Electrically Testable Cmos Image Pixel Circuit

• doi: 10.1109/ECCTD.2015.7300000
• title: Electrically testable CMOS image pixel circuit
• publisher: IEEE
• isbn: 978-1-4799-9876-0
• issn:
• rank: 2367
• access_type: LOCKED
• content_type: Conferences
• abstract: A CMOS image pixel circuit is proposed which is able to be tested by an electrical test method in this paper. The image pixel circuit is tested as an analog circuit without irradiating light to it. A CMOS image sensor is designed to evaluate testability of the pixel circuit. It is shown by SPICE simulation whether 89% of open defects inserted in the image pixel circuit are detected by the electrical test method.
• article_number: 7300000
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7300000
• html_url: https://ieeexplore.ieee.org/document/7300000/
• abstract_url: https://ieeexplore.ieee.org/document/7300000/
• publication_title: 2015 European Conference on Circuit Theory and Design (ECCTD)
• conference_location: Trondheim, Norway
• conference_dates: 24-26 Aug. 2015
• publication_number: 7287453
• is_number: 7299995
• publication_year: 2015
• publication_date: 24-26 Aug. 2015
• start_page: 1
• end_page: 4
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 151
• insert_date: 20151019
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • CMOS integrated circuits
    • Generators
    • Voltage measurement
    • Layout
    • Semiconductor device modeling
  • author_terms:
    • CMOS image pixel circuit
    • electrical test
    • design for testability
    • open defect
  • dynamic_index_terms:
    • Pixel Circuit
    • Test Method
    • Image Sensor
    • Camera Sensor
    • Method In This Paper
    • Methods Paper
    • Electrical Method
    • SPICE Simulations
    • Light Source
    • Photodiode
    • Circuit Simulation
    • Operational Amplifier
    • Op-amp
    • Area Overhead
    • Original Sensor
• isbn_formats:
  • format: USB ISBN, value: 978-1-4799-9876-0, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4799-9877-7, isbnType: New-2005
• authors:
  • Author Name: Masaki Hashizume
    Affiliation: Institute of Technology and Science, Tokushima University, Tokushima, Japan
    Author URL: https://ieeexplore.ieee.org/author/37267323000
    ID: 37267323000
    Order: 1
    Author Affiliations:
    • Institute of Technology and Science, Tokushima University, Tokushima, Japan
  • Author Name: Shingo Saijo
    Affiliation: Institute of Technology and Science, Tokushima University, Tokushima, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085671805
    ID: 37085671805
    Order: 2
    Author Affiliations:
    • Institute of Technology and Science, Tokushima University, Tokushima, Japan
  • Author Name: Hiroyuki Yotsuyanng
    Affiliation: Institute of Technology and Science, Tokushima University, Tokushima, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085659348
    ID: 37085659348
    Order: 3
    Author Affiliations:
    • Institute of Technology and Science, Tokushima University, Tokushima, Japan

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Detailed discussion on applications not provided, but mentioned contexts include automotive systems and consumer electronics like smartphones and medical devices.
• benefits: High reliability and testability without reliance on a light source for testing.

Supporting Organizations

• supported_by: Tokushima University, Japan

Manuscript Details

• publication_date: 24-26 Aug. 2015

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_f77b9186-5748-4882-84a7-8dcd6e35d4b3-electrically_testable_cmos_image_pixel_circuit.json