Exact Noise Analysis Of A Cmos Bdj Aps

• doi: 10.1109/ISCAS.2005.1465093
• title: Exact noise analysis of a CMOS BDJ APS
• publisher: IEEE
• isbn: 0-7803-8834-8
• issn: 2158-1525
• partnum: 05CH37618
• rank: 2423
• access_type: LOCKED
• content_type: Conferences
• abstract: At low illumination levels, the performance of image sensors is severely limited by their intrinsic electrical noise. In the buried double junction (BDJ) active pixel sensor (APS), as in any CMOS image sensor, noise is primarily due to the photodetector and to the in-pixel transistors. In this paper, we present an exact noise analysis of CMOS BDJ APS in charge storage mode during both reset and integration phases. Classical frequency-domain analysis is performed for the reset interval and a kT/C noise can be put in evidence. During the integration phase, as the stationary state condition is never fulfilled, noise analysis must be carried out in the time-domain. The novelty of this approach consists in taking into account the non-linearity of junction capacitances, which yields more realistic results.
• article_number: 1465093
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1465093
• html_url: https://ieeexplore.ieee.org/document/1465093/
• abstract_url: https://ieeexplore.ieee.org/document/1465093/
• publication_title: 2005 IEEE International Symposium on Circuits and Systems
• conference_location: Kobe, Japan
• conference_dates: 23-26 May 2005
• publication_number: 9898
• is_number: 31469
• publication_year: 2005
• publication_date: 23-26 May 2005
• start_page: 2337
• end_page: 2340 Vol. 3
• citing_paper_count: 3
• citing_patent_count: 2
• download_count: 214
• insert_date: 20050725
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Phase noise
    • Lighting
    • Image sensors
    • Noise level
    • Pixel
    • Active noise reduction
    • Photodetectors
    • Frequency domain analysis
    • Stationary state
  • author_terms:
    • APS
    • BDJ
    • CMOS
    • Frequency-domain analysis
    • Integration mode
    • Noise
    • Reset
    • Simulation
    • Time-domain analysis
  • dynamic_index_terms:
    • Noise Analysis
    • Active Pixel Sensor
    • Photodetector
    • Image Sensor
    • Camera Sensor
    • Junction Capacitance
    • Sensor Pixel
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Integration Time
    • Power Spectral Density
    • Spectral Function
    • Noise Sources
    • Current Law
    • Shot Noise
    • Poisson Noise
    • Transconductance
    • Conductive Transfer
    • Linear Differential Equations
    • Linear Ordinary Differential Equations
    • First-order Differential Equations
    • First-order Ordinary Differential Equations
    • Constant Capacity
    • Constant Capacitance
    • Kirchhoff’s Current Law
    • Kirchhoff’s Circuit Laws
    • Voltage Noise
    • Nonlinear Capacitance
    • Nonlinear Capacity
    • Reset Voltage
• isbn_formats:
  • format: Print ISBN, value: 0-7803-8834-8, isbnType: Historical
• authors:
  • Author Name: S. Feruglio
    Affiliation: LISIF, University Pierre and Marie Curie, Paris, France
    Author URL: https://ieeexplore.ieee.org/author/37422112300
    ID: 37422112300
    Order: 1
    Author Affiliations:
    • LISIF, University Pierre and Marie Curie, Paris, France
  • Author Name: G. Vasilescu
    Affiliation: LISIF, University Pierre and Marie Curie, Paris, France
    Author URL: https://ieeexplore.ieee.org/author/37293937600
    ID: 37293937600
    Order: 2
    Author Affiliations:
    • LISIF, University Pierre and Marie Curie, Paris, France
  • Author Name: G. Alquie
    Affiliation: LISIF, University Pierre and Marie Curie, Paris, France
    Author URL: https://ieeexplore.ieee.org/author/37298799100
    ID: 37298799100
    Order: 3
    Author Affiliations:
    • LISIF, University Pierre and Marie Curie, Paris, France
  • Author Name: V.F. Hanna
    Affiliation: LISIF, University Pierre and Marie Curie, Paris, France
    Author URL: https://ieeexplore.ieee.org/author/37286216400
    ID: 37286216400
    Order: 4
    Author Affiliations:
    • LISIF, University Pierre and Marie Curie, Paris, France

Image Sensor

• sensor_type: CMOS BDJ Active Pixel Sensor
• resolution: not specified
• dynamic_range: 132 dB
• pixel_size: not specified
• dark_current: 1 pA

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Applications in various fields including smartphones, medical devices, and automotive systems.
• benefits: Increased system integration, reduced power consumption, random addressing.

Supporting Organizations

• supported_by: LISIF, University Pierre & Marie Curie, Paris, FRANCE

Manuscript Details

• publication_date: 23-26 May 2005

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • pixel_size
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • focal_length
  • aperture
  • field_of_view
  • distortion

Processed JSON Filename

request_5aa9bb5e-1fa9-4d48-9e36-829925c07250-exact_noise_analysis_of_a_cmos_bdj_aps.json