Device For Cmos Image Sensor Data Reading And Image Processing With
Tms320c6713 Texas Instruments Dsp
- doi: 10.1109/SIBEDM.2005.195620
-
title: Device for CMOS image sensor data reading and
image processing with TMS320C6713 Texas instruments DSP
- publisher: IEEE
- isbn: 5-7782-0491-4
- issn: 1815-3712
- partnum: 05EX1056
- rank: 2280
- access_type: LOCKED
- content_type: Conferences
-
abstract: CCD and CMOS image sensors features were
studied; review of the CMOS image sensors was carried out; features of
digital signal processor Texas instruments TMS320C6713 were considered;
an extension board with CMOS image sensor was developed to connect to
evaluation board DSK6713; spot test analysis algorithm was designed
using Matlab 7; software for the system to perform spot test analysis of
image intensifier tube screen was developed using Code Composer Studio
3.0.
- article_number: 1523225
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1523225
-
html_url:
https://ieeexplore.ieee.org/document/1523225/
-
abstract_url:
https://ieeexplore.ieee.org/document/1523225/
-
publication_title: Proceedings. 6th Annual. 2005
International Siberian Workshop and Tutorials on Electron Devices and
Materials, 2005.
- conference_location: Erlagol, Russia
- conference_dates: 1-5 July 2005
- publication_number: 10213
- is_number: 32576
- publication_year: 2005
- publication_date: 1-5 July 2005
- start_page: 173
- end_page: 174
- citing_paper_count: 0
- citing_patent_count: 0
- download_count: 394
- insert_date: 20051031
-
index_terms:
-
ieee_terms:
- CMOS image sensors
- Image processing
- Instruments
- Digital signal processing
- Algorithm design and analysis
- Software testing
- System testing
- Image analysis
- Signal analysis
- Performance analysis
-
dynamic_index_terms:
- Image Processing
- Image Sensor
- Camera Sensor
- Digital Signal Processing
- Texas Instruments
- CCD Camera
- Charge-coupled Device
- Morphological Analysis
- Low-pass
- Low-pass Filter
- Parallelization
- Parallel Computing
- Goal Of This Work
- Control Unit
- Digital Video
- Array Elements
- Digital Image Processing
- Image Optimization
- Boundary Extraction
- Computer Image Processing
- Local Spots
- Spot Test
- Photocathode
- Shift Register
- Deviation Of Intensity
- Central Processing Unit Time
- Processor Time
-
isbn_formats:
-
format: Print ISBN,
value: 5-7782-0491-4,
isbnType: Historical
-
authors:
-
Author Name: A.S. Ivanov
Affiliation: Novosibirsk State Technical
University, Novosibirsk, Russia
Author URL:
https://ieeexplore.ieee.org/author/37087609125
ID: 37087609125
Order: 1
Author Affiliations:
-
Novosibirsk State Technical University, Novosibirsk, Russia
-
Author Name: V.K. Makukha
Affiliation: Novosibirsk State Technical
University, Novosibirsk, Russia
Author URL:
https://ieeexplore.ieee.org/author/37332723500
ID: 37332723500
Order: 2
Author Affiliations:
-
Novosibirsk State Technical University, Novosibirsk, Russia
Image Sensor
- sensor_type: CMOS
- resolution: 1024x1280
- dynamic_range: Not specified
- pixel_size: Not specified
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
Applications & Benefits
-
cell_imaging: Used for capturing images of luminescent
screens of Image Intensifier Tubes.
-
benefits: Reduces time for IIT evaluation phase,
universal design allows for expansion with other IIT screens analysis.
Supporting Organizations
-
supported_by: Texas Instruments University Program,
Spectrum Digital.
Manuscript Details
- publication_date: 1-5 July 2005
Relevancy Score
- score: 10
-
missing_fields:
- dynamic_range
- pixel_size
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
Processed JSON Filename
request_0413f341-28da-4b51-883e-d7570a44e8e5-device_for_cmos_image_sensor_data_reading_and_image_processing_with_tms320c6713_texas_instruments_dsp.json