Dark Current Of The Solidstate Imagers At High Temperature

• doi: 10.1109/EIConRus.2017.7910636
• title: Dark current of the solid-state imagers at high temperature
• publisher: IEEE
• isbn: 978-1-5090-4866-3
• issn:
• rank: 2045
• access_type: LOCKED
• content_type: Conferences
• abstract: The theoretical analysis of dark currents of area charge-coupled devices (CCD) and CMOS image sensor at high temperatures from 60 to 150 degrees Celsius is carried out. It is shown, that reduction of accumulation time reduces dark currents of photodiodes. Transfer registers dark currents is dominating component in area CCD and defined by temporary parameters of scan. In CMOS image sensor with global shutter the high level of dark current is caused by an element of memory in the pixel. This a component is defined by temporary parameters of scan and coordinates of elements. Thus, CMOS image sensor with the rolling shutter is an optimum choice in case of design of high-temperature Television cameras. Experimental studies are conducted. Theoretical data are confirmed.
• article_number: 7910636
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7910636
• html_url: https://ieeexplore.ieee.org/document/7910636/
• abstract_url: https://ieeexplore.ieee.org/document/7910636/
• publication_title: 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)
• conference_location: St. Petersburg and Moscow, Russia
• conference_dates: 1-3 Feb. 2017
• publication_number: 7899013
• is_number: 7910472
• publication_year: 2017
• publication_date: 1-3 Feb. 2017
• start_page: 635
• end_page: 638
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 302
• insert_date: 20170427
• index_terms:
  • ieee_terms:
    • Dark current
    • CMOS image sensors
    • Photodiodes
    • Charge coupled devices
    • Temperature sensors
    • TV
    • Cameras
  • author_terms:
    • Area CCD
    • CMOS image sensor
    • Dark current
    • High temperature
    • Electronic Shutter
  • dynamic_index_terms:
    • Dark Current
    • CCD Camera
    • Charge-coupled Device
    • Photodiode
    • Image Sensor
    • Camera Sensor
    • Memory Elements
    • Coordinates Of Elements
    • Rolling Shutter
    • Increase In Temperature
    • Thermal Power Plants
    • Thermal Generation
    • Thermal Plants
    • Video Signal
    • Accumulation In Lines
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-4866-3, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-4865-6, isbnType: New-2005
• authors:
  • Author Name: Pavel S. Baranov
    Affiliation: Department of Television and Video Engineering, St. Petersburg Electrotechnical University «LETI», St. Petersburg, Russia
    Author URL: https://ieeexplore.ieee.org/author/37085491748
    ID: 37085491748
    Order: 1
    Author Affiliations:
    • Department of Television and Video Engineering, St. Petersburg Electrotechnical University «LETI», St. Petersburg, Russia
  • Author Name: Vladimir T. Litvin
    Affiliation: Department of Radio Engineering and Information Technologies, St.Petersburg State University of Film and Television, St. Petersburg, Russia
    Author URL: https://ieeexplore.ieee.org/author/37087978244
    ID: 37087978244
    Order: 2
    Author Affiliations:
    • Department of Radio Engineering and Information Technologies, St.Petersburg State University of Film and Television, St. Petersburg, Russia
  • Author Name: Darya A. Belous
    Affiliation: Department of Oil and Gas Fields Development and Operation, National Mineral Resources University, St. Petersburg, Russia
    Author URL: https://ieeexplore.ieee.org/author/37087979511
    ID: 37087979511
    Order: 3
    Author Affiliations:
    • Department of Oil and Gas Fields Development and Operation, National Mineral Resources University, St. Petersburg, Russia
  • Author Name: Andrey A. Mantsvetov
    Affiliation: Department of Television and Video Engineering, St. Petersburg Electrotechnical University «LETI», St. Petersburg, Russia
    Author URL: https://ieeexplore.ieee.org/author/37086155686
    ID: 37086155686
    Order: 4
    Author Affiliations:
    • Department of Television and Video Engineering, St. Petersburg Electrotechnical University «LETI», St. Petersburg, Russia

Image Sensor

• sensor_type: CMOS
• resolution: 1920x1200
• dynamic_range: not specified
• pixel_size: 2.8x2.8 m
• dark_current: 4 electrons at +60 °C

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: High-temperature applications, reduced dark current with accumulation time reduction

Supporting Organizations

• supported_by: not specified

Manuscript Details

• publication_date: 1-3 Feb. 2017

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging

Processed JSON Filename

request_cd492f44-fe4a-45bf-aecc-e8b7e0e3ab93-dark_current_of_the_solidstate_imagers_at_high_temperature.json