Extended Dynamic Range From A Combined Linearlogarithmic Cmos Image Sensor

• doi: 10.1109/JSSC.2006.880613
• title: Extended Dynamic Range From a Combined Linear-Logarithmic CMOS Image Sensor
• publisher: IEEE
• isbn:
• issn: 1558-173X
• rank: 2442
• access_type: LOCKED
• content_type: Journals
• abstract: A CMOS image sensor that can operate in both linear and logarithmic mode is described. Two sets of data are acquired and combined in the readout path to render a high dynamic range image. This is accomplished in real-time without the use of frame memory. A dynamic range in excess of 120 dB was achieved at 26 frames/s (352times288-array). The system addresses the problems of high fixed pattern noise (FPN), slow response time, and low signal-to-noise ratio (SNR) in logarithmic mode. FPN has been effectively reduced by single and two parameter calibration, the latter achieving FPN of 2% per decade. A novel on-chip method of deriving a reference point has been implemented. The system is fabricated in a 0.18-mum 1P4M process and achieves a pixel pitch of 5.6 mum with 7 transistors per pixel
• article_number: 1683901
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1683901
• html_url: https://ieeexplore.ieee.org/document/1683901/
• abstract_url: https://ieeexplore.ieee.org/document/1683901/
• publication_title: IEEE Journal of Solid-State Circuits
• conference_location:
• conference_dates:
• publication_number: 4
• is_number: 35458
• publication_year: 2006
• publication_date: Sept. 2006
• start_page: 2095
• end_page: 2106
• citing_paper_count: 60
• citing_patent_count: 3
• download_count: 1684
• insert_date: 20060828
• index_terms:
  • ieee_terms:
    • Dynamic range
    • CMOS image sensors
    • Signal to noise ratio
    • Lighting
    • Pixel
    • Storms
    • Image sensors
    • Layout
    • Optical arrays
    • Voltage
  • author_terms:
    • CMOS images
    • dynamic range
    • image sensors
    • fixed pattern noise
    • linear-logarithmic response
    • pixel architecture
  • dynamic_index_terms:
    • Dynamic Range
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Linear Mode
    • Linear Transition
    • High Dynamic Range
    • High Dynamic Range Image
    • Photodiode
    • Current Source
    • Current Regulations
    • Data Logger
    • Sample Holder
    • Linear Response
    • Photocurrent
    • Log Values
    • Logarithmic Values
    • Settling Time
    • Colonial Times
    • Current Reference
    • Illumination Levels
    • Pixel Array
    • Linear Image
    • Voltage Ramp
    • Uniform Illumination
    • Poles And Zeros
    • Complex Zeros
    • Temporal Noise
    • Offset Error
    • Amplifier Output
    • Halogen Light Source
    • Gate-source Voltage
    • Phase Margin
    • Test Device
    • Amplifier Input
    • High Signal-to-noise Ratio
    • Current Flow
• authors:
  • Author Name: G. Storm
    Affiliation: Imaging Division, ST Microelectronics S.r.L., Edinburgh, UK
    Author URL: https://ieeexplore.ieee.org/author/38053737100
    ID: 38053737100
    Order: 1
    Author Affiliations:
    • Imaging Division, ST Microelectronics S.r.L., Edinburgh, UK
  • Author Name: R. Henderson
    Affiliation: School of Engineering and Electronics, University of Edinburgh, Edinburgh, UK
    Author URL: https://ieeexplore.ieee.org/author/37294086900
    ID: 37294086900
    Order: 2
    Author Affiliations:
    • School of Engineering and Electronics, University of Edinburgh, Edinburgh, UK
  • Author Name: J.E.D. Hurwitz
    Affiliation: Gigle Semiconductor Limited, Edinburgh, UK
    Author URL: https://ieeexplore.ieee.org/author/37268635900
    ID: 37268635900
    Order: 3
    Author Affiliations:
    • Gigle Semiconductor Limited, Edinburgh, UK
  • Author Name: D. Renshaw
    Affiliation: School of Engineering and Electronics, University of Edinburgh, Edinburgh, UK
    Author URL: https://ieeexplore.ieee.org/author/37273758100
    ID: 37273758100
    Order: 4
    Author Affiliations:
    • School of Engineering and Electronics, University of Edinburgh, Edinburgh, UK
  • Author Name: K. Findlater
    Affiliation: Imaging Division, ST Microelectronics S.r.L., Edinburgh, UK
    Author URL: https://ieeexplore.ieee.org/author/37569907600
    ID: 37569907600
    Order: 5
    Author Affiliations:
    • Imaging Division, ST Microelectronics S.r.L., Edinburgh, UK
  • Author Name: M. Purcell
    Affiliation: Imaging Division, ST Microelectronics S.r.L., Edinburgh, UK
    Author URL: https://ieeexplore.ieee.org/author/38034833400
    ID: 38034833400
    Order: 6
    Author Affiliations:
    • Imaging Division, ST Microelectronics S.r.L., Edinburgh, UK

Image Sensor

• sensor_type: CMOS
• resolution: 352x288
• dynamic_range: 120 dB
• pixel_size: 5.6 µm
• dark_current: 0.388 fA

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 26 fps
• signal_to_noise_ratio: 48.1 dB
• sensitivity: 726 mV/lx·s
• noise: 0.95 mV (temporal noise), 36 mV (FPN)

Applications & Benefits

• cell_imaging: High dynamic range applications, suitable for imaging in varying illumination conditions.
• benefits: Increased dynamic range of over 120 dB, low fixed pattern noise (FPN) with calibration, real-time operation without frame memory.

Supporting Organizations

• supported_by: EPSRC, STMicroelectronics

Manuscript Details

• publication_date: Sept. 2006

Relevancy Score

• score: 10

Processed JSON Filename

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