Dental Imaging With A Quantumdotbased Direct Conversion Xray Image Sensor

• doi: 10.1109/NSS/MIC/RTSD57108.2024.10654883
• title: Dental Imaging with a Quantum-dot-based Direct Conversion X-ray Image Sensor
• publisher: IEEE
• isbn: 979-8-3503-8816-9
• issn: 1082-3654
• rank: 2075
• access_type: LOCKED
• content_type: Conferences
• abstract: X-ray imaging has been extensively used in medical diagnosis thanks to the ability of X-rays to penetrate through our body or a part for non-invasive imaging of internal structures. Nowadays, most commercial X-ray detectors including dental imaging instruments rely on a cesium iodide (CsI) scintillator to convert X-rays into visible light. However, they normally suffer from a low spatial resolution due to optical crosstalk among neighboring pixels. Pixelated detectors made of cadmium telluride (CdTe) or cadmium zinc telluride (CdZnTe) have shown excellent performance for X-ray imaging. Nevertheless, they require flip-chip hybridization to connect to silicon readout, adding assembly complexity, increasing fabrication cost, and restricting achievable pixel resolution. We have developed a direct conversion X-ray imager with a high-Z lead-sulfide (PbS) quantum-dot (QD) based photon absorber monolithically and directly deposited on a CMOS readout chip. The silicon readout has been designed with a standard 180-nm CMOS process and the photon absorber with a 120- $\mu$ m layer of PbS QDs has been deposited from solutions at low temperature. This approach takes advantages of CMOS technologies for a high pixel resolution, low-power consumption, and complex readout electronics. It also benefits from high X-ray absorption efficiency and low-temperature solution-based fabrication of PbS QDs. To our knowledge, this is the first direct conversion X-ray imager with an absorber stack of PbS QDs on silicon readout. Following an introduction to sensor design and fabrication, this paper demonstrates the potential use of this imager in medical imaging particularly dental imaging. This novel radiation detector has been used to produce high-quality tooth images while presenting a low dark current, high linearity, a low noise equivalent dose, and a high spatial resolution. The validation of this solution-based monolithic approach benefits realization of low-cost high-performance X-ray imagers.
• article_number: 10654883
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10654883
• html_url: https://ieeexplore.ieee.org/document/10654883/
• abstract_url: https://ieeexplore.ieee.org/document/10654883/
• publication_title: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
• conference_location: Tampa, FL, USA
• conference_dates: 26 Oct.-2 Nov. 2024
• publication_number: 10654796
• is_number: 10654808
• publication_year: 2024
• publication_date: 26 Oct.-2 Nov. 2024
• start_page: 1
• end_page: 1
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 59
• insert_date: 20240925
• index_terms:
  • ieee_terms:
    • Fabrication
    • Lead
    • Silicon
    • Dentistry
    • Spatial resolution
    • X-ray imaging
    • Tellurium
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-8816-9, isbnType: New-2005
  • format: Electronic ISBN, value: 979-8-3503-8815-2, isbnType: New-2005
• authors:
  • Author Name: C.-M. Zhang
    Affiliation: Centre Suisse d’Electronique et de Microtechnique (CSEM), Edge AI & Vision Systems Group, Neuchâtel, Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/584134958626223
    ID: 584134958626223
    Order: 1
    Author Affiliations:
    • Centre Suisse d’Electronique et de Microtechnique (CSEM), Edge AI & Vision Systems Group, Neuchâtel, Neuchâtel, Switzerland
  • Author Name: R. Quaglia
    Affiliation: Centre Suisse d’Electronique et de Microtechnique (CSEM), Edge AI & Vision Systems Group, Neuchâtel, Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37089925210
    ID: 37089925210
    Order: 2
    Author Affiliations:
    • Centre Suisse d’Electronique et de Microtechnique (CSEM), Edge AI & Vision Systems Group, Neuchâtel, Neuchâtel, Switzerland
  • Author Name: A. Shulga
    Affiliation: QDI Systems, Groningen, Netherlands
    Author URL: https://ieeexplore.ieee.org/author/979246216628555
    ID: 979246216628555
    Order: 3
    Author Affiliations:
    • QDI Systems, Groningen, Netherlands
  • Author Name: V. Goossens
    Affiliation: QDI Systems, Groningen, Netherlands
    Author URL: https://ieeexplore.ieee.org/author/221751411767788
    ID: 221751411767788
    Order: 4
    Author Affiliations:
    • QDI Systems, Groningen, Netherlands
  • Author Name: A. A.-H. Husain
    Affiliation: Clinic of Cranio-Maxillofacial and Oral Surgery, Center of Dental Medicine, Zurich, University of Zurich, Zürich, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/300497287895402
    ID: 300497287895402
    Order: 5
    Author Affiliations:
    • Clinic of Cranio-Maxillofacial and Oral Surgery, Center of Dental Medicine, Zurich, University of Zurich, Zürich, Switzerland
  • Author Name: B. Stadlinger
    Affiliation: Clinic of Cranio-Maxillofacial and Oral Surgery, Center of Dental Medicine, Zurich, University of Zurich, Zürich, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/405946609335840
    ID: 405946609335840
    Order: 6
    Author Affiliations:
    • Clinic of Cranio-Maxillofacial and Oral Surgery, Center of Dental Medicine, Zurich, University of Zurich, Zürich, Switzerland
  • Author Name: P.-F. Ruëdi
    Affiliation: Centre Suisse d’Electronique et de Microtechnique (CSEM), Edge AI & Vision Systems Group, Neuchâtel, Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/193162349461677
    ID: 193162349461677
    Order: 7
    Author Affiliations:
    • Centre Suisse d’Electronique et de Microtechnique (CSEM), Edge AI & Vision Systems Group, Neuchâtel, Neuchâtel, Switzerland

Image Sensor

• sensor_type: CMOS
• resolution: unknown
• dynamic_range: unknown
• pixel_size: unknown
• dark_current: low dark current

Optical Data

• focal_length: unknown
• aperture: unknown
• field_of_view: unknown
• distortion: unknown

Performance Metrics

• frame_rate: unknown
• signal_to_noise_ratio: high
• sensitivity: unknown
• shutter_speed: unknown
• power_consumption: low-power consumption
• noise: low noise equivalent dose

Applications & Benefits

• cell_imaging: high-quality tooth images
• benefits: low-cost high-performance X-ray imagers, high pixel resolution, high X-ray absorption efficiency

Supporting Organizations

• supported_by: CSEM, QDI Systems, University of Zurich

Manuscript Details

• publication_date: 26 Oct.-2 Nov. 2024

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed

Processed JSON Filename

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