Improving White Pixel Through The Optimization Of Structure And
Implantation In Cis Device
- doi: 10.1109/CSTIC55103.2022.9856882
-
title: Improving White Pixel Through the Optimization
of Structure and Implantation in CIS Device
- publisher: IEEE
- isbn: 978-1-6654-9759-6
- issn:
- rank: 2756
- access_type: LOCKED
- content_type: Conferences
-
abstract: White pixel is one of the most important
indicators of the CMOS image sensor, which represents the sensitivity of
a photodiode. In this work, we propose a viable method to improve the
white pixel performance through the optimization of surface
implantation. Experimentally, white pixel could be improved
dramatically, while other pixel capabilities still keep in a high level.
Meanwhile, the physical model is proposed, including the illustration of
parallel and perpendicular diffusion of implanted ions, which would
further benefit the design and development of high-performance image
sensor.
- article_number: 9856882
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9856882
-
html_url:
https://ieeexplore.ieee.org/document/9856882/
-
abstract_url:
https://ieeexplore.ieee.org/document/9856882/
-
publication_title: 2022 China Semiconductor Technology
International Conference (CSTIC)
- conference_location: Shanghai, China
- conference_dates: 20-21 June 2022
- publication_number: 9856647
- is_number: 9856709
- publication_year: 2022
- publication_date: 20-21 June 2022
- start_page: 1
- end_page: 3
- citing_paper_count: 0
- citing_patent_count: 0
- download_count: 977
- insert_date: 20220823
-
index_terms:
-
ieee_terms:
- Semiconductor device modeling
- Sensitivity
- CMOS image sensors
- Ions
- Photodiodes
- Optimization
-
dynamic_index_terms:
- White Pixels
- Photodiode
- Image Sensor
- Camera Sensor
- Surveillance System
- Metal Contamination
- Magnitude Of Shift
- Pixel Shift
-
isbn_formats:
-
format: Print on Demand(PoD) ISBN,
value: 978-1-6654-9759-6,
isbnType: New-2005
-
format: USB ISBN,
value: 978-1-6654-9757-2,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-6654-9758-9,
isbnType: New-2005
-
authors:
-
Author Name: Lu Wang
Affiliation: Shanghai Huali Microelectronics
Corporation, Shanghai, China
Author URL:
https://ieeexplore.ieee.org/author/37089496156
ID: 37089496156
Order: 1
Author Affiliations:
-
Shanghai Huali Microelectronics Corporation, Shanghai, China
-
Author Name: Cuiyu Mei
Affiliation: Shanghai Huali Microelectronics
Corporation, Shanghai, China
Author URL:
https://ieeexplore.ieee.org/author/37089497164
ID: 37089497164
Order: 2
Author Affiliations:
-
Shanghai Huali Microelectronics Corporation, Shanghai, China
-
Author Name: Jiong Xu
Affiliation: Shanghai Huali Microelectronics
Corporation, Shanghai, China
Author URL:
https://ieeexplore.ieee.org/author/37088901479
ID: 37088901479
Order: 3
Author Affiliations:
-
Shanghai Huali Microelectronics Corporation, Shanghai, China
-
Author Name: Chang Sun
Affiliation: Shanghai Huali Microelectronics
Corporation, Shanghai, China
Author URL:
https://ieeexplore.ieee.org/author/37086094297
ID: 37086094297
Order: 4
Author Affiliations:
-
Shanghai Huali Microelectronics Corporation, Shanghai, China
Image Sensor
- sensor_type: CMOS
- resolution: Not specified
- dynamic_range: Not specified
- pixel_size: Not specified
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
Applications & Benefits
- cell_imaging: Not specified
- benefits: Not specified
Supporting Organizations
-
supported_by: Shanghai Huali Microelectronics
Corporation
Manuscript Details
- publication_date: 20-21 June 2022
Relevancy Score
- score: 9
-
missing_fields:
- resolution
- dynamic_range
- pixel_size
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
- cell_imaging
- benefits
Processed JSON Filename
request_27e1f8cf-481e-4e80-97d2-aefca8fb84ca-improving_white_pixel_through_the_optimization_of_structure_and_implantation_in_cis_device.json