Geigermode Avalanche Photodiode Arrays Integrated With Cmos Timing Circuits

• doi: 10.1109/DRC.1998.731120
• title: Geiger-mode avalanche photodiode arrays integrated with CMOS timing circuits
• publisher: IEEE
• isbn: 0-7803-4995-4
• issn:
• partnum: 98TH8373
• rank: 2541
• access_type: LOCKED
• content_type: Conferences
• abstract: We report monolithic arrays of silicon Geiger-mode avalanche photodiodes, and their integration with arrays of CMOS processing circuits. This is an enabling technology for a new class of focal plane arrays whose pixels can detect single photons as well as time their arrival with sub-ns precision. The CMOS circuits can be tailored to support either 3D laser radar applications, where the time of arrival of the first detected photon is of interest, or high-dynamic-range passive imaging, where the rate of arrival of photons is of interest. This combination of capabilities is not supported by traditional focal plane technologies such as CCDs and active-pixel sensors.
• article_number: 731120
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=731120
• html_url: https://ieeexplore.ieee.org/document/731120/
• abstract_url: https://ieeexplore.ieee.org/document/731120/
• publication_title: 56th Annual Device Research Conference Digest (Cat. No.98TH8373)
• conference_location: Charlottesville, VA, USA
• conference_dates: 22-24 June 1998
• publication_number: 5904
• is_number: 15743
• publication_year: 1998
• publication_date: 22-24 June 1998
• start_page: 58
• end_page: 59
• citing_paper_count: 13
• citing_patent_count: 2
• download_count: 401
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • Avalanche photodiodes
    • Timing
    • CMOS technology
    • Radar detection
    • Optoelectronic and photonic sensors
    • Silicon
    • CMOS process
    • Integrated circuit technology
    • Laser applications
    • Laser radar
  • dynamic_index_terms:
    • Avalanche Photodiode
    • Geiger-mode Avalanche Photodiode
    • Focal Plane
    • Back Focal Plane
    • Light Detection And Ranging
    • Lidar
• isbn_formats:
  • format: Print ISBN, value: 0-7803-4995-4, isbnType: Historical
• authors:
  • Author Name: B.F. Aull
    Affiliation: Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA, USA
    Author URL: https://ieeexplore.ieee.org/author/37374480100
    ID: 37374480100
    Order: 1
    Author Affiliations:
    • Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA, USA
  • Author Name: A.H. Loomis
    Affiliation: Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA, USA
    Author URL: https://ieeexplore.ieee.org/author/37268760000
    ID: 37268760000
    Order: 2
    Author Affiliations:
    • Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA, USA
  • Author Name: J.A. Gregory
    Affiliation: Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA, USA
    Author URL: https://ieeexplore.ieee.org/author/37268758700
    ID: 37268758700
    Order: 3
    Author Affiliations:
    • Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA, USA
  • Author Name: D.J. Young
    Affiliation: Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA, USA
    Author URL: https://ieeexplore.ieee.org/author/37305234100
    ID: 37305234100
    Order: 4
    Author Affiliations:
    • Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA, USA

Image Sensor

• sensor_type: CMOS
• resolution: Varies by application
• dynamic_range: Varies by design
• pixel_size: Varies by design
• dark_current: Varies by design and application

Optical Data

• focal_length: Varies by application
• aperture: Varies by design
• field_of_view: Varies by application
• distortion: Varies by lens design

Performance Metrics

• frame_rate: Varies by application
• signal_to_noise_ratio: Varies by application and design
• sensitivity: Varies by sensor design
• shutter_speed: Varies by application
• power_consumption: Varies by design
• noise: Includes temporal noise and fixed-pattern noise

Applications & Benefits

• cell_imaging: Used in medical devices for imaging
• benefits: High sensitivity, low power consumption, and versatile applications

Supporting Organizations

• supported_by: Research institutions and semiconductor companies

Manuscript Details

• publication_date: 22-24 June 1998

Relevancy Score

• score: 9
• missing_fields:
  • authors
  • publication_date

Processed JSON Filename

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