Fast Hartmannshack Wavefront Sensors Manufactured In Standard Cmos Technology

• doi: 10.1109/JSEN.2005.854487
• title: Fast Hartmann-Shack wavefront sensors manufactured in standard CMOS technology
• publisher: IEEE
• isbn:
• issn: 2379-9153
• rank: 2481
• access_type: LOCKED
• content_type: Journals
• abstract: This paper discusses the implementation of fast wavefront sensors based on the Hartmann-Shack method in standard complementary metal-oxide semiconductor (CMOS) technology and evaluates the impact of the capabilities and limitations of this technology on the wavefront sensor performance. Aiming at fast operation (>1 kHz), we compare the applicability of either conventional or dedicated image sensors and investigate how current custom concepts can complement each other. To date, three different custom CMOS-sensor layouts have been implemented. Besides being able to operate at faster rates than conventional sensors, these devices demonstrated the ability to achieve high wavefront-detection accuracy and the potential for use in low-light applications (e.g., ophthalmic diagnostics). The goal is to identify the most important practical issues related to using standard CMOS technology in wavefront sensing.
• article_number: 1504758
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1504758
• html_url: https://ieeexplore.ieee.org/document/1504758/
• abstract_url: https://ieeexplore.ieee.org/document/1504758/
• publication_title: IEEE Sensors Journal
• conference_location:
• conference_dates:
• publication_number: 7361
• is_number: 32263
• publication_year: 2005
• publication_date: Oct. 2005
• start_page: 976
• end_page: 982
• citing_paper_count: 5
• citing_patent_count: 12
• download_count: 230
• insert_date: 20050906
• index_terms:
  • ieee_terms:
    • CMOS technology
    • Manufacturing
    • Optical sensors
    • Optical distortion
    • Adaptive optics
    • Biomedical optical imaging
    • CMOS image sensors
    • Optical interferometry
    • Paper technology
    • Optical fiber testing
  • author_terms:
    • Adaptive optics
    • complementary metal–oxide semiconductor (CMOS) technology
    • image sensor
    • optical profiling
    • very large scale integration (VLSI)
    • wavefront sensor
  • dynamic_index_terms:
    • Complementary Metal Oxide Semiconductor Technology
    • Wavefront Sensor
    • Shack-Hartmann Wavefront Sensor
    • Shack-Hartmann
    • Hartmann-Shack
    • Standard Complementary Metal-oxide-semiconductor
    • High Speed
    • Pixel Size
    • Photodiode
    • Frame Rate
    • Low Light
    • Photocurrent
    • Good Resolution
    • Random Access
    • Fill Factor
    • Light Sensitivity
    • Photophobic
    • Single Chip
    • Light Spot
    • Low Light Levels
    • Spot Position
    • Microlenses
    • Micro Lens
    • Position Resolution
    • Complementary Metal-oxide Semiconductor Camera
    • Microlens Array
    • Micro Lens Arrays
    • Readout Noise
    • Doping Profile
    • Temporal Noise
    • Excess Rate
    • Conventional Camera
    • Thermal Noise
    • Current Noise
    • Optical Aberrations
    • Lens Aberrations
    • Monochromatic Aberrations
• authors:
  • Author Name: D.Wd.L. Monteiro
    Affiliation: OptMA_lab, Electrical Engineering Department/DEE, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37087101470
    ID: 37087101470
    Order: 1
    Author Affiliations:
    • OptMA_lab, Electrical Engineering Department/DEE, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil
    • Delft University of Technnology, Delft, Netherlands
  • Author Name: T. Nirmaier
    Affiliation: Infineon Technologies, Munich, Germany
    Author URL: https://ieeexplore.ieee.org/author/37564739300
    ID: 37564739300
    Order: 2
    Author Affiliations:
    • Infineon Technologies, Munich, Germany
    • University of Heidelberg, Heidelberg, Germany
  • Author Name: G.V. Vdovin
    Affiliation: Electronic Instrumentation Laboratory, EEMCS, Delft University of Technnology, Delft, Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37318139100
    ID: 37318139100
    Order: 3
    Author Affiliations:
    • Electronic Instrumentation Laboratory, EEMCS, Delft University of Technnology, Delft, Netherlands
  • Author Name: A.J.P. Theuwissen
    Affiliation: Electronic Instrumentation Laboratory, EEMCS, Delft University of Technnology, Delft, Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37282956500
    ID: 37282956500
    Order: 4
    Author Affiliations:
    • Electronic Instrumentation Laboratory, EEMCS, Delft University of Technnology, Delft, Netherlands

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: 5-20 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: /49 kHz

Applications & Benefits

• cell_imaging: used in ophthalmic diagnostics
• benefits: affordable and compact devices for wavefront sensing applications, with the potential for low-light operation and high-speed performance.

Supporting Organizations

• supported_by: Dutch Technical Foundation (STW), Delft University of Technology, University of Heidelberg

Manuscript Details

• publication_date: Oct. 2005

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

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