Contact Imaging Simulation And Experiment
- doi: 10.1109/TCSI.2007.902409
-
title: Contact Imaging: Simulation and Experiment
- publisher: IEEE
- isbn:
- issn: 1558-0806
- rank: 1998
- access_type: LOCKED
- content_type: Journals
-
abstract: We report simulated and experimental image
quality for contact imaging, a method for imaging objects close to the
sensor surface without intervening optics. This technique preserves
microscale resolution for applications that can not tolerate the size or
weight of conventional optical elements. In order to assess image
quality, we investigated the spatial resolution of contact imaging,
which depends on the sensor size as well as the distance between objects
and the sensor surface. We studied how this distance affects image
quality using a commercial optical simulator. Simulation results show
that the image quality degrades as objects move away from the sensor
surface. To experimentally validate these results, an image sensor was
designed and fabricated in a commercially available three metal, two
poly, 0.5 mum CMOS technology. Experiments with the contact imager
corroborate the simulation results. Two specific applications of contact
imaging are demonstrated.
- article_number: 4282078
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4282078
-
html_url:
https://ieeexplore.ieee.org/document/4282078/
-
abstract_url:
https://ieeexplore.ieee.org/document/4282078/
-
publication_title: IEEE Transactions on Circuits and
Systems I: Regular Papers
- conference_location:
- conference_dates:
- publication_number: 8919
- is_number: 4282065
- publication_year: 2007
- publication_date: Aug. 2007
- start_page: 1698
- end_page: 1710
- citing_paper_count: 49
- citing_patent_count: 139
- download_count: 824
- insert_date: 20070730
-
index_terms:
-
ieee_terms:
- Optical imaging
- Optical sensors
- Biomedical optical imaging
- Image sensors
- Sensor arrays
- Optical films
- Image quality
- Image resolution
- Optical arrays
- Biomedical imaging
-
author_terms:
- CMOS analog integrated circuits
- contact imaging
- geometrical optics
- image resolution
- image sensors
- mixed signal analog–digital integrated circuits
-
dynamic_index_terms:
- Spatial Resolution
- Simulation Results
- Image Quality
- Image Resolution
- Image Sensor
- Camera Sensor
- Simulated Images
- Sensor Surface
- Optical Elements
- CMOS Technology
- Sensor Size
- Commercial Simulation
- Optical Simulation
- Imaging System
- Light Source
- Pixel Size
- Distance Function
- Image Plane
- Shape Parameter
- Finite-dimensional
- Infinite-dimensional
- Conventional Imaging
- Polystyrene Beads
- Maximum Contrast
- Simulated Object
- Feature Distance
- Characteristic Distance
- Sensor Array
- Central Objective
- Object Size
- Simulated Size
- Radius Of Region
- Small Pixel Size
-
authors:
-
Author Name: Honghao Ji
Affiliation: Department of Electrical and Computer
Engineering and the Institute for Systems Research, University of
Maryland, College Park, MD, USA
Author URL:
https://ieeexplore.ieee.org/author/37331470400
ID: 37331470400
Order: 1
Author Affiliations:
-
Department of Electrical and Computer Engineering and the
Institute for Systems Research, University of Maryland, College
Park, MD, USA
-
Author Name: David Sander
Affiliation: Department of Electrical and Computer
Engineering and the Institute for Systems Research, University of
Maryland, College Park, MD, USA
Author URL:
https://ieeexplore.ieee.org/author/37270818900
ID: 37270818900
Order: 2
Author Affiliations:
-
Department of Electrical and Computer Engineering and the
Institute for Systems Research, University of Maryland, College
Park, MD, USA
-
Author Name: Alfred Haas
Affiliation: Department of Electrical and Computer
Engineering and the Institute for Systems Research, University of
Maryland, College Park, MD, USA
Author URL:
https://ieeexplore.ieee.org/author/37628743900
ID: 37628743900
Order: 3
Author Affiliations:
-
Department of Electrical and Computer Engineering and the
Institute for Systems Research, University of Maryland, College
Park, MD, USA
-
Author Name: Pamela A. Abshire
Affiliation: Department of Electrical and Computer
Engineering and the Institute for Systems Research, University of
Maryland, College Park, MD, USA
Author URL:
https://ieeexplore.ieee.org/author/37270824500
ID: 37270824500
Order: 4
Author Affiliations:
-
Department of Electrical and Computer Engineering and the
Institute for Systems Research, University of Maryland, College
Park, MD, USA
Image Sensor
- sensor_type: CMOS
- resolution: 96x96
- dynamic_range: 53.6 dB
- pixel_size: 8.4 µm
- dark_current: 113.6 e-/s
Optical Data
- focal_length: not specified
- aperture: not specified
- field_of_view: not specified
- distortion: not specified
Performance Metrics
- noise: 2.5 mV (temporal noise)
Applications & Benefits
-
cell_imaging: Monitoring cultured cells embedded in
lab-on-a-chip devices.
-
benefits: High sensitivity, portability, and ability to
detect microscale objects.
Supporting Organizations
-
supported_by: National Science Foundation (NSF),
Laboratory for Physical Sciences (LPS)
Manuscript Details
- publication_date: Aug. 2007
Relevancy Score
- score: 10
-
missing_fields:
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
Processed JSON Filename
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