Extended Use Of Pseudoflash Reset Technique For An Active Pixel With Logarithmic Compressed Response

• doi: 10.1109/SBCCI.2012.6344425
• title: Extended use of pseudo-flash reset technique for an active pixel with logarithmic compressed response
• publisher: IEEE
• isbn: 978-1-4673-2607-0
• issn:
• partnum: 12EX7445
• rank: 2443
• access_type: LOCKED
• content_type: Conferences
• abstract: The pseudo-flash reset (P-FRST) is a technique used to reduce image lag in CMOS active-pixel sensors (APS). The compact pixel topology consisting of a photodetector and three FETs (3T APS) is widely employed because of its large fill factor combined with the possibility to operate in both linear and logarithmic compressed-response (LCR) modes. The use of these two modes in a single readout cycle yields good low-light sensitivity and extended dynamic range (DR). However, fabrication non idealities result in fixed-pattern noise (FPN) across the image-sensor chip and cannot be reduced by classical double-sampling readout subtraction (DSRS). In the present work, we propose an extended use of the P-FRST technique to provide an adequate voltage reference on pixel, in order to enable DSRS, thus reducing FPN in conventional 3T APS operating in mixed linear-LCR mode.
• article_number: 6344425
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6344425
• html_url: https://ieeexplore.ieee.org/document/6344425/
• abstract_url: https://ieeexplore.ieee.org/document/6344425/
• publication_title: 2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI)
• conference_location: Brasilia, Brazil
• conference_dates: 30 Aug.-2 Sept. 2012
• publication_number: 6337025
• is_number: 6344418
• publication_year: 2012
• publication_date: 30 Aug.-2 Sept. 2012
• start_page: 1
• end_page: 6
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 144
• insert_date: 20121110
• index_terms:
  • ieee_terms:
    • Abstracts
    • Dynamic range
  • author_terms:
    • CMOS Image Senso
    • APS
    • FPN
    • CDS
    • DSRS
    • Pseudo-Flash Reset
    • Wide Dynamic Range
  • dynamic_index_terms:
    • Use Of Techniques
    • Reset Technique
    • Dynamic Range
    • Operation Mode
    • Image Sensor
    • Camera Sensor
    • Linear Mode
    • Linear Transition
    • Waveform
    • Light Intensity
    • Pixel Size
    • Integration Time
    • Photodiode
    • Low Voltage
    • High Light
    • High Light Intensity
    • Low Light
    • Linear Response
    • Light Levels
    • Photocurrent
    • Voltage Levels
    • Low Light Conditions
    • Dark Current
    • Cost Of Scheme
    • Low Illumination
    • Double Sampling
    • Low Voltage Level
    • Sensitive Mode
    • Illumination Levels
    • End Time
    • Eschatological
    • Signal Processing
    • Low Light Levels
    • Voltage-gated
    • Gate Voltage
• isbn_formats:
  • format: CD, value: 978-1-4673-2607-0, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4673-2606-3, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4673-2608-7, isbnType: New-2005
• authors:
  • Author Name: Carlos A. de Moraes Cruz
    Affiliation: Department of Electronics and Telecommunications, CETELI, Universidade Federal do Amazonas, Manaus, Brazil
    Author URL: https://ieeexplore.ieee.org/author/38496376100
    ID: 38496376100
    Order: 1
    Author Affiliations:
    • Department of Electronics and Telecommunications, CETELI, Universidade Federal do Amazonas, Manaus, Brazil
  • Author Name: Israel L. Marinho
    Affiliation: Department of Electronics and Telecommunications, CETELI, Universidade Federal do Amazonas, Manaus, Brazil
    Author URL: https://ieeexplore.ieee.org/author/38506581600
    ID: 38506581600
    Order: 2
    Author Affiliations:
    • Department of Electronics and Telecommunications, CETELI, Universidade Federal do Amazonas, Manaus, Brazil
  • Author Name: Davies W. de Lima Monteiro
    Affiliation: Department of Electrical Engineering, DEE/PPGEE, Universidade Federal de Minas Gerais, Belo Horizonte, Minas Gerais, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37680844500
    ID: 37680844500
    Order: 3
    Author Affiliations:
    • Department of Electrical Engineering, DEE/PPGEE, Universidade Federal de Minas Gerais, Belo Horizonte, Minas Gerais, Brazil

Image Sensor

• sensor_type: CMOS Image Sensor
• resolution: not specified
• dynamic_range: 40-200 dB
• pixel_size: not specified
• dark_current: 0.06 fA

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Details on applications include smartphones, medical devices, and automotive systems.
• benefits: Provide improved low-light sensitivity and extended dynamic range.

Supporting Organizations

• supported_by: Fundação de Pesquisa do Estado de Minas Gerais - FAPEMIG, Conselho Nacional de Pesquisa - CNPq, CAPES

Manuscript Details

• publication_date: 30 Aug.-2 Sept. 2012

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • pixel_size
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_02096531-1a5f-4096-bd83-314a6f990c4d-extended_use_of_pseudoflash_reset_technique_for_an_active_pixel_with_logarithmic_compressed_response.json