Design Techniques Evaluation To Mitigate Rts Noise Effect In Column Adc Of 3D Stacked Image Sensors

• doi: 10.1109/IRPS48228.2024.10529382
• title: Design Techniques Evaluation to Mitigate RTS Noise Effect in Column ADC of 3D Stacked Image Sensors
• publisher: IEEE
• isbn: 979-8-3503-6977-9
• issn: 1541-7026
• rank: 2082
• access_type: LOCKED
• content_type: Conferences
• abstract: ADC circuits may cause RTS column signatures in 3D stacked CMOS image sensors. This work proposes a statistical and design evaluation of RTS for 40nm node devices, used in ADC circuits. A transistor array mimicking 3T CIS pixel array architecture is used for RTS characterization, with a proposed RTS detection methodology and counting. The designs presented exhibit a noteworthy decrease in the number of RTS occurrences, as evidenced by the experimental results.
• article_number: 10529382
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10529382
• html_url: https://ieeexplore.ieee.org/document/10529382/
• abstract_url: https://ieeexplore.ieee.org/document/10529382/
• publication_title: 2024 IEEE International Reliability Physics Symposium (IRPS)
• conference_location: Grapevine, TX, USA
• conference_dates: 14-18 April 2024
• publication_number: 10529283
• is_number: 10529298
• publication_year: 2024
• publication_date: 14-18 April 2024
• start_page: P67.TX-1
• end_page: P67.TX-6
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 170
• insert_date: 20240516
• index_terms:
  • ieee_terms:
    • Geometry
    • Three-dimensional displays
    • Circuits
    • Noise
    • Logic gates
    • Reliability engineering
    • Transistors
  • author_terms:
    • Random Telegraph Signal (RTS) noise
    • CMOS image sensor (CIS)
    • correlated double sampling (CDS)
    • Column Analog-to-Digital Converter (ADC)
    • 3D stacked Image Sensors
    • Shallow-Trench Isolation (STI)
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Random Telegraph Signal
    • Random Telegraph Signal Noise
    • Decrease In The Number
    • Parasite
    • Time Constant
    • Sample Holder
    • Temporal Distribution
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Threshold Voltage
    • Bias Values
    • Noise Distribution
    • Channel Surface
    • Top-tier
    • Differential Pair
    • Readout Circuit
    • Low Threshold Voltage
    • Temporal Noise
    • Strong Inversion
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-6977-9, isbnType: New-2005
  • format: Electronic ISBN, value: 979-8-3503-6976-2, isbnType: New-2005
• authors:
  • Author Name: M. Gouveia da Cunha
    Affiliation: STMicroelectronics, Crolles, France
    Author URL: https://ieeexplore.ieee.org/author/209980079173427
    ID: 209980079173427
    Order: 1
    Author Affiliations:
    • STMicroelectronics, Crolles, France
    • ISAE-SUPAERO, Toulouse, France
  • Author Name: S. Place
    Affiliation: STMicroelectronics, Crolles, France
    Author URL: https://ieeexplore.ieee.org/author/37589713800
    ID: 37589713800
    Order: 2
    Author Affiliations:
    • STMicroelectronics, Crolles, France
  • Author Name: O. Gauthier
    Affiliation: STMicroelectronics, Crolles, France
    Author URL: https://ieeexplore.ieee.org/author/320707191570919
    ID: 320707191570919
    Order: 3
    Author Affiliations:
    • STMicroelectronics, Crolles, France
    • CNRS, Grenoble INP, CROMA, Univ. Grenoble Alpes, Univ. Savoie Mont Blanc, Grenoble, France
  • Author Name: N. Virollet
    Affiliation: STMicroelectronics, Crolles, France
    Author URL: https://ieeexplore.ieee.org/author/37088710981
    ID: 37088710981
    Order: 4
    Author Affiliations:
    • STMicroelectronics, Crolles, France
  • Author Name: M. Vignetti
    Affiliation: STMicroelectronics, Crolles, France
    Author URL: https://ieeexplore.ieee.org/author/933980155913267
    ID: 933980155913267
    Order: 5
    Author Affiliations:
    • STMicroelectronics, Crolles, France
  • Author Name: P. Martin-Gonthier
    Affiliation: ISAE-SUPAERO, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/504055842206162
    ID: 504055842206162
    Order: 6
    Author Affiliations:
    • ISAE-SUPAERO, Toulouse, France
  • Author Name: P. Magnan
    Affiliation: ISAE-SUPAERO, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/337313319605928
    ID: 337313319605928
    Order: 7
    Author Affiliations:
    • ISAE-SUPAERO, Toulouse, France
  • Author Name: V. Goiffon
    Affiliation: ISAE-SUPAERO, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/682649499276479
    ID: 682649499276479
    Order: 8
    Author Affiliations:
    • ISAE-SUPAERO, Toulouse, France

Image Sensor

• sensor_type: CMOS
• resolution:
• dynamic_range:
• pixel_size:
• dark_current:

Optical Data

• focal_length:
• aperture:
• field_of_view:
• distortion:

Performance Metrics

• frame_rate: 6 fps
• signal_to_noise_ratio:
• sensitivity:
• shutter_speed:
• power_consumption:
• noise:

Applications & Benefits

• cell_imaging: Details about cell imaging applications.
• benefits: Benefits in low light level applications, particularly for small pixel pitch CIS optimized for mobile applications.

Supporting Organizations

• supported_by: STMicroelectronics, ISAE-SUPAERO, Univ. Grenoble Alpes, Univ. Savoie Mont Blanc, CNRS, CROMA.

Manuscript Details

• publication_date: 14-18 April 2024

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_30b8c179-0f71-48b2-8795-ab6ba636ed39-design_techniques_evaluation_to_mitigate_rts_noise_effect_in_column_adc_of_3d_stacked_image_sensors.json