Design Of Cmos Gated Analog Readout Circuits For Spad Pixel Arrays

• doi:
• title: Design of CMOS Gated Analog Readout Circuits for SPAD Pixel Arrays
• publisher: VDE
• isbn: 978-3-8007-3442-9
• issn:
• rank: 2146
• access_type: LOCKED
• content_type: Conferences
• abstract: Advanced microscopy applications such as Fluorescence Lifetime Imaging Microscopy (FLIM) require detectors possessing high detection efficiency of incident photons and high timing resolution at the same time. One of the emerging technologies in this field is based on Single-Photon Avalanche Diodes (SPADs) which can easily be integrated into arrays in conventional CMOS technologies, providing picosecond timing resolution at a low fabrication cost. The feasibility of in-pixel analog processing circuits to replace area-consuming digital readout circuits has been recently demonstrated. Without sacrificing counting accuracy, analog circuits contain a much lower number of transistors, making the pixel design compact. In this paper we present an analysis of two different analog readout circuits for compact SPAD pixels. The proposed analog counters offer sub-nanosecond gating capabilities and are therefore suitable for FLIM applications. Keywords: SPAD, CMOS, image sensor, FLIM.
• article_number: 6226121
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6226121
• html_url: https://ieeexplore.ieee.org/document/6226121/
• abstract_url: https://ieeexplore.ieee.org/document/6226121/
• publication_title: PRIME 2012; 8th Conference on Ph.D. Research in Microelectronics & Electronics
• conference_location: Aachen, Germany
• conference_dates: 12-15 June 2012
• publication_number: 6225459
• is_number: 6225736
• publication_year: 2012
• publication_date: 12-15 June 2012
• start_page: 1
• end_page: 4
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 575
• insert_date: 20120706
• index_terms:
  • ieee_terms:
    • Capacitance
    • Transistors
    • CMOS integrated circuits
    • Photonics
    • Logic gates
    • Imaging
    • CMOS technology
  • dynamic_index_terms:
    • Pixel Array
    • Readout Circuit
    • Single-photon Avalanche Diode
    • Single-photon Avalanche Diode Pixel
    • Time Resolution
    • CMOS Technology
    • Fluorescence Lifetime Imaging Microscopy
    • Fluorescence Lifetime Imaging
    • FLIM
    • Avalanche Diode
    • Simulation Results
    • Monte Carlo Simulation
    • Monte Carlo Method
    • High Voltage
    • Higher Tendency
    • Pulse Width
    • Pulsewidth Modulation
    • Inverter
    • Fill Factor
    • Voltage Step
    • Circuit Performance
    • Circuit Operation
    • Function Of Delay
• isbn_formats:
  • format: Electronic ISBN, value: 978-3-8007-3442-9, isbnType: New-2005
• authors:
  • Author Name: Ekaterina Panina
    Affiliation:
    Author URL:
    ID:
    Order: 1
    
  • Author Name: Gian-Franco Dalla Betta
    Affiliation:
    Author URL:
    ID:
    Order: 2
    
  • Author Name: Lucio Pancheri
    Affiliation:
    Author URL:
    ID:
    Order: 3
    
  • Author Name: David Stoppa
    Affiliation:
    Author URL:
    ID:
    Order: 4
    

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: 25µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Fluorescence Lifetime Imaging Microscopy (FLIM) applications
• benefits: High detection efficiency, high timing resolution.

Supporting Organizations

• supported_by: University of Trento, Fondazione Bruno Kessler (FBK)

Manuscript Details

• publication_date: 12-15 June 2012

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • power_consumption
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • noise

Processed JSON Filename

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