Enhancing Fluorescence Image Analysis Through Deep Learning
- doi: 10.1109/MetroXRAINE58569.2023.10405797
-
title: Enhancing Fluorescence Image Analysis through
Deep Learning
- publisher: IEEE
- isbn: 979-8-3503-0081-9
- issn:
- rank: 2401
- access_type: LOCKED
- content_type: Conferences
-
abstract: Fluorescence imaging plays a crucial role in
studying biological processes and materials across various industrial
applications. However, the manual analysis of fluorescence images is
time-consuming and prone to errors. To address these challenges, we
propose novel machine learning-based approaches to enhance the VIDAS®
device - an automated immunoassay system employed for medical condition
detection. The current setup utilizes a photodiode for luminescence
capture, which exhibits limitations when applied to spatially
distributed signals. To overcome this limitation, we explore the use of
a CMOS sensor to capture two-dimensional images of cuvettes, enabling a
more comprehensive analysis of the system. Our proposed solution
involves generating reconstructed images that rectify potential defects,
leading to improved and unbiased fluorescence estimation. Through
extensive experimentation, we demonstrate that employing the
reconstructed images enables more accurate measurements, particularly in
the presence of defects. Our methodology encompasses deep learning and
semantic segmen-tation techniques, allowing robust fluorescence image
analysis.
- article_number: 10405797
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10405797
-
html_url:
https://ieeexplore.ieee.org/document/10405797/
-
abstract_url:
https://ieeexplore.ieee.org/document/10405797/
-
publication_title: 2023 IEEE International Conference
on Metrology for eXtended Reality, Artificial Intelligence and Neural
Engineering (MetroXRAINE)
- conference_location: Milano, Italy
- conference_dates: 25-27 Oct. 2023
- publication_number: 10405419
- is_number: 10405547
- publication_year: 2023
- publication_date: 25-27 Oct. 2023
- start_page: 212
- end_page: 217
- citing_paper_count: 0
- citing_patent_count: 0
- download_count: 43
- insert_date: 20240201
-
index_terms:
-
ieee_terms:
- Atmospheric measurements
- Pipelines
- Imaging
- Fluorescence
- Particle measurements
- Noise measurement
- Image reconstruction
-
author_terms:
- Fluorescence image analysis
- Deep Learning
- Semantic Segmentation
-
dynamic_index_terms:
- Image Analysis
- Fluorescence Image Analysis
- Accurate Measurement
- Semantic Segmentation
- Presence Of Defects
- Presence Of Faults
- Neural Network
- Convolutional Neural Network
- Validation Set
- Computer Vision
- Line In Fig
- Air Bubbles
- Gas Bubbles
- Part Of The Image
- Final Measurement
- Semantic Network
- Working Points
- Segmentation Dataset
- Absence Of Defects
- Absence Of Faults
- Computer Vision Techniques
- Semantic Segmentation Network
- Compensation Algorithm
- Segmentation Output
- Dice Loss
- Average Brightness
- Defect Region
- Fault Region
- Impact Of Elements
- Impact Of These Elements
- Learning Algorithms
- Machine Learning Algorithms
- Neural Network For Segmentation
- Specific Algorithm
- Influence Of Elements
-
isbn_formats:
-
format: Print on Demand(PoD) ISBN,
value: 979-8-3503-0081-9,
isbnType: New-2005
-
format: USB ISBN,
value: 979-8-3503-0079-6,
isbnType: New-2005
-
format: Electronic ISBN,
value: 979-8-3503-0080-2,
isbnType: New-2005
-
authors:
-
Author Name: Paolo Andreini
Affiliation: DIISM University of Siena, Siena,
Italy
Author URL:
https://ieeexplore.ieee.org/author/751371370903765
ID: 751371370903765
Order: 1
Author Affiliations:
- DIISM University of Siena, Siena, Italy
-
Author Name: Simone Bonechi
Affiliation: DISPOC, DIISM University of Siena,
Siena, Italy
Author URL:
https://ieeexplore.ieee.org/author/37088717374
ID: 37088717374
Order: 2
Author Affiliations:
- DISPOC, DIISM University of Siena, Siena, Italy
-
Author Name: Alessandro Mecocci
Affiliation: DIISM University of Siena, Siena,
Italy
Author URL:
https://ieeexplore.ieee.org/author/37294807500
ID: 37294807500
Order: 3
Author Affiliations:
- DIISM University of Siena, Siena, Italy
-
Author Name: Veronica Lucia Rossi
Affiliation: bioMeriéux Italia, Florence, Italy
Author URL:
https://ieeexplore.ieee.org/author/413165029613956
ID: 413165029613956
Order: 4
Author Affiliations:
- bioMeriéux Italia, Florence, Italy
-
Author Name: Giuseppe Ferorelli
Affiliation: bioMeriéux Italia, Florence, Italy
Author URL:
https://ieeexplore.ieee.org/author/646816468705140
ID: 646816468705140
Order: 5
Author Affiliations:
- bioMeriéux Italia, Florence, Italy
-
Author Name: Giorgio Chini
Affiliation: bioMeriéux Italia, Florence, Italy
Author URL:
https://ieeexplore.ieee.org/author/939601198172588
ID: 939601198172588
Order: 6
Author Affiliations:
- bioMeriéux Italia, Florence, Italy
-
Author Name: Antonio Sanesi
Affiliation: bioMeriéux Italia, Florence, Italy
Author URL:
https://ieeexplore.ieee.org/author/915910575320457
ID: 915910575320457
Order: 7
Author Affiliations:
- bioMeriéux Italia, Florence, Italy
Image Sensor
- sensor_type: CMOS
- resolution: 1024x768
- dynamic_range: Not specified
- pixel_size: Not specified
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
Applications & Benefits
-
cell_imaging: The study enhances fluorescence imaging
which can be applied for medical and biological imaging.
-
benefits: Improved accuracy and reliability of
fluorescence measurements through segmentation and defect compensation.
Supporting Organizations
-
supported_by: University of Siena, bioMérieux Italia
Manuscript Details
- publication_date: 25-27 Oct. 2023
Relevancy Score
- score: 8
-
missing_fields:
- dynamic_range
- pixel_size
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
Processed JSON Filename
request_1ffbac23-c0b0-4e04-b225-7afd0059fe88-enhancing_fluorescence_image_analysis_through_deep_learning.json