Conference Highlights

• doi: 10.1109/IEDM.2005.1609250
• title: Conference highlights
• publisher: IEEE
• isbn: 0-7803-9268-X
• issn: 2156-017X
• partnum: 05CH37703C
• rank: 1994
• access_type: LOCKED
• content_type: Conferences
• abstract: The following topics are dealt with: high-k metal gate stacks; integrated circuits and manufacturing; advanced interconnect technology; displays, sensors, and MEMS; organic and flexible electronics; CMOS devices; solid-state and nanoelectronic devices; nonvolatile memory technologies; MONOS and nanocrystal memories; CMOS and interconnect reliability; modeling and simulation; nanotubes and nanowires; DRAM and NAND Flash; quantum, power and compound semiconductor devices; RF power and power switching devices; gate dielectric breakdown; strained silicon technology; advanced planar CMOS devices; fully silicided gates; SRAM; bias-temperature instability and interface traps; advanced FEOL technology; SOI and multi-gate devices; resistive switching memories; image sensors and photon detectors; thin film transistors for displays and system on panel; and III-V light emitters
• article_number: 1609250
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1609250
• html_url: https://ieeexplore.ieee.org/document/1609250/
• abstract_url: https://ieeexplore.ieee.org/document/1609250/
• publication_title: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.
• conference_location: Washington, DC, USA
• conference_dates: 5-5 Dec. 2005
• publication_number: 10701
• is_number: 33791
• publication_year: 2005
• publication_date: 5-5 Dec. 2005
• start_page: IX
• end_page: XI
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 195
• insert_date: 20060403
• index_terms:
  • dynamic_index_terms:
    • National University Of Singapore
• isbn_formats:
  • format: Print ISBN, value: 0-7803-9268-X, isbnType: Historical

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Applications in digital imaging such as smartphones, medical devices, and automotive systems.
• benefits: CMOS image sensors enable digital imaging and are designed to convert light into electrical signals.

Supporting Organizations

• supported_by: Not specified

Authors

Not specified

Manuscript Details

• publication_date: 5-5 Dec. 2005

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • supported_by
  • authors
  • publication_date

Processed JSON Filename

request_4e919bfb-918c-4389-b345-c294297e3d25-conference_highlights.json