Fault Tolerant Active Pixel Sensors In 018 And 035 Micron Technologies

• doi: 10.1109/DFT.2006.31
• title: Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies
• publisher: IEEE
• isbn: 0-7695-2706-X
• issn: 2377-7966
• partnum: 06PR2706
• rank: 2488
• access_type: LOCKED
• content_type: Conferences
• abstract: A fault tolerant active pixel sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the lifetime of the sensor. For some time it has been known that fabrication of CMOS image sensors in processes less than 0.35mum would generate significant performance changes, yet imagers are being fabricated in 0.18mum technology or smaller. Therefore the characteristics of the FTAPS are presented for pixels fabricated in both a standard 0.18mum and 0.35mum CMOS process and compared for consistency
• article_number: 4030957
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4030957
• html_url: https://ieeexplore.ieee.org/document/4030957/
• abstract_url: https://ieeexplore.ieee.org/document/4030957/
• publication_title: 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• conference_location: Arlington, VA, USA
• conference_dates: 4-6 Oct. 2006
• publication_number: 4030903
• is_number: 4030904
• publication_year: 2006
• publication_date: 4-6 Oct. 2006
• start_page: 448
• end_page: 456
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 71
• insert_date: 20061219
• index_terms:
  • ieee_terms:
    • Fault tolerance
    • Pixel
    • CMOS image sensors
    • CMOS technology
    • Image sensors
    • Fabrication
    • Cameras
    • Switches
    • Testing
    • Manufacturing
  • dynamic_index_terms:
    • Fault-tolerant
    • Active Pixel Sensor
    • Micron Technology
    • Image Sensor
    • Camera Sensor
    • Point Defects
    • Output Feature
    • Output Characteristics
    • Increase In Sensitivity
    • Saturation Level
    • LabVIEW
    • Input Voltage
    • Single Pixel
    • Gate Electrode
    • CMOS Technology
    • Sensitivity Ratio
    • Pixel Features
    • Characteristics Of Pixels
    • Personal Digital Assistants
    • Voltage Swing
    • Summary Of Tests
    • Race Conditions
    • Electrical Faults
    • Electrical Defects
• isbn_formats:
  • format: Print ISBN, value: 0-7695-2706-X, isbnType: Historical
• authors:
  • Author Name: Michelle L. La Haye
    Affiliation: School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
    Author URL: https://ieeexplore.ieee.org/author/37273932600
    ID: 37273932600
    Order: 1
    Author Affiliations:
    • School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
  • Author Name: Cory Jung
    Affiliation: School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
    Author URL: https://ieeexplore.ieee.org/author/37277023600
    ID: 37277023600
    Order: 2
    Author Affiliations:
    • School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
  • Author Name: David Chen
    Affiliation: School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
    Author URL: https://ieeexplore.ieee.org/author/37829501200
    ID: 37829501200
    Order: 3
    Author Affiliations:
    • School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
  • Author Name: Glenn H. Chapman
    Affiliation: School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
    Author URL: https://ieeexplore.ieee.org/author/37273891800
    ID: 37273891800
    Order: 4
    Author Affiliations:
    • School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
  • Author Name: Jozsef Dudas
    Affiliation: School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
    Author URL: https://ieeexplore.ieee.org/author/37566335800
    ID: 37566335800
    Order: 5
    Author Affiliations:
    • School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Useful for applications such as medical imaging and astronomy where a single defective pixel could obscure important details.
• benefits: Fault tolerance allowing correction of defects enhances the usability and longevity of the sensors.

Supporting Organizations

• supported_by: Simon Fraser University

Manuscript Details

• publication_date: 4-6 Oct. 2006

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_1a8bbeef-c225-42e9-9320-68e475a5363a-fault_tolerant_active_pixel_sensors_in_018_and_035_micron_technologies.json