Hybrid Active Pixel Sensor With Highsensitivity And Extended Dynamic Range

• doi: 10.1109/IST.2014.6958464
• title: Hybrid active pixel sensor with high-sensitivity and extended dynamic range
• publisher: IEEE
• isbn: 978-1-4799-5220-5
• issn: 1558-2809
• rank: 2673
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a hybrid active pixel sensor (HAPS) with high-sensitivity and extended dynamic range without any complex circuit. The photodetector (PD) of the proposed HAPS is composed of a gate/body-tied (GBT) PD for high-sensitivity and a conventional n-well/p-sub PD on the same focal plane for attaining normal image. The gain of the GBT PD is a hundred-times larger compared to the conventional n-well/p-sub PD. The structure of the proposed APS is similar to the conventional 3-transistor APS. Only two transistors are added for selecting each PD (GBT PD and n-well/p-sub PD). Adding the two transfer switches allows to have two modes: the high-sensitivity mode for low-light level detection and the normal mode for higher image quality. In order to reduce pixel size of the proposed APS, the row select transistor is eliminated. Dynamic range of the proposed APS is increased to approximately 86 dB. Its pixel size is 10 μm2 for testing pixel performance. The proposed APS is being fabricated by using 1-poly 6-metal 0.18 μm standard CMOS technology.
• article_number: 6958464
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6958464
• html_url: https://ieeexplore.ieee.org/document/6958464/
• abstract_url: https://ieeexplore.ieee.org/document/6958464/
• publication_title: 2014 IEEE International Conference on Imaging Systems and Techniques (IST) Proceedings
• conference_location: Santorini, Greece
• conference_dates: 14-17 Oct. 2014
• publication_number: 6948378
• is_number: 6958430
• publication_year: 2014
• publication_date: 14-17 Oct. 2014
• start_page: 153
• end_page: 156
• citing_paper_count: 3
• citing_patent_count: 0
• download_count: 262
• insert_date: 20141120
• index_terms:
  • ieee_terms:
    • Logic gates
    • System-on-chip
    • Vehicle dynamics
  • author_terms:
    • active pixel sensor
    • hybrid
    • photodetector
    • high-sensitivity
    • dynamic range
  • dynamic_index_terms:
    • Dynamic Range
    • Active Sensors
    • Sensor Pixel
    • Active Pixel Sensor
    • Extended Dynamic Range
    • Focal Plane
    • Back Focal Plane
    • Detection Mode
    • Complex Circuits
    • Sensitive Mode
    • Operation Mode
    • Photodiode
    • Standard Process
    • Photocurrent
    • Image Sensor
    • Camera Sensor
    • Bipolar Transistor
    • Bipolar Junction Transistor
    • Collector Current
    • Phototransistor
• isbn_formats:
  • format: Electronic ISBN, value: 978-1-4799-5220-5, isbnType: New-2005
• authors:
  • Author Name: Sung-Hyun Jo
    Affiliation: School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37528762600
    ID: 37528762600
    Order: 1
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
  • Author Name: Myunghan Bae
    Affiliation: School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37718888800
    ID: 37718888800
    Order: 2
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
  • Author Name: Byoung-Soo Choi
    Affiliation: School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37085467553
    ID: 37085467553
    Order: 3
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
  • Author Name: Hong-Bae Park
    Affiliation: School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37334784000
    ID: 37334784000
    Order: 4
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
  • Author Name: Jang-Kyoo Shin
    Affiliation: School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea
    Author URL: https://ieeexplore.ieee.org/author/37288996500
    ID: 37288996500
    Order: 5
    Author Affiliations:
    • School of Electronics Engineering, Kyungpook National University, Buk-gu Daegu, Korea

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Approximately 86 dB
• pixel_size: 10 µm²
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Applicable in high-sensitivity and wide dynamic range image sensor applications.
• benefits: Enhances sensitivity and extends dynamic range without complex circuitry.

Supporting Organizations

• supported_by: National Research Foundation of Korea, Center for Integrated Smart Sensors, BK21 Plus program, Integrated Circuit Design Education Center.

Manuscript Details

• publication_date: 14-17 Oct. 2014

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

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