Depletionmode Mos Capacitor Modeling Investigation

• doi: 10.1109/CSTIC.2017.7919748
• title: Depletion-mode MOS capacitor modeling investigation
• publisher: IEEE
• isbn: 978-1-5090-6695-7
• issn:
• rank: 2077
• access_type: LOCKED
• content_type: Conferences
• abstract: A depletion-mode MOS (DMOS) capacitor modeling methodology with high accuracy and feasibility is proposed. Currently, it is lack of compact model relevant DMOS capacitor modeling but it is significant importance in A/D converters (ADCs) for CMOS image sensor circuit. This modeling methodology not only could provide good accuracy on geometry scaling but also with voltage and temperature sensitivity.
• article_number: 7919748
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7919748
• html_url: https://ieeexplore.ieee.org/document/7919748/
• abstract_url: https://ieeexplore.ieee.org/document/7919748/
• publication_title: 2017 China Semiconductor Technology International Conference (CSTIC)
• conference_location: Shanghai
• conference_dates: 12-13 March 2017
• publication_number: 7912712
• is_number: 7919727
• publication_year: 2017
• publication_date: 12-13 March 2017
• start_page: 1
• end_page: 3
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 381
• insert_date: 20170508
• index_terms:
  • ieee_terms:
    • Electronic mail
  • dynamic_index_terms:
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Modeling Methodology
    • Temperature Coefficient
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-6695-7, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-6694-0, isbnType: New-2005
• authors:
  • Author Name: Chien-Lung Tseng
    Affiliation: Technology R&D, Semiconductor Manufacturing International Corporation, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37087647717
    ID: 37087647717
    Order: 1
    Author Affiliations:
    • Technology R&D, Semiconductor Manufacturing International Corporation, Shanghai, China
  • Author Name: Yuan Sheng Wang
    Affiliation: Technology R&D, Semiconductor Manufacturing International Corporation, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37087750682
    ID: 37087750682
    Order: 2
    Author Affiliations:
    • Technology R&D, Semiconductor Manufacturing International Corporation, Shanghai, China

Image Sensor

• sensor_type: CMOS
• resolution: 14 bits
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 120 frames/s

Applications & Benefits

• cell_imaging: Used in CMOS image sensor circuits for ADCs
• benefits: High-density capacitance compared with MOM and MIM capacitors.

Supporting Organizations

• supported_by: SMIC modeling team

Manuscript Details

• publication_date: 12-13 March 2017

Relevancy Score

• score: 8
• missing_fields:
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_b632b045-042b-4731-a650-47a8cad1d408-depletionmode_mos_capacitor_modeling_investigation.json