Current Mode Image Sensor With Improved Linearity And Fixedpattern Noise

• doi: 10.1109/TCSI.2013.2295009
• title: Current Mode Image Sensor With Improved Linearity and Fixed-Pattern Noise
• publisher: IEEE
• isbn:
• issn: 1558-0806
• rank: 2022
• access_type: LOCKED
• content_type: Journals
• abstract: Current mode active pixel sensors convert light intensity into an analog output current. A current mode image sensor enables simple implementation of focal plane algebraic functions but suffers from poor linearity and large fixed-patten noise. This paper analyzes the causes of the non-linearity of a current-mode image sensor including a theoretical derivation and numerical simulation. Previously reported linearity improvement methods are reviewed, while an architecture of a current mode image sensor with a voltage feedback loop between pixel output and the current conveyor for linearity enhancement is proposed. An image sensor array of 100 × 200 current mode pixels is fabricated in a 0.5 μm 2P3M standard CMOS processing technology. Experimental results illustrate a 45% improvement of the linearity of the proposed imager. Fixed pattern noise is reduced by 57.6% for the maximum readout current, which can be further reduced by another 51.5% after gain calibration. A signal to noise ratio of 49.6 dB is achieved.
• article_number: 6798767
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6798767
• html_url: https://ieeexplore.ieee.org/document/6798767/
• abstract_url: https://ieeexplore.ieee.org/document/6798767/
• publication_title: IEEE Transactions on Circuits and Systems I: Regular Papers
• conference_location:
• conference_dates:
• publication_number: 8919
• is_number: 6820808
• publication_year: 2014
• publication_date: June 2014
• start_page: 1666
• end_page: 1674
• citing_paper_count: 8
• citing_patent_count: 0
• download_count: 1225
• insert_date: 20140415
• index_terms:
  • ieee_terms:
    • Transistors
    • Image sensors
    • Noise
    • Linearity
    • Resistance
    • Standards
    • Arrays
  • author_terms:
    • Current mode image sensor
    • fixed-pattern noise
    • linear response
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Current Image
    • Current Sensor
    • Fixed Pattern Noise
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Feedback Loop
    • Light Intensity
    • Focal Plane
    • Back Focal Plane
    • Output Current
    • Sensor Array
    • Output Pixel
    • CCD Camera
    • Charge-coupled Device
    • Dynamic Range
    • Voltage Drop
    • Potential Drop
    • IR Drop
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • I-V Curves
    • Current Voltage Characteristics
    • I-V Characteristics
    • Resistant Parasites
    • Fill Factor
    • Shot Noise
    • Poisson Noise
    • Saturation Region
    • Saturation Velocity
    • Selective Switching
    • Voltage Mode
    • Readout Circuit
    • Readout Noise
    • Parasitic Capacitance
    • Drain Voltage
    • Incident Light Intensity
    • Feedback Modalities
• authors:
  • Author Name: Xiaotie Wu
    Affiliation: Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
    Author URL: https://ieeexplore.ieee.org/author/38489727400
    ID: 38489727400
    Order: 1
    Author Affiliations:
    • Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
  • Author Name: Xilin Liu
    Affiliation: Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
    Author URL: https://ieeexplore.ieee.org/author/37072402700
    ID: 37072402700
    Order: 2
    Author Affiliations:
    • Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
  • Author Name: Milin Zhang
    Affiliation: Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
    Author URL: https://ieeexplore.ieee.org/author/37085459718
    ID: 37085459718
    Order: 3
    Author Affiliations:
    • Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
  • Author Name: Jan Van der Spiegel
    Affiliation: Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA
    Author URL: https://ieeexplore.ieee.org/author/37284390100
    ID: 37284390100
    Order: 4
    Author Affiliations:
    • Department of Electrical and Systems Engineering (ESE), University of Pennsylvania, Philadelphia, PA, USA

Image Sensor

• sensor_type: CMOS
• resolution: 100x200
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• signal_to_noise_ratio: 49.6 dB
• noise: Fixed pattern noise reduced by 57.6% after calibration, with further reduction available.

Applications & Benefits

• cell_imaging: Applications in focal-plane image processing and online arithmetic processing such as motion detection and image compression.
• benefits: Improved linearity and reduced fixed-pattern noise, making it suitable for various applications.

Supporting Organizations

• supported_by: University of Pennsylvania, MOSIS

Manuscript Details

• publication_date: June 2014

Relevancy Score

• score: 10

Processed JSON Filename

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