Electronic Global Shutter Cmos Image Sensor Using Oxide Semiconductor Fet With Extremely Low Offstate Current

• doi:
• title: Electronic global shutter CMOS image sensor using oxide semiconductor FET with extremely low off-state current
• publisher: IEEE
• isbn: 978-4-86348-166-4
• issn: 0743-1562
• partnum: 11CH38819
• rank: 2371
• access_type: LOCKED
• content_type: Conferences
• abstract: A novel CMOS image sensor including a pixel with a hybrid structure of an oxide semiconductor FET (OS-FET) and Si(SOI)-FETs has been developed. The OS-FET has an extremely low off-state current, and thus can form a highly insulating charge storage node in combination with SOI. We have therefore applied the OS-FET to an electronic global shutter CMOS image sensor and confirmed improvement in imaging quality.
• article_number: 5984691
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5984691
• html_url: https://ieeexplore.ieee.org/document/5984691/
• abstract_url: https://ieeexplore.ieee.org/document/5984691/
• publication_title: 2011 Symposium on VLSI Technology - Digest of Technical Papers
• conference_location: Kyoto, Japan
• conference_dates: 14-16 June 2011
• publication_number: 5976318
• is_number: 5984315
• publication_year: 2011
• publication_date: 14-16 June 2011
• start_page: 174
• end_page: 175
• citing_paper_count: 2
• citing_patent_count: 6
• download_count: 847
• insert_date: 20110818
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Transistors
    • Voltage measurement
    • Leakage current
    • Films
    • Silicon
    • Logic gates
  • dynamic_index_terms:
    • Electron Tomography
    • EM Images
    • Electron Images
    • Oxide Semiconductor
    • Global Image
    • Electronic Sensors
    • Global Shutter
    • Off-state Current
    • Hybrid Structure
    • Image Capture
    • Rolling Shutter
• isbn_formats:
  • format: CD, value: 978-4-86348-166-4, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-9949-6, isbnType: New-2005
• authors:
  • Author Name: Takeshi Aoki
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37962729200
    ID: 37962729200
    Order: 1
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Masataka Ikeda
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37957271700
    ID: 37957271700
    Order: 2
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Munehiro Kozuma
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37698366600
    ID: 37698366600
    Order: 3
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Hikaru Tamura
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37960432200
    ID: 37960432200
    Order: 4
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Yoshiyuki Kurokawa
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/38513030700
    ID: 38513030700
    Order: 5
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Takayuki Ikeda
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37694620500
    ID: 37694620500
    Order: 6
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Yuta Endo
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085831418
    ID: 37085831418
    Order: 7
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Tetsunori Maruyama
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087690204
    ID: 37087690204
    Order: 8
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Noriko Matsumoto
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37954636900
    ID: 37954636900
    Order: 9
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Yoshinori Ieda
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37947589300
    ID: 37947589300
    Order: 10
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Atsuo Isobe
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37968173800
    ID: 37968173800
    Order: 11
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Jun Koyama
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37949950900
    ID: 37949950900
    Order: 12
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
  • Author Name: Shunpei Yamazaki
    Affiliation: Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37687628100
    ID: 37687628100
    Order: 13
    Author Affiliations:
    • Semiconductor Energy Laboratory Company Limited, Atsugi, Kanagawa, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 640×480
• dynamic_range: Not specified
• pixel_size: 126 μm×126 μm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 60 fps

Applications & Benefits

• cell_imaging: Global shutter application in imaging of rotating objects
• benefits: The hybrid structure allows for improved charge retention and image quality, specifically in dynamic scenes.

Supporting Organizations

• supported_by: Semiconductor Energy Laboratory Co., Ltd.

Manuscript Details

• publication_date: 14-16 June 2011

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • other optical data
  • readout speed
  • temporal noise
  • fixed-pattern noise
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • backside illumination

Processed JSON Filename

request_43cdf9f1-a5f5-4573-8185-1d1ff3b9eb08-electronic_global_shutter_cmos_image_sensor_using_oxide_semiconductor_fet_with_extremely_low_offstate_current.json