Dark Current Analysis Of Ptype And Ntype Pixels Under Total Ionizing Dose Radiation Effects

• doi: 10.1109/APCCAS.2016.7804013
• title: Dark current analysis of P-type and N-type pixels under total ionizing dose radiation effects
• publisher: IEEE
• isbn: 978-1-5090-1571-9
• issn:
• rank: 2044
• access_type: LOCKED
• content_type: Conferences
• abstract: In this paper, a custom-designed CMOS image sensor (CIS) is proposed with N-type and P-type pixels fabricated on one chip. A Co radiation experiment is implemented on the proposed CIS chip. Measurement results shows that the P-type pixels have good total ionizing dose (TID) radiation tolerance with less radiation induced dark current compared with N-type pixels. But the dark current nonuniformity of P-type pixels is observed to be enhanced more than N-type ones by TID radiation effect.
• article_number: 7804013
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7804013
• html_url: https://ieeexplore.ieee.org/document/7804013/
• abstract_url: https://ieeexplore.ieee.org/document/7804013/
• publication_title: 2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
• conference_location: Jeju, Korea (South)
• conference_dates: 25-28 Oct. 2016
• publication_number: 7786273
• is_number: 7803879
• publication_year: 2016
• publication_date: 25-28 Oct. 2016
• start_page: 499
• end_page: 501
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 400
• insert_date: 20170105
• index_terms:
  • ieee_terms:
    • Dark current
    • Photodiodes
    • CMOS image sensors
    • Electron traps
    • Current measurement
    • Total ionizing dose
  • author_terms:
    • CMOS image sensor
    • Radiation
    • TID
    • Dark Current
  • dynamic_index_terms:
    • Effects Of Radiation
    • Effects Of Radiotherapy
    • Effect Of Irradiation
    • Dose Concentration
    • Absorbed Dose
    • Total Ionizing Dose
    • Dark Current
    • Pixel Analysis
    • Dark Current Analysis
    • Image Sensor
    • Camera Sensor
    • Radiation Tolerance
    • Radiation Hardness
    • CCD Camera
    • Charge-coupled Device
    • Radiation Dose
    • Irradiation Dose
    • Current Source
    • Current Regulations
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Charge Trapping
    • Pixel Array
    • Dark Signal
    • Types Of Pixels
    • Dark Current Density
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-1571-9, isbnType: New-2005
  • format: USB ISBN, value: 978-1-5090-1569-6, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-1570-2, isbnType: New-2005
• authors:
  • Author Name: Ran Zheng
    Affiliation: School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
    Author URL: https://ieeexplore.ieee.org/author/37587146300
    ID: 37587146300
    Order: 1
    Author Affiliations:
    • School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
  • Author Name: Jia Wang
    Affiliation: School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
    Author URL: https://ieeexplore.ieee.org/author/37965179400
    ID: 37965179400
    Order: 2
    Author Affiliations:
    • School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China

Image Sensor

• sensor_type: CMOS
• resolution: 32x32 pixels
• dynamic_range: Not specified
• pixel_size: 20μm x 20μm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Medical and scientific imaging applications, star tracking, orbit surveillance, particle detection, astronomy, earth observation
• benefits: Offers low cost, low power consumption, high speed, high integration level, and better electro-optical performance.

Supporting Organizations

• supported_by: National Natural Science Foundation of China, National Key Scientific Instrument and Equipment Development Project, Fundamental Research Funds for the Central Universities.

Manuscript Details

• publication_date: 25-28 Oct. 2016

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_18fd7681-c488-43ed-bb41-71f8da15a5f7-dark_current_analysis_of_ptype_and_ntype_pixels_under_total_ionizing_dose_radiation_effects.json