Design And Simulation Of A Cmos Slewrate Enhanced Ota To Drive Heavy Capacitive Loads

• doi: 10.1109/ICBEA.2018.8471744
• title: Design and Simulation of a CMOS Slew-Rate Enhanced OTA to Drive Heavy Capacitive Loads
• publisher: IEEE
• isbn: 978-1-5386-8059-9
• issn:
• rank: 2107
• access_type: LOCKED
• content_type: Conferences
• abstract: Flicker noise is one of the main noise contributors in CMOS Image Sensors. After great effort from universities and industry in reducing thermal noise, in modern CMOS imagers the bottleneck in achieving lower noise performance is now flicker noise. This paper presents a new method to reduce the flicker noise contribution in the overall sensor noise budget by means of reducing the time for Double Sampling, so that it more effectively filters the flicker noise spectrum introduced by the pixel source follower amplifier. In addition, this paper also proposes a way to promote and ensure no column induced lag from column readout circuitry through strong and stable references. The proposed amplifier circuit buffers the reference voltage while Double Sampling operation performed in the analogue domain, is taking place. It not only shortens the time between samples, but also reduces the current consumption, reducing part of the sensor power heat dissipation. Finally, the proposed architecture can be used in different applications where high resolution and stable references are needed, e.g. to supply the references for massive column parallel analogue circuits which are typical in modern CMOS Image Sensor designs. The design and simulation of the proposed high Slew-Rate driver circuit are verified with a circuit containing 3000 readout columns.
• article_number: 8471744
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8471744
• html_url: https://ieeexplore.ieee.org/document/8471744/
• abstract_url: https://ieeexplore.ieee.org/document/8471744/
• publication_title: 2018 International Conference on Biomedical Engineering and Applications (ICBEA)
• conference_location: Funchal, Portugal
• conference_dates: 9-12 July 2018
• publication_number: 8463143
• is_number: 8471726
• publication_year: 2018
• publication_date: 9-12 July 2018
• start_page: 1
• end_page: 6
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 424
• insert_date: 20180927
• index_terms:
  • ieee_terms:
    • Electronics packaging
    • 1f noise
    • CMOS image sensors
    • Logic gates
    • Capacitive sensors
    • Calibration
  • author_terms:
    • Amplifier
    • OTA
    • Driver
    • Slew-Rate
    • CMOS Image Sensor
    • Double Sampling
    • Flicker Noise
    • Image Lag
  • dynamic_index_terms:
    • Inductive Load
    • Load Capacitance
    • Slew Rate
    • Slew-rate
    • Operational Transconductance Amplifier
    • Image Sensor
    • Camera Sensor
    • Current Consumption
    • Noise Spectrum
    • Colored Noise
    • Double Sampling
    • Flicker Noise
    • Analog Domain
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Signal To Noise
    • Signal To Noise Ratio
    • Sampling Period
    • Sampling Periods
    • Power Spectrum
    • Power Spectral Density
    • Spectral Function
    • Transient Effects
    • Transient Events
    • Common Mode
    • Output Current
    • Noise Power
    • Settling Time
    • Colonial Times
    • Output Node
    • Auxiliary Circuit
    • Amplification Stage
    • Negative Input
    • Open-loop Gain
    • Open Loop Gain
    • Short Sampling Period
    • Short Sampling Periods
    • Common-mode Voltage
    • Noise Power Spectrum
    • Pixel Column
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5386-8059-9, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5386-8058-2, isbnType: New-2005
• authors:
  • Author Name: Luis Miguel Carvalho Freitas
    Affiliation: CIS and Design Department, Madeira Tecnopolo, Funchal, Portugal
    Author URL: https://ieeexplore.ieee.org/author/37086466160
    ID: 37086466160
    Order: 1
    Author Affiliations:
    • CIS and Design Department, Madeira Tecnopolo, Funchal, Portugal
  • Author Name: Morgado Dias
    Affiliation: Madeira Interactive Technologies Institute, Funchal, Portugal
    Author URL: https://ieeexplore.ieee.org/author/37086465473
    ID: 37086465473
    Order: 2
    Author Affiliations:
    • Madeira Interactive Technologies Institute, Funchal, Portugal
  • Author Name: Guy Meynants
    Affiliation: CIS and Design Technical Board Department, AMS Sensors Belgium, Antwerp, Belgium
    Author URL: https://ieeexplore.ieee.org/author/37427148600
    ID: 37427148600
    Order: 3
    Author Affiliations:
    • CIS and Design Technical Board Department, AMS Sensors Belgium, Antwerp, Belgium
  • Author Name: Adi Xhakoni
    Affiliation: CIS and Design Department, AMS Sensors Belgium, Antwerp, Belgium
    Author URL: https://ieeexplore.ieee.org/author/38015293100
    ID: 38015293100
    Order: 4
    Author Affiliations:
    • CIS and Design Department, AMS Sensors Belgium, Antwerp, Belgium

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: medical devices and automotive systems
• benefits: enables digital imaging

Supporting Organizations

• supported_by: Portuguese Foundation for Science and Technology

Manuscript Details

• publication_date: 9-12 July 2018

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

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