specified in the text
• field_of_view: Not specified in the text
• distortion: Not specified in the text

Performance Metrics

• frame_rate: 10,000 Frames/s
• signal_to_noise_ratio: Not specified in the text
• sensitivity: Not specified in the text
• shutter_speed: Not specified in the text
• power_consumption: 17 pJ/frame
• noise: Not specified in the text

Applications & Benefits

• cell_imaging: Applications include machine vision, surveillance, and medical imaging.
• benefits: Improved SNR, wider dynamic range, reduced costs, lower power consumption, smaller size.

Supporting Organizations

• supported_by: Direction Générale de l'Armement (DGA)

Manuscript Details

• publication_date: 25-28 June 2017

Relevancy Score

• score: 10
• missing_fields:
  • quantum_efficiency
  • readout_speed
  • temporal_noise
  • fixed_pattern_noise
  • microlenses
  • on_chip_colour_filters
  • global_or_rolling_shutters
  • backside_illumination

Processed JSON Filename

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