Deep Subelectron Read Noise In Image Sensors Using A Multigatesourcefollower

• doi: 10.1109/TED.2022.3166723
• title: Deep Sub-Electron Read Noise in Image Sensors Using a Multigate-Source-Follower
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 2061
• access_type: CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.
• content_type: Journals
• abstract: As the in-pixel source-follower (SF) gate size scales down in CMOS image sensors (CISs) and quanta image sensors (QISs), the pixel conversion gain (CG) increases at the cost of more 1/ ${f}$ noise. In this article, a multigate SF (MGSF) is proposed to simultaneously increase pixel CG and reduce 1/ ${f}$ noise. The MGSF improves the tradeoff between 1/ ${f}$ noise and CG that exists for pixels with conventional SFs, leading to reduced input-referred read noise at deep sub-electron levels.
• article_number: 9764826
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9764826
• html_url: https://ieeexplore.ieee.org/document/9764826/
• abstract_url: https://ieeexplore.ieee.org/document/9764826/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 9780469
• publication_year: 2022
• publication_date: June 2022
• start_page: 2986
• end_page: 2991
• citing_paper_count: 3
• citing_patent_count: 0
• download_count: 1618
• insert_date: 20220428
• index_terms:
  • ieee_terms:
    • Logic gates
    • 1/f noise
    • Modulation
    • Gain measurement
    • Noise measurement
    • Electrostatics
    • Electronics packaging
  • author_terms:
    • 1/f noise
    • CMOS image sensor (CIS)
    • multigate source-follower (MGSF)
    • quanta image sensor (QIS)
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Deep Reading
    • Conversion Gain
    • Input-referred Noise
    • Larger Area
    • Electrostatic Potential
    • Electric Potential
    • Fast Fourier Transform
    • Inverse Fast Fourier Transform
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Surprising Result
    • Surprising Outcome
    • Thermal Noise
    • Current Noise
    • Bit Error Rate
    • Bit-error-rate
    • Bit Error Ratio
    • Parasitic Capacitance
    • Noise Spectrum
    • Colored Noise
    • Total Capacitance
    • Path Of Electrons
    • Reset Gate
    • Exponential Change
    • TCAD Simulation
• authors:
  • Author Name: Wei Deng
    Affiliation: Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37089387846
    ID: 37089387846
    Order: 1
    Author Affiliations:
    • Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
  • Author Name: Eric R. Fossum
    Affiliation: Thayer School of Engineering, Dartmouth College, Hanover, NH, USA
    Author URL: https://ieeexplore.ieee.org/author/37326789400
    ID: 37326789400
    Order: 2
    Author Affiliations:
    • Thayer School of Engineering, Dartmouth College, Hanover, NH, USA

Image Sensor

• sensor_type: CMOS
• resolution: Not Specified
• dynamic_range: Not Specified
• pixel_size: 2.2μm x 1.1μm
• dark_current: Not Specified

Optical Data

• focal_length: Not Specified
• aperture: Not Specified
• field_of_view: Not Specified
• distortion: Not Specified

Performance Metrics

• frame_rate: Not Specified
• signal_to_noise_ratio: Not Specified
• sensitivity: Not Specified
• shutter_speed: Not Specified
• power_consumption: Not Specified
• noise: 0.12-e−rms (measured), 0.22-e−rms (median across all pixels)

Applications & Benefits

• cell_imaging: Accurate (low bit-error rate) single-photoelectron counting
• benefits: Enabling detection of single electrons without avalanche gain; improved read noise performance for imaging applications.

Supporting Organizations

• supported_by: Jet Propulsion Laboratory, NASA, Rochester Institute of Technology

Manuscript Details

• publication_date: June 2022

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources (temporal noise and fixed-pattern noise)
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_1c27a705-125e-48e1-aaea-d5a4230c8514-deep_subelectron_read_noise_in_image_sensors_using_a_multigatesourcefollower.json