Decoupling Of Rts Noise In High Density Cmos Image Sensor Using New Test Structures

• doi: 10.1109/ICMTS.2011.5976865
• title: Decoupling of RTS noise in high density CMOS image sensor using new test structures
• publisher: IEEE
• isbn: 978-1-4244-8528-4
• issn: 1071-9032
• partnum: 11CH3873
• rank: 2054
• access_type: LOCKED
• content_type: Conferences
• abstract: In this work, new test structures are proposed to characterize the RTS (Random Telegraph Signal) noise of the CMOS image sensor. The RTS noise of the driver transistor and the source follower transistor, as well as the source follower block itself, are measured using the proposed test structures. The probability of monitoring the RTS noise of the driver transistor and the source follower transistor is 76 % and 52 %, respectively. However, the probability of the generation of the RTS noise for the source follower block is about 74 %. Therefore, it can be said that the driver transistor dominates the RTS noise of the source follower block.
• article_number: 5976865
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5976865
• html_url: https://ieeexplore.ieee.org/document/5976865/
• abstract_url: https://ieeexplore.ieee.org/document/5976865/
• publication_title: 2011 IEEE ICMTS International Conference on Microelectronic Test Structures
• conference_location: Amsterdam, Netherlands
• conference_dates: 4-7 April 2011
• publication_number: 5959845
• is_number: 5976839
• publication_year: 2011
• publication_date: 4-7 April 2011
• start_page: 87
• end_page: 89
• citing_paper_count: 5
• citing_patent_count: 0
• download_count: 374
• insert_date: 20110804
• index_terms:
  • ieee_terms:
    • Microelectronics
    • Conferences
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Random Telegraph Signal
    • Random Telegraph Signal Noise
    • Generation Probability
    • Propagation Probability
    • CCD Camera
    • Charge-coupled Device
    • Sensory Function
    • Sensor Performance
    • Noise Sources
    • CMOS Technology
    • System-on-chip
• isbn_formats:
  • format: Online ISBN, value: 978-1-4244-8528-4, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-8526-0, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4244-8529-1, isbnType: New-2005
• authors:
  • Author Name: Jung-Deuk Bok
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37533574900
    ID: 37533574900
    Order: 1
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: In-Shik Han
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37536497000
    ID: 37536497000
    Order: 2
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: Hyuk-Min Kwon
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37533579300
    ID: 37533579300
    Order: 3
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: Sang-Uk Park
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37539540400
    ID: 37539540400
    Order: 4
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: Yi-Jung Jung
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37852985100
    ID: 37852985100
    Order: 5
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: Seong-Hyung Park
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37067897000
    ID: 37067897000
    Order: 6
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: Woon-Il Choi
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37966480500
    ID: 37966480500
    Order: 7
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: Man-Lyun Ha
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37957868600
    ID: 37957868600
    Order: 8
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: Ju-Il Lee
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37964845800
    ID: 37964845800
    Order: 9
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
  • Author Name: Hi-Deok Lee
    Affiliation: Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37280122200
    ID: 37280122200
    Order: 10
    Author Affiliations:
    • Department of Electronics Engineering, Chungnam National University, Daejeon, South Korea

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• noise: Includes temporal noise and fixed-pattern noise

Applications & Benefits

• cell_imaging: Applications include smartphones, medical devices, automotive systems.
• benefits: CMOS image sensors enable digital imaging.

Supporting Organizations

• supported_by: Not specified

Manuscript Details

• publication_date: 4-7 April 2011

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_15753dfa-c5e6-41e6-8cd0-ce8a96b639fd-decoupling_of_rts_noise_in_high_density_cmos_image_sensor_using_new_test_structures.json