Fdsoibased 1T Pixel Sensor With Longterm Data Retention For Insitu Convolution Computing

• doi: 10.23919/SNW57900.2023.10183921
• title: FDSOI-based 1T Pixel Sensor with Long-term Data Retention for in-situ Convolution Computing
• publisher: IEEE
• isbn: 979-8-3503-2916-2
• issn: 2161-4636
• rank: 2457
• access_type: LOCKED
• content_type: Conferences
• abstract: Long-term data retention (sec-order) is a critical characteristic for smart image sensor with in-situ convolution computing. In this work, we propose a novel 1T pixel sensor (1T-PS) based on 22 nm fully-depleted silicon-on-insulator (FDSOI) technology, which exhibits better data retention compared to the traditional CMOS image sensor (CIS). By non-destructively sensing the photogenerated carriers through buried oxide (BOX) capacitive coupling, the 1T-PS achieves a hold time above 3 seconds. By calibration, the retention performance enables in-situ convolution computing in 4K resolution with $< 1\%$ error.
• article_number: 10183921
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10183921
• html_url: https://ieeexplore.ieee.org/document/10183921/
• abstract_url: https://ieeexplore.ieee.org/document/10183921/
• publication_title: 2023 Silicon Nanoelectronics Workshop (SNW)
• conference_location: Kyoto, Japan
• conference_dates: 11-12 June 2023
• publication_number: 10183871
• is_number: 10183917
• publication_year: 2023
• publication_date: 11-12 June 2023
• start_page: 19
• end_page: 20
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 207
• insert_date: 20230721
• index_terms:
  • ieee_terms:
    • Performance evaluation
    • Couplings
    • Image resolution
    • Convolution
    • Conferences
    • Energy resolution
    • Silicon-on-insulator
  • dynamic_index_terms:
    • Long-term Retention
    • Data Retention
    • Sensor Pixel
    • Image Sensor
    • Capacitive Coupling
    • Hold Time
    • Silicon-on-insulator
    • 4K Resolution
    • Signal-to-noise
    • Photoelectron
    • Internet Of Things
    • Depletion Region
    • Dark State
    • Pixel Array
    • Retention Characteristics
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-2916-2, isbnType: New-2005
  • format: Electronic ISBN, value: 978-4-86348-808-3, isbnType: New-2005
• authors:
  • Author Name: Haozhang Yang
    Affiliation: School of Integrated Circuits, Peking University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37089094613
    ID: 37089094613
    Order: 1
    Author Affiliations:
    • School of Integrated Circuits, Peking University, Beijing, China
    • Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China
  • Author Name: Zheng Zhou
    Affiliation: School of Integrated Circuits, Peking University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37085693302
    ID: 37085693302
    Order: 2
    Author Affiliations:
    • School of Integrated Circuits, Peking University, Beijing, China
    • Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China
  • Author Name: Guihai Yu
    Affiliation: School of Integrated Circuits, Peking University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37088849309
    ID: 37088849309
    Order: 3
    Author Affiliations:
    • School of Integrated Circuits, Peking University, Beijing, China
    • Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China
  • Author Name: Ruiqi Chen
    Affiliation: School of Integrated Circuits, Peking University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37089773130
    ID: 37089773130
    Order: 4
    Author Affiliations:
    • School of Integrated Circuits, Peking University, Beijing, China
    • Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China
  • Author Name: Lixia Han
    Affiliation: School of Integrated Circuits, Peking University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37088850789
    ID: 37088850789
    Order: 5
    Author Affiliations:
    • School of Integrated Circuits, Peking University, Beijing, China
    • Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China
  • Author Name: Peng Huang
    Affiliation: School of Integrated Circuits, Peking University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/38240539000
    ID: 38240539000
    Order: 6
    Author Affiliations:
    • School of Integrated Circuits, Peking University, Beijing, China
    • Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China
  • Author Name: Xiaoyan Liu
    Affiliation: School of Integrated Circuits, Peking University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37280578200
    ID: 37280578200
    Order: 7
    Author Affiliations:
    • School of Integrated Circuits, Peking University, Beijing, China
    • Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China
  • Author Name: Jinfeng Kang
    Affiliation: School of Integrated Circuits, Peking University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37273713100
    ID: 37273713100
    Order: 8
    Author Affiliations:
    • School of Integrated Circuits, Peking University, Beijing, China
    • Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China

Image Sensor

• sensor_type: CMOS
• resolution: 4K
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Not specified
• benefits: Not specified

Supporting Organizations

• supported_by: National Natural Science Foundation of China

Manuscript Details

• publication_date: 11-12 June 2023

Relevancy Score

• score: 8
• missing_fields:
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits
  • publication_date

Processed JSON Filename

request_2ded2d1d-1a62-4ee0-96b8-d5037fbad3ed-fdsoibased_1t_pixel_sensor_with_longterm_data_retention_for_insitu_convolution_computing.json