Dynamic Pixel Test Pattern For Cmos Image Sensor

• doi: 10.1109/ICMTS.2012.6190617
• title: Dynamic pixel test pattern for CMOS image sensor
• publisher: IEEE
• isbn: 978-1-4673-1029-1
• issn: 1071-9032
• partnum: 12CH38962
• rank: 2330
• access_type: LOCKED
• content_type: Conferences
• abstract: We propose a dynamic pixel test pattern for CIS (CMOS Image Sensor) to measure the performance of the pixel unit including TX (Transfer Transistor), DX (Amplifier Transistor), RX (Reset Transistor), SX (Select Transistor), FD (floating Diffusion) and PD (Photo Diode). The proposed TP (Test Pattern) was implemented and verified using a 90 nm CIS process. The proposed TP has well delivered the expected properties of pixel; blooming, pixel reset level, pixel output signal, pixel signal swing range and TX gate turn on pulse width which can only be guessed for a conventional TP. The measured parameters should help to optimize and improve the CIS design.
• article_number: 6190617
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6190617
• html_url: https://ieeexplore.ieee.org/document/6190617/
• abstract_url: https://ieeexplore.ieee.org/document/6190617/
• publication_title: 2012 IEEE International Conference on Microelectronic Test Structures
• conference_location: San Diego, CA, USA
• conference_dates: 19-22 March 2012
• publication_number: 6182735
• is_number: 6190598
• publication_year: 2012
• publication_date: 19-22 March 2012
• start_page: 111
• end_page: 113
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 514
• insert_date: 20120426
• index_terms:
  • ieee_terms:
    • Cameras
    • Logic gates
  • dynamic_index_terms:
    • Dynamic Patterns
    • Dynamic Test
    • Test Pattern
    • Test Card
    • Photodiode
    • Pulse Width
    • Pulsewidth Modulation
    • Pixel Units
    • Output Pixel
    • Input Voltage
    • Real Operation
• isbn_formats:
  • format: CD, value: 978-1-4673-1029-1, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4673-1027-7, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4673-1030-7, isbnType: New-2005
• authors:
  • Author Name: KS Lee
    Affiliation: Hynix Semiconductor Inc., Kyoungi-Do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38241254000
    ID: 38241254000
    Order: 1
    Author Affiliations:
    • Hynix Semiconductor Inc., Kyoungi-Do, Korea
  • Author Name: HJ Lee
    Affiliation: Hynix Semiconductor Inc., Kyoungi-Do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38240374100
    ID: 38240374100
    Order: 2
    Author Affiliations:
    • Hynix Semiconductor Inc., Kyoungi-Do, Korea
  • Author Name: MJ Jang
    Affiliation: Hynix Semiconductor Inc., Kyoungi-Do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38236825900
    ID: 38236825900
    Order: 3
    Author Affiliations:
    • Hynix Semiconductor Inc., Kyoungi-Do, Korea
  • Author Name: JC Kim
    Affiliation: Hynix Semiconductor Inc., Kyoungi-Do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38185717400
    ID: 38185717400
    Order: 4
    Author Affiliations:
    • Hynix Semiconductor Inc., Kyoungi-Do, Korea
  • Author Name: ST Kim
    Affiliation: Hynix Semiconductor Inc., Kyoungi-Do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38239743500
    ID: 38239743500
    Order: 5
    Author Affiliations:
    • Hynix Semiconductor Inc., Kyoungi-Do, Korea
  • Author Name: JW Moon
    Affiliation: Hynix Semiconductor Inc., Kyoungi-Do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37089100583
    ID: 37089100583
    Order: 6
    Author Affiliations:
    • Hynix Semiconductor Inc., Kyoungi-Do, Korea
  • Author Name: IW Cho
    Affiliation: Hynix Semiconductor Inc., Kyoungi-Do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38236879400
    ID: 38236879400
    Order: 7
    Author Affiliations:
    • Hynix Semiconductor Inc., Kyoungi-Do, Korea
  • Author Name: KD Yoo
    Affiliation: Hynix Semiconductor Inc., Kyoungi-Do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38236332600
    ID: 38236332600
    Order: 8
    Author Affiliations:
    • Hynix Semiconductor Inc., Kyoungi-Do, Korea

Image Sensor

• sensor_type: CMOS Image Sensor
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: Enables digital imaging in a variety of applications such as smartphones, medical devices, and automotive systems.

Supporting Organizations

• supported_by: Hynix Semiconductor Inc.

Manuscript Details

• publication_date: 19-22 March 2012

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_0c92f17c-2131-4d9c-94c3-453235b63759-dynamic_pixel_test_pattern_for_cmos_image_sensor.json