High Conversiongain Pixels In A Standard Cmos Image Sensor Process

• doi: 10.1109/IPCon.2017.8116195
• title: High conversion-gain pixels in a standard CMOS image sensor process
• publisher: IEEE
• isbn: 978-1-5090-6579-0
• issn:
• rank: 2592
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a new technique to achieve high pixel conversion gain (CG) in a standard 0.18 um CMOS image sensor process. CG of 121 uV/e- and read noise of 3.2 erms are measured in the prototype sensor.
• article_number: 8116195
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8116195
• html_url: https://ieeexplore.ieee.org/document/8116195/
• abstract_url: https://ieeexplore.ieee.org/document/8116195/
• publication_title: 2017 IEEE Photonics Conference (IPC)
• conference_location: Orlando, FL, USA
• conference_dates: 1-5 Oct. 2017
• publication_number: 8106942
• is_number: 8115968
• publication_year: 2017
• publication_date: 1-5 Oct. 2017
• start_page: 485
• end_page: 486
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 885
• insert_date: 20171123
• index_terms:
  • author_terms:
    • CMOS image sensor
    • high conversion gain
    • low-light imaging
  • dynamic_index_terms:
    • High Pixel
    • CMOS Image Sensor Process
    • Conversion Gain
    • Sensor Prototype
    • Parasitic Capacitance
    • Sensor Noise
    • Input-referred Noise
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-6579-0, isbnType: New-2005
  • format: USB ISBN, value: 978-1-5090-6577-6, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-6578-3, isbnType: New-2005
• authors:
  • Author Name: Song Chen
    Affiliation: Dartmouth College, Thayer School of Engineering, Hanover, USA
    Author URL: https://ieeexplore.ieee.org/author/37086130621
    ID: 37086130621
    Order: 1
    Author Affiliations:
    • Dartmouth College, Thayer School of Engineering, Hanover, USA
  • Author Name: Eric R. Fossum
    Affiliation: Dartmouth College, Thayer School of Engineering, Hanover, USA
    Author URL: https://ieeexplore.ieee.org/author/37326789400
    ID: 37326789400
    Order: 2
    Author Affiliations:
    • Dartmouth College, Thayer School of Engineering, Hanover, USA

Image Sensor

• sensor_type: CMOS
• resolution: 224 (column) x 128 (row) pixels
• dynamic_range: not specified
• pixel_size: 5um x 5um
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• noise: 3.2 e- rms (peak) / 3.4 e- rms (median)

Applications & Benefits

• cell_imaging: not specified
• benefits: Improved low-light imaging performance and high conversion gain for quality images.

Supporting Organizations

• supported_by: Thayer School of Engineering at Dartmouth College, XFAB

Manuscript Details

• publication_date: 1-5 Oct. 2017

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • cell_imaging
  • benefits

Processed JSON Filename

request_354836dd-a7ae-446d-904f-21c980835642-high_conversiongain_pixels_in_a_standard_cmos_image_sensor_process.json