High Conversiongain Pinnedphotodiode Pumpgate Pixels In 180Nm Cmos Process

• doi: 10.1109/JEDS.2017.2748883
• title: High Conversion-Gain Pinned-Photodiode Pump-Gate Pixels in 180-nm CMOS Process
• publisher: IEEE
• isbn:
• issn: 2168-6734
• rank: 2578
• access_type: OPEN_ACCESS
• content_type: Journals
• abstract: This paper presents the design and characterization of high conversion-gain pixels in a 180-nm CMOS image sensor process. By reducing overlapping capacitance between a floating diffusion and transfer gate, output-referred pixel conversion gain as high as 118uV/eand read noise as low as 1.8erms are experimentally achieved without significant lag. A dark current of 38 pA/cm2 is measured at 60°C. Comparison between the proposed devices and a baseline pixel regarding device structure and characterization results is also presented.
• article_number: 8047441
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8047441
• html_url: https://ieeexplore.ieee.org/document/8047441/
• abstract_url: https://ieeexplore.ieee.org/document/8047441/
• publication_title: IEEE Journal of the Electron Devices Society
• conference_location:
• conference_dates:
• publication_number: 6245494
• is_number: 8081773
• publication_year: 2017
• publication_date: Nov. 2017
• start_page: 509
• end_page: 517
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 1735
• insert_date: 20170920
• index_terms:
  • ieee_terms:
    • Photodiodes
    • CMOS process
    • CMOS image sensors
    • Doping
    • Charge transfer
  • author_terms:
    • CMOS image sensor
    • high conversion gain
    • pump gate
    • low light imaging
    • pinned photodiode
  • dynamic_index_terms:
    • High Pixel
    • 180-nm CMOS
    • 180-nm Process
    • 180-nm CMOS Process
    • Image Sensor
    • Camera Sensor
    • Dark Current
    • Conversion Gain
    • High Diversity
    • High Variation
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Dynamic Range
    • Fabrication Process
    • High Gain
    • Light Levels
    • Gap Size
    • Doping Concentration
    • Minor Adjustments
    • Array Size
    • Set Of Curves
    • Small Barrier
    • Device Concept
    • Types Of Pixels
    • Input-referred Noise
    • Single-photon Avalanche Diode
    • Reset Gate
    • TCAD Simulation
• authors:
  • Author Name: Song Chen
    Affiliation: Thayer School of Engineering at Dartmouth, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37086130621
    ID: 37086130621
    Order: 1
    Author Affiliations:
    • Thayer School of Engineering at Dartmouth, Hanover, NH, USA
  • Author Name: Jiaju Ma
    Affiliation: Thayer School of Engineering at Dartmouth, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37085509302
    ID: 37085509302
    Order: 2
    Author Affiliations:
    • Thayer School of Engineering at Dartmouth, Hanover, NH, USA
  • Author Name: Donald B. Hondongwa
    Affiliation: Thayer School of Engineering at Dartmouth, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37085513984
    ID: 37085513984
    Order: 3
    Author Affiliations:
    • Thayer School of Engineering at Dartmouth, Hanover, NH, USA
  • Author Name: Eric R. Fossum
    Affiliation: Thayer School of Engineering at Dartmouth, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37326789400
    ID: 37326789400
    Order: 4
    Author Affiliations:
    • Thayer School of Engineering at Dartmouth, Hanover, NH, USA

Image Sensor

• sensor_type: CMOS
• resolution: 150(row) x 50(column)
• dynamic_range: Not specified
• pixel_size: 3.6 µm
• dark_current: 38.4 pA/cm² at 60°C

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• signal_to_noise_ratio: Not directly provided but suggested improvements to SNR with design
• noise: 1.8 e- rms (read noise)

Applications & Benefits

• cell_imaging: Enabling low-light imaging for industrial, scientific, and medical applications.
• benefits: High conversion gain leads to better low-light performance, reduced read noise, and improved image quality.

Supporting Organizations

• supported_by: Thayer School of Engineering at Dartmouth, X-FAB

Manuscript Details

• publication_date: Nov. 2017

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_792933a7-d6ce-4cde-8398-76aea3c06a97-high_conversiongain_pinnedphotodiode_pumpgate_pixels_in_180nm_cmos_process.json