Fourdirectional Pixelwise Polarization Cmos Image Sensor Using Airgap Wire Grid On 25M Backilluminated Pixels

• doi: 10.1109/IEDM.2016.7838378
• title: Four-directional pixel-wise polarization CMOS image sensor using air-gap wire grid on 2.5-μm back-illuminated pixels
• publisher: IEEE
• isbn: 978-1-5090-3903-6
• issn: 2156-017X
• rank: 2521
• access_type: LOCKED
• content_type: Conferences
• abstract: Polarization information is useful in highly functional imaging. This paper presents a four-directional pixel-wise polarization CMOS image sensor using an air-gap wire grid on 2.5-μm back-illuminated pixels. The fabricated air-gap wire grid polarizer achieved a transmittance of 63.3 % and an extinction ratio of 85 at 550 nm, outperforming conventional polarization sensors. The pixel-wise polarizers fabricated with the wafer process on back-illuminated image sensors exhibit good oblique-incidence characteristics, even with small polarization pixels of 2.5 μm. The proposed image sensor realizes mega-pixel various fusion-imaging applications, such as surface reflection reduction, highly accurate depth mapping, and condition-robust surveillance.
• article_number: 7838378
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7838378
• html_url: https://ieeexplore.ieee.org/document/7838378/
• abstract_url: https://ieeexplore.ieee.org/document/7838378/
• publication_title: 2016 IEEE International Electron Devices Meeting (IEDM)
• conference_location: San Francisco, CA, USA
• conference_dates: 3-7 Dec. 2016
• publication_number: 7824662
• is_number: 7838021
• publication_year: 2016
• publication_date: 3-7 Dec. 2016
• start_page: 8.7.1
• end_page: 8.7.4
• citing_paper_count: 25
• citing_patent_count: 2
• download_count: 1899
• insert_date: 20170202
• index_terms:
  • ieee_terms:
    • Sensors
    • Image sensors
    • Extinction ratio
    • Air gaps
    • System-on-chip
    • Wires
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Wire Grid
    • Polarizability
    • Good Characteristics
    • Good Features
    • Surface Reflectance
    • Depth Map
    • Function Of Depth
    • Conventional Sensors
    • Extinction Ratio
    • Small Pixel
    • Polarization Information
    • Normal Vector
    • Focal Plane
    • Back Focal Plane
    • High Aspect Ratio
    • Air Gap
    • Incident Angle Of Light
    • Polarization Imaging
    • Specular Component
    • Small Pixel Size
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-3903-6, isbnType: New-2005
  • format: USB ISBN, value: 978-1-5090-3901-2, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-3902-9, isbnType: New-2005
• authors:
  • Author Name: Tomohiro Yamazaki
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37086073811
    ID: 37086073811
    Order: 1
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Yasushi Maruyama
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37086083297
    ID: 37086083297
    Order: 2
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Yusuke Uesaka
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088727082
    ID: 37088727082
    Order: 3
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Motoaki Nakamura
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088729074
    ID: 37088729074
    Order: 4
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Yoshihisa Matoba
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/38235618100
    ID: 38235618100
    Order: 5
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Takashi Terada
    Affiliation: Sony Semiconductor Manufacturing, Kumamoto, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088724525
    ID: 37088724525
    Order: 6
    Author Affiliations:
    • Sony Semiconductor Manufacturing, Kumamoto, Japan
  • Author Name: Kenta Komori
    Affiliation: Sony Semiconductor Manufacturing, Kumamoto, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088722318
    ID: 37088722318
    Order: 7
    Author Affiliations:
    • Sony Semiconductor Manufacturing, Kumamoto, Japan
  • Author Name: Yoshiyuki Ohba
    Affiliation: Sony Semiconductor Manufacturing, Kumamoto, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088731853
    ID: 37088731853
    Order: 8
    Author Affiliations:
    • Sony Semiconductor Manufacturing, Kumamoto, Japan
  • Author Name: Shinichi Arakawa
    Affiliation: Sony Semiconductor Manufacturing, Kumamoto, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088722715
    ID: 37088722715
    Order: 9
    Author Affiliations:
    • Sony Semiconductor Manufacturing, Kumamoto, Japan
  • Author Name: Yasutaka Hirasawa
    Affiliation: Sony, Osaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088724682
    ID: 37088724682
    Order: 10
    Author Affiliations:
    • Sony, Osaki, Japan
  • Author Name: Yuhi Kondo
    Affiliation: Sony, Osaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088738382
    ID: 37088738382
    Order: 11
    Author Affiliations:
    • Sony, Osaki, Japan
  • Author Name: Jun Murayama
    Affiliation: Sony, Osaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37073619900
    ID: 37073619900
    Order: 12
    Author Affiliations:
    • Sony, Osaki, Japan
  • Author Name: Kentaro Akiyama
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085828753
    ID: 37085828753
    Order: 13
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Yusuke Oike
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37267320700
    ID: 37267320700
    Order: 14
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Shuzo Sato
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088730168
    ID: 37088730168
    Order: 15
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Takayuki Ezaki
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/38235907400
    ID: 38235907400
    Order: 16
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 2065 x 1565
• dynamic_range: not specified
• pixel_size: 2.5 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 120 fps

Applications & Benefits

• cell_imaging: The sensor can be used in applications like surface reflection reduction, highly accurate depth mapping, and condition-robust surveillance.
• benefits: The sensor provides enhanced sensitivity and performance for various imaging applications by using pixel-wise polarization.

Supporting Organizations

• supported_by: Sony Semiconductor Solutions, Sony Semiconductor Manufacturing, Sony.

Manuscript Details

• publication_date: 3-7 Dec. 2016

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_0957a0e3-90a4-4b2a-8d7e-144060a48340-fourdirectional_pixelwise_polarization_cmos_image_sensor_using_airgap_wire_grid_on_25m_backilluminated_pixels.json