Elimination Of Quantization Effects In Measured Temporal Noise

• doi: 10.1109/ISCAS.2004.1329158
• title: Elimination of quantization effects in measured temporal noise
• publisher: IEEE
• isbn: 0-7803-8251-X
• issn:
• partnum: 04CH37512
• rank: 2376
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a mathematical analysis of how temporal noise is transformed by quantization. A new method for measuring temporal noise with a low-resolution ADC and then accurately refer it back to the input of the ADC is shown. The method is, for instance, applicable to CMOS image sensors where photon shot noise is commonly used for determining conversion gain and quantum efficiency. Experimental tests have been carried out using a custom designed CMOS image sensor with an on-chip ADC featuring programmable gain and offset. The measurements verify the analysis and the method, e.g. noise levels of 0.11 LSB was measured with an accuracy 30 times higher than a traditional method would give.
• article_number: 1329158
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1329158
• html_url: https://ieeexplore.ieee.org/document/1329158/
• abstract_url: https://ieeexplore.ieee.org/document/1329158/
• publication_title: 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)
• conference_location: Vancouver, BC, Canada
• conference_dates: 23-26 May 2004
• publication_number: 9255
• is_number: 29375
• publication_year: 2004
• publication_date: 23-26 May 2004
• start_page: IV
• end_page: 932
• citing_paper_count: 3
• citing_patent_count: 1
• download_count: 79
• insert_date: 20040903
• index_terms:
  • ieee_terms:
    • Quantization
    • Noise measurement
    • CMOS image sensors
    • Optoelectronic and photonic sensors
    • Active noise reduction
    • Image converters
    • Pixel
    • Electrons
    • 1f noise
    • Mathematical analysis
  • dynamic_index_terms:
    • Temporal Noise
    • Quantum Efficiency
    • Image Sensor
    • Camera Sensor
    • Shot Noise
    • Poisson Noise
    • Conversion Gain
    • Uniform Distribution
    • Expected Value
    • Integration Time
    • Measurement Noise
    • Root Mean Square Values
    • Rms Value
    • Quantization Error
    • Amount Of Error
    • Iterative Scheme
    • Iterative Strategy
    • Gain Settings
    • Temporal Measures
    • Fractional Part
    • Offset Settings
• isbn_formats:
  • format: Print ISBN, value: 0-7803-8251-X, isbnType: Historical
• authors:
  • Author Name: L. Lindgren
    Affiliation: Electronic Devices, Linköping Universitet, Sweden
    Author URL: https://ieeexplore.ieee.org/author/37268495100
    ID: 37268495100
    Order: 1
    Author Affiliations:
    • Electronic Devices, Linköping Universitet, Sweden

Image Sensor

• sensor_type: CMOS
• resolution: 1536x512
• dynamic_range: not specified
• pixel_size: 9.5 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• noise: 0.11 LSB

Applications & Benefits

• cell_imaging: Details about applications using CMOS image sensors for imaging.
• benefits: Accurate determination of conversion gain, quantum efficiency, and ADC input referred read noise.

Supporting Organizations

• supported_by: IVP Integrated Vision Products AB, Electronic Devices, Linköping University

Manuscript Details

• publication_date: 23-26 May 2004

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • dark_current
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • focal_length
  • aperture
  • field_of_view
  • distortion

Processed JSON Filename

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