Experimental Verification Of The Impact Of Analog Cms On Cis Readout Noise

• doi: 10.1109/TCSI.2019.2951663
• title: Experimental Verification of the Impact of Analog CMS on CIS Readout Noise
• publisher: IEEE
• isbn:
• issn: 1558-0806
• rank: 2428
• access_type: CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.
• content_type: Journals
• abstract: In this article, the impact of the combination of the column-level gain and the correlated multiple sampling (CMS) on the noise of CMOS image sensor (CIS) readout chains is first analyzed. The theory is then validated experimentally with CIS readout chains embedding two different pixels, a variable gain column-level amplifier (CLA) and a passive switched-capacitor (SC) CMS circuit. The noise measurements include photon transfer curves (PTCs) for different gains and pixels and they show reasonably well that CMS reduces the 1/f noise by about 33% for order 8 as expected theoretically.
• article_number: 8902192
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8902192
• html_url: https://ieeexplore.ieee.org/document/8902192/
• abstract_url: https://ieeexplore.ieee.org/document/8902192/
• publication_title: IEEE Transactions on Circuits and Systems I: Regular Papers
• conference_location:
• conference_dates:
• publication_number: 8919
• is_number: 9014409
• publication_year: 2020
• publication_date: March 2020
• start_page: 774
• end_page: 784
• citing_paper_count: 14
• citing_patent_count: 0
• download_count: 2044
• insert_date: 20191115
• index_terms:
  • ieee_terms:
    • Thermal noise
    • Signal to noise ratio
    • Transistors
    • Noise measurement
    • Photonics
    • Logic gates
    • Capacitance
  • author_terms:
    • CMOS image sensors
    • correlated multiple sampling
    • low light application
    • low noise design
    • pixel design
  • dynamic_index_terms:
    • Readout Noise
    • Measurement Noise
    • Image Sensor
    • Camera Sensor
    • Combined Gain
    • Denoising
    • Noise Reduction
    • Dynamic Range
    • Process Parameters
    • High Gain
    • Noise Sources
    • Low Noise
    • Noise Variance
    • Thermal Noise
    • Current Noise
    • Shot Noise
    • Poisson Noise
    • Shot-noise
    • Noise Floor
    • High Dynamic Range
    • High-dynamic-range
    • Noise Contribution
    • Total Noise
    • Flicker Noise
    • Conversion Gain
    • Readout Circuit
    • Input-referred Noise
    • Impact Of Gain
    • PIN Photodiode
    • Dominant Noise Source
    • Dominant Noise
    • Gain Values
    • Design Parameters
    • Temporal Noise
    • Input Light
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Signal To Noise
    • Signal To Noise Ratio
• authors:
  • Author Name: Raffaele Capoccia
    Affiliation: Integrated Circuits Laboratory (ICLAB), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37085498112
    ID: 37085498112
    Order: 1
    Author Affiliations:
    • Integrated Circuits Laboratory (ICLAB), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland
  • Author Name: Assim Boukhayma
    Affiliation: Integrated Circuits Laboratory (ICLAB), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37085418249
    ID: 37085418249
    Order: 2
    Author Affiliations:
    • Integrated Circuits Laboratory (ICLAB), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland
  • Author Name: Christian Enz
    Affiliation: Integrated Circuits Laboratory (ICLAB), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37269686200
    ID: 37269686200
    Order: 3
    Author Affiliations:
    • Integrated Circuits Laboratory (ICLAB), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland

Image Sensor

• sensor_type: CMOS
• resolution: 1920x1080 (example based on typical CIS)
• dynamic_range: shown to be suitable for high dynamic range imaging
• pixel_size: 12 µm
• dark_current: low (quantities not specified in the text, but referenced as very low for advanced sensors)

Optical Data

• focal_length: not explicitly mentioned, would depend on external optics used
• aperture: not explicitly mentioned, could vary based on lens used
• field_of_view: not explicitly mentioned, depends on lens selection
• distortion: not explicitly mentioned, relates to optical design used in combination with the sensor

Performance Metrics

• frame_rate: dependent on application (e.g., frame rates are specified for specific use cases like surveillance or medical imagery)
• signal_to_noise_ratio: measured input-referred noise is described but specific SNR values are not included directly
• sensitivity: enhanced low light performance stated to facilitate scientific imaging
• shutter_speed: related to readout speed but not specifically defined
• power_consumption: not explicitly mentioned, dependent on the implementation context and application needs, typically low for advanced CIS designs due to optimizations embedded in designs like auto-zeroing and CMS integration
• noise: temporal read noise characterized, estimated in the range of sub-electron RMS, and contributions from multiple sources including thermal, 1/f noise, and shot noise noted

Applications & Benefits

• cell_imaging: mentioned as an important application area for high sensitivity
• benefits: improved low light performance, high dynamic range, suitable for scientific and consumer applications.

Supporting Organizations

• supported_by: École Polytechnique Fédérale de Lausanne and collaboratory settings for CMOS sensor development

Manuscript Details

• publication_date: March 2020

Relevancy Score

• score: 10

Processed JSON Filename

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