Exploring The 3D Integration Technology For Cmos Image Sensors
- doi: 10.1109/ECMSM.2013.6648935
-
title: Exploring the 3D integration technology for CMOS
image sensors
- publisher: IEEE
- isbn: 978-1-4673-6298-6
- issn:
- rank: 2438
- access_type: LOCKED
- content_type: Conferences
-
abstract: 3D fabrication technologies allow
microelectronic circuits such as processors or memories to achieve very
high integration densities. These technologies applied to CMOS image
sensors, make possible the implementation of specific processing
architectures without damaging key parameters of CMOS imagers. This
paper illustrates these benefits with an implementation of a 3D image
sensor integrating at the pixel level a low noise circuit coupled to an
analog to digital converter.
- article_number: 6648935
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6648935
-
html_url:
https://ieeexplore.ieee.org/document/6648935/
-
abstract_url:
https://ieeexplore.ieee.org/document/6648935/
-
publication_title: 2013 IEEE 11th International
Workshop of Electronics, Control, Measurement, Signals and their
application to Mechatronics
- conference_location: Toulouse, France
- conference_dates: 24-26 June 2013
- publication_number: 6599409
- is_number: 6648925
- publication_year: 2013
- publication_date: 24-26 June 2013
- start_page: 1
- end_page: 5
- citing_paper_count: 6
- citing_patent_count: 0
- download_count: 1385
- insert_date: 20131031
-
index_terms:
-
ieee_terms:
- Three-dimensional displays
- CMOS image sensors
- CMOS integrated circuits
- CMOS technology
- Decoding
- Random access memory
-
author_terms:
- CMOS Image Sensor
- Three dimensional integration technology
- ADC
- parallelism
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- 3D Integration Technology
- Low Noise
- Analog-to-digital Converter
- Analog-to-digital
- Digital-to-analog Converter
- Pixel Level
- High-density Integration
- Functional Integrity
- Partition Function
- 3D Technology
- Conversion Time
- 3D Constructs
- Parallel Configuration
- Heterogeneous Integration
- Multichip Module
- Readout Circuit
-
isbn_formats:
-
format: Electronic ISBN,
value: 978-1-4673-6298-6,
isbnType: New-2005
-
authors:
-
Author Name: Fernando Raymundo
Affiliation: CIMI Image Sensor Laboratory,
University of Toulouse, Toulouse, France
Author URL:
https://ieeexplore.ieee.org/author/37086796469
ID: 37086796469
Order: 1
Author Affiliations:
-
CIMI Image Sensor Laboratory, University of Toulouse, Toulouse,
France
-
Author Name: Phillipe Martin-Gonthier
Affiliation: CIMI Image Sensor Laboratory,
University of Toulouse, Toulouse, France
Author URL:
https://ieeexplore.ieee.org/author/38278141700
ID: 38278141700
Order: 2
Author Affiliations:
-
CIMI Image Sensor Laboratory, University of Toulouse, Toulouse,
France
-
Author Name: Romain Molina
Affiliation: CIMI Image Sensor Laboratory,
University of Toulouse, Toulouse, France
Author URL:
https://ieeexplore.ieee.org/author/38285932500
ID: 38285932500
Order: 3
Author Affiliations:
-
CIMI Image Sensor Laboratory, University of Toulouse, Toulouse,
France
-
Author Name: Sebastien Rolando
Affiliation: CIMI Image Sensor Laboratory,
University of Toulouse, Toulouse, France
Author URL:
https://ieeexplore.ieee.org/author/37085619853
ID: 37085619853
Order: 4
Author Affiliations:
-
CIMI Image Sensor Laboratory, University of Toulouse, Toulouse,
France
-
Author Name: Pierre Magnan
Affiliation: CIMI Image Sensor Laboratory,
University of Toulouse, Toulouse, France
Author URL:
https://ieeexplore.ieee.org/author/37400751600
ID: 37400751600
Order: 5
Author Affiliations:
-
CIMI Image Sensor Laboratory, University of Toulouse, Toulouse,
France
Image Sensor
- sensor_type: CMOS
- resolution: 128 x 128 pixels
- dynamic_range: Not specified
- pixel_size: 10 µm x 10 µm
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
Applications & Benefits
- cell_imaging: Not specified
-
benefits: Allows high integration of processing
functions without degrading key parameters.
Supporting Organizations
-
supported_by: CIMI-ISAE, ST Microelectronics, CEA-LETI,
IZM Berlin, MIT Lincoln Laboratory.
Manuscript Details
- publication_date: 24-26 June 2013
Relevancy Score
- score: 10
-
missing_fields:
- dynamic_range
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
Processed JSON Filename
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