Displacement Damage In Cmos Image Sensors After Thermal Neutron Irradiation

• doi: 10.1109/TNS.2018.2874191
• title: Displacement Damage in CMOS Image Sensors After Thermal Neutron Irradiation
• publisher: IEEE
• isbn:
• issn: 1558-1578
• rank: 2309
• access_type: LOCKED
• content_type: Journals
• abstract: In this paper, CMOS image sensors were exposed to thermal neutrons observing an increase in the dark signal of many pixels. The effect was found to be similar to the damage caused by alpha particles irradiation. Rutherford backscattering spectroscopy (RBS) and SIMNRA simulation were used to confirm that the sensors contain boron in the insulation layers. The damage produced by thermal neutrons is explained as displacement damage caused by alpha particles and lithium-7 ions in the silicon active volume of the sensors after boron-10 thermal neutron capture.
• article_number: 8482500
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8482500
• html_url: https://ieeexplore.ieee.org/document/8482500/
• abstract_url: https://ieeexplore.ieee.org/document/8482500/
• publication_title: IEEE Transactions on Nuclear Science
• conference_location:
• conference_dates:
• publication_number: 23
• is_number: 8534509
• publication_year: 2018
• publication_date: Nov. 2018
• start_page: 2793
• end_page: 2801
• citing_paper_count: 14
• citing_patent_count: 0
• download_count: 787
• insert_date: 20181005
• index_terms:
  • ieee_terms:
    • Ionizing radiation
    • Thermal sensors
    • Radiation effects
    • Alpha particles
    • CMOS image sensors
    • Active pixel sensors
    • CMOS technology
    • X-rays
  • author_terms:
    • Active pixel sensors
    • alpha particles
    • borophosphosilicate-glass (BPSG)
    • CMOS image sensors
    • CMOS technology
    • ionizing radiation
    • neutron radiation effects
    • thermal neutron
    • X-rays
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Neutron Irradiation
    • Neutron Radiation
    • Thermal Neutron
    • Displacement Damage
    • Thermal Neutron Irradiation
    • Thermal-neutron Irradiation
    • Neutron Capture
    • Neutron Absorption
    • Rutherford Backscattering Spectrometry
    • Rutherford Backscattering Spectroscopy
    • Thin Layer
    • Photodiode
    • Heat Flux
    • Current Increases
    • X-ray Irradiation
    • X-ray Radiation
    • Particle Interactions
    • Dose Concentration
    • Absorbed Dose
    • Total Ionizing Dose
    • Gamma Rays
    • Cosmic Rays
    • Cosmic-ray
    • Cosmic Radiation
    • Dark Current
    • Dosimeter
    • Dark Images
    • Bright Pixels
    • Linear Energy Transfer
    • Fast Neutron
    • Back-end-of-line
    • Back End Of Line
    • Neutron Detection
    • Neutron Flux
    • Neutron Fluence
    • High Linear Energy Transfer
    • Capture Cross Section
    • Technology Node
    • Si Atoms
    • Research Reactor
    • Experimental Reactor
• authors:
  • Author Name: Fabricio Alcalde Bessia
    Affiliation: Balseiro Institute, Bariloche, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37086515647
    ID: 37086515647
    Order: 1
    Author Affiliations:
    • Balseiro Institute, Bariloche, Argentina
  • Author Name: Martín Pérez
    Affiliation: Comision Nacional de Energia Atomica, Buenos Aires, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37085622162
    ID: 37085622162
    Order: 2
    Author Affiliations:
    • Comision Nacional de Energia Atomica, Buenos Aires, Argentina
  • Author Name: Miguel Sofo Haro
    Affiliation: Balseiro Institute, Bariloche, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37085793021
    ID: 37085793021
    Order: 3
    Author Affiliations:
    • Balseiro Institute, Bariloche, Argentina
  • Author Name: Iván Sidelnik
    Affiliation: Balseiro Institute, Bariloche, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37085632022
    ID: 37085632022
    Order: 4
    Author Affiliations:
    • Balseiro Institute, Bariloche, Argentina
  • Author Name: J. Jerónimo Blostein
    Affiliation: Balseiro Institute, Bariloche, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37086516385
    ID: 37086516385
    Order: 5
    Author Affiliations:
    • Balseiro Institute, Bariloche, Argentina
  • Author Name: Sergio Suárez
    Affiliation: Balseiro Institute, Bariloche, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37085777306
    ID: 37085777306
    Order: 6
    Author Affiliations:
    • Balseiro Institute, Bariloche, Argentina
  • Author Name: Pablo Pérez
    Affiliation: Consejo Nacional de Investigaciones Científicas y Técnicas, Buenos Aires, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37086513421
    ID: 37086513421
    Order: 7
    Author Affiliations:
    • Consejo Nacional de Investigaciones Científicas y Técnicas, Buenos Aires, Argentina
  • Author Name: Mariano Gómez Berisso
    Affiliation: Balseiro Institute, Bariloche, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37086515140
    ID: 37086515140
    Order: 8
    Author Affiliations:
    • Balseiro Institute, Bariloche, Argentina
  • Author Name: Jose Lipovetzky
    Affiliation: Balseiro Institute, Bariloche, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37399599700
    ID: 37399599700
    Order: 9
    Author Affiliations:
    • Balseiro Institute, Bariloche, Argentina

Image Sensor

• sensor_type: CMOS
• resolution: 1280x1024
• dynamic_range: Not specified
• pixel_size: 5.2μm×5.2μm
• dark_current: 3.8 e-/s (alpha particles), 8.4 e-/s (thermal neutrons), 613 e-/s (X-rays)

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: Not mentioned
• signal_to_noise_ratio: Not mentioned
• sensitivity: Not mentioned
• shutter_speed: 1/1033s (max integration time)
• power_consumption: Not mentioned

Applications & Benefits

• cell_imaging: Used in various applications including smartphones, medical devices, and automotive systems.
• benefits: Enabled by the displacement damage mechanism from thermal neutrons and alpha particles, leading to increased dark signal in some pixels.

Supporting Organizations

• supported_by: ANPCyT, UNCuyo, CONICET

Manuscript Details

• publication_date: Nov. 2018

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • power_consumption
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • noise

Processed JSON Filename

request_3cf654c6-c55a-4dac-a354-256c48198f6b-displacement_damage_in_cmos_image_sensors_after_thermal_neutron_irradiation.json