Comparison Of Bulk Vs Soi For Low Power Low Voltage Cmos Imager

• doi: 10.1109/SOIC.2001.958022
• title: Comparison of bulk vs SOI for low power low voltage CMOS imager
• publisher: IEEE
• isbn: 0-7803-6739-1
• issn: 1078-621X
• partnum: 01CH37207
• rank: 1973
• access_type: LOCKED
• content_type: Conferences
• abstract: To compare bulk silicon and SOI technologies in the field of CMOS image sensors, the authors have developed an analytical model of an APS circuit and applied it to the design of a 50 frames per second 512x512 pixels imager.
• article_number: 958022
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=958022
• html_url: https://ieeexplore.ieee.org/document/958022/
• abstract_url: https://ieeexplore.ieee.org/document/958022/
• publication_title: 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207)
• conference_location: Durango, CO, USA
• conference_dates: 1-4 Oct. 2001
• publication_number: 7596
• is_number: 20711
• publication_year: 2001
• publication_date: 1-4 Oct. 2001
• start_page: 133
• end_page: 134
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 200
• insert_date: 20020807
• index_terms:
  • ieee_terms:
    • Low voltage
    • Threshold voltage
    • Circuit noise
  • dynamic_index_terms:
    • Comparison Of Bulk
    • Field Of Engineering
    • Field Of Technology
    • Bulk Silicon
    • Dynamic Range
    • Power Consumption
    • Output Signal
    • Threshold Voltage
    • Current Reduction
    • Bias Current
    • Drain Current
• isbn_formats:
  • format: Print ISBN, value: 0-7803-6739-1, isbnType: Historical
• authors:
  • Author Name: A. Afzalian
    Affiliation: Université catholique de Louvain, Laboratoire de Microélectronique, Louvain-La-Neuve, Belgium
    Author URL: https://ieeexplore.ieee.org/author/37328461300
    ID: 37328461300
    Order: 1
    Author Affiliations:
    • Université catholique de Louvain, Laboratoire de Microélectronique, Louvain-La-Neuve, Belgium
  • Author Name: P. Delatte
    Affiliation: Laboratoire microelectronique, University of Catholique Louvain, Louvain-la-Neuve, Belgium
    Author URL: https://ieeexplore.ieee.org/author/38315025300
    ID: 38315025300
    Order: 2
    Author Affiliations:
    • Laboratoire microelectronique, University of Catholique Louvain, Louvain-la-Neuve, Belgium
    • Université catholique de Louvain, Laboratoire de Microélectronique, Louvain-La-Neuve, Belgium
  • Author Name: J.-D. Legat
    Affiliation: Laboratoire microelectronique, University of Catholique Louvain, Louvain-la-Neuve, Belgium
    Author URL: https://ieeexplore.ieee.org/author/37332452200
    ID: 37332452200
    Order: 3
    Author Affiliations:
    • Laboratoire microelectronique, University of Catholique Louvain, Louvain-la-Neuve, Belgium
    • Université catholique de Louvain, Laboratoire de Microélectronique, Louvain-La-Neuve, Belgium
  • Author Name: D. Flandre
    Affiliation: Laboratoire microelectronique, University of Catholique Louvain, Louvain-la-Neuve, Belgium
    Author URL: https://ieeexplore.ieee.org/author/37268455200
    ID: 37268455200
    Order: 4
    Author Affiliations:
    • Laboratoire microelectronique, University of Catholique Louvain, Louvain-la-Neuve, Belgium
    • Université catholique de Louvain, Laboratoire de Microélectronique, Louvain-La-Neuve, Belgium

Image Sensor

• sensor_type: CMOS
• resolution: unknown
• dynamic_range: unknown
• pixel_size: unknown
• dark_current: unknown

Optical Data

• focal_length: unknown
• aperture: unknown
• field_of_view: unknown
• distortion: unknown

Performance Metrics

• frame_rate: unknown
• signal_to_noise_ratio: unknown
• sensitivity: unknown
• shutter_speed: unknown
• power_consumption: unknown
• noise: unknown

Applications & Benefits

• cell_imaging: unknown
• benefits: unknown

Supporting Organizations

• supported_by: unknown

Manuscript Details

• publication_date: 1-4 Oct. 2001

Relevancy Score

• score: 5
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits
  • supported_by
  • authors

Processed JSON Filename

request_5db79318-cce2-4e35-8da9-e30e03372ef4-comparison_of_bulk_vs_soi_for_low_power_low_voltage_cmos_imager.json