Indirectfeedback Sigmadelta Image Sensors Theory Modeling And Design

• doi: 10.1109/TCSI.2013.2268512
• title: Indirect-Feedback Sigma-Delta Image Sensors: Theory, Modeling and Design
• publisher: IEEE
• isbn:
• issn: 1558-0806
• rank: 2776
• access_type: LOCKED
• content_type: Journals
• abstract: A novel architecture for a CMOS image sensor that incorporates a column-level sigma-delta (ΣΔ) analog-to-digital converter is presented. An indirect-feedback readout architecture where the digital output of the ΣΔ modulator is accumulated by a digital counter and converted to an analog voltage that serves as the reference voltage in the modulator's comparator is employed. A time-domain pixel simulator that enables assessment of the major noise contributions in this type of imager is also presented. Theoretical calculations agree with simulation results, showing a minimum readout noise of 2.18e- and a dynamic range (DR) of over 100 dB. Prototype chip tests without multiple resets show an 87 dB dynamic range with a readout noise of 2.17e-.
• article_number: 6557107
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6557107
• html_url: https://ieeexplore.ieee.org/document/6557107/
• abstract_url: https://ieeexplore.ieee.org/document/6557107/
• publication_title: IEEE Transactions on Circuits and Systems I: Regular Papers
• conference_location:
• conference_dates:
• publication_number: 8919
• is_number: 6704325
• publication_year: 2014
• publication_date: Jan. 2014
• start_page: 48
• end_page: 60
• citing_paper_count: 1
• citing_patent_count: 1
• download_count: 1038
• insert_date: 20130710
• index_terms:
  • ieee_terms:
    • Noise
    • Quantization (signal)
    • Integrated circuit modeling
    • Photodiodes
    • Transistors
    • Modulation
    • Simulation
  • author_terms:
    • High dynamic range
    • indirect-feedback $\Sigma\Delta$ image sensor
    • noise modeling
    • time-domain simulator
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Simulation Results
    • Dynamic Range
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Electron Counting
    • Digital Counting
    • Test Chip
    • Low Light
    • Noise Sources
    • Root Mean Square Values
    • Rms Value
    • Thermal Noise
    • Current Noise
    • Noise Power
    • Noise Model
    • Input Levels
    • Comparable Yields
    • Comparator Output
    • Comparison Of Yield
    • Comparison Of Outputs
    • Bitstream
    • Binary Sequence
    • Shot Noise
    • Poisson Noise
    • Dark Current
    • Least Significant Bit
    • Low Bit
    • Quantization Noise
    • Total Noise
    • Low Illumination
    • Readout Circuit
    • Start-up Phase
    • Reset Voltage
    • Readout Scheme
    • Readout Strategy
    • Nyquist Rate
    • Nyquist Sampling Rate
    • High Illumination
    • Illumination Levels
    • Noise Performance
    • Output Bits
• authors:
  • Author Name: Zhe Gao
    Affiliation: Electrical and Computer Engineering Department, University of Rochester, Rochester, NY, USA
    Author URL: https://ieeexplore.ieee.org/author/37072553500
    ID: 37072553500
    Order: 1
    Author Affiliations:
    • Electrical and Computer Engineering Department, University of Rochester, Rochester, NY, USA
  • Author Name: John C. Liobe
    Affiliation: ADVIS, Inc., Rochester, NY, USA
    Author URL: https://ieeexplore.ieee.org/author/37266665700
    ID: 37266665700
    Order: 2
    Author Affiliations:
    • ADVIS, Inc., Rochester, NY, USA
  • Author Name: Mark F. Bocko
    Affiliation: Electrical and Computer Engineering Department, University of Rochester, Rochester, NY, USA
    Author URL: https://ieeexplore.ieee.org/author/37270106500
    ID: 37270106500
    Order: 3
    Author Affiliations:
    • Electrical and Computer Engineering Department, University of Rochester, Rochester, NY, USA
  • Author Name: Zeljko Ignjatovic
    Affiliation: Electrical and Computer Engineering Department, University of Rochester, Rochester, NY, USA
    Author URL: https://ieeexplore.ieee.org/author/37270103900
    ID: 37270103900
    Order: 4
    Author Affiliations:
    • Electrical and Computer Engineering Department, University of Rochester, Rochester, NY, USA

Image Sensor

• sensor_type: CMOS
• resolution: 128x128
• dynamic_range: 87 dB
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• signal_to_noise_ratio: 13 dB
• noise: 2.17e- (read noise)

Applications & Benefits

• cell_imaging: The indirect-feedback image sensor has great potential for low-light imaging and low-light video applications.
• benefits: High dynamic range and low read noise enabling excellent image quality in various applications.

Supporting Organizations

• supported_by: Office of Naval Research, Exelis ITT, New York State Office of Science and Technology

Manuscript Details

• publication_date: Jan. 2014

Relevancy Score

• score: 10
• missing_fields:
  • pixel size
  • fill factor
  • quantum efficiency
  • dark current
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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