High Linearity Current Mode Image Sensor

• doi: 10.1109/EDSSC.2012.6482792
• title: High linearity current mode image sensor
• publisher: IEEE
• isbn: 978-1-4673-5695-4
• issn:
• partnum: 12EX7898
• rank: 2597
• access_type: LOCKED
• content_type: Conferences
• abstract: Current mode image sensors enable an easy implementation of focal plane algebraic functions, but suffer from poor linearity performance. A theoretical analysis is first performed on the source of the non-linearity for current mode image sensors. According to the analysis, an architecture of a current mode image sensor with a voltage feedback loop between pixel output and the current conveyor for linearity enhancement is proposed. An image sensor array of 100 × 200 current mode pixels is fabricated in 0.5um 2P3M standard CMOS processing technology. Experimental results illustrate a 45% improvement of the linearity of the proposed imager. Fixed pattern noise is reduced by 19% at the saturation level and signal to noise ratio of 49.6dB is achieved.
• article_number: 6482792
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6482792
• html_url: https://ieeexplore.ieee.org/document/6482792/
• abstract_url: https://ieeexplore.ieee.org/document/6482792/
• publication_title: 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC)
• conference_location: Bangkok, Thailand
• conference_dates: 3-5 Dec. 2012
• publication_number: 6475438
• is_number: 6482757
• publication_year: 2012
• publication_date: 3-5 Dec. 2012
• start_page: 1
• end_page: 4
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 254
• insert_date: 20130321
• index_terms:
  • ieee_terms:
    • Linearity
    • Transistors
    • Image sensors
    • Resistance
    • Noise
    • Feedback loop
    • Arrays
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Current Image
    • Current Sensor
    • Feedback Loop
    • Saturation Level
    • Sensor Array
    • Implementation Of Functions
    • Pixel Array
    • Current Pixel
    • Voltage Feedback
    • Light Intensity
    • Low Voltage
    • Carrier Mobility
    • Electron Mobility
    • Hole Mobility
    • Voltage Drop
    • Potential Drop
    • IR Drop
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • I-V Curves
    • Current Voltage Characteristics
    • I-V Characteristics
    • Output Current
    • Channel Length
    • Resistant Parasites
    • Fill Factor
    • Saturation Velocity
    • Readout Circuit
    • Transfer Curves
    • Transistor Size
    • Transistor Count
    • Feedback Modalities
    • Saturation Region
    • Linear Error
    • Top Metal Layer
    • Transimpedance Amplifier
    • Incident Light Intensity
• isbn_formats:
  • format: CD, value: 978-1-4673-5695-4, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4673-5694-7, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4673-5696-1, isbnType: New-2005
• authors:
  • Author Name: Xiaotie Wu
    Affiliation: Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
    Author URL: https://ieeexplore.ieee.org/author/37087931051
    ID: 37087931051
    Order: 1
    Author Affiliations:
    • Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
  • Author Name: Milin Zhang
    Affiliation: Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
    Author URL: https://ieeexplore.ieee.org/author/37087758993
    ID: 37087758993
    Order: 2
    Author Affiliations:
    • Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
  • Author Name: Jan Van der Spiegel
    Affiliation: Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
    Author URL: https://ieeexplore.ieee.org/author/37284390100
    ID: 37284390100
    Order: 3
    Author Affiliations:
    • Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA

Image Sensor

• sensor_type: CMOS
• resolution: 200x100
• dynamic_range: 49.6dB
• pixel_size: 12um x 12um
• dark_current: 1.2fA

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 30fps
• signal_to_noise_ratio: 49.6dB
• noise: 5.27% FPN without feedback; 4.29% FPN with feedback

Applications & Benefits

• cell_imaging: Not specified
• benefits: Improved linearity and reduced fixed pattern noise with the proposed feedback loop

Supporting Organizations

• supported_by: MOSIS

Manuscript Details

• publication_date: 3-5 Dec. 2012

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_34770729-ab47-49f9-bf37-f87f3e2d4b93-high_linearity_current_mode_image_sensor.json