Columnwise Roic Design With Onchip Calibration For Photoresistive Image Sensor

• doi: 10.1109/ECCTD.2017.8093315
• title: Column-wise ROIC design with on-chip calibration for photoresistive image sensor
• publisher: IEEE
• isbn: 978-1-5386-3975-7
• issn: 2474-9672
• rank: 1958
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper describes a novel readout integrated circuit (ROIC) for a photoresistive image sensor array incorporating wheatstone bridge configuration with a variable-gain switched-capacitor amplifier. A 12-bit R-2R ladder digital-to-analog converter (DAC) is used for on-chip calibration. The bias voltage of the bridge is supplied by an on-chip DAC and made programmable between 0 to 1.8 Volts for ROIC performance optimization. This image sensor and ROIC system is intended to be used as an endoscope camera which demands strict silicon area and low power consumption requirements. A sample 1×16 line sensor is used for proof of concept. The ROIC is designed for the target of 30 frames per second output data rate for a 400×1 line sensor. This work focuses on the analog signal processing chain of the ROIC. The column-wise design makes the ROIC scalable for larger image sensor sizes. The nominal (base) resistance of each detector is assumed to have a variation of (±10%). The proposed ROIC is designed in 0.18μm CMOS process and the system is verified with post-layout simulations.
• article_number: 8093315
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8093315
• html_url: https://ieeexplore.ieee.org/document/8093315/
• abstract_url: https://ieeexplore.ieee.org/document/8093315/
• publication_title: 2017 European Conference on Circuit Theory and Design (ECCTD)
• conference_location: Catania, Italy
• conference_dates: 4-6 Sept. 2017
• publication_number: 8080320
• is_number: 8093219
• publication_year: 2017
• publication_date: 4-6 Sept. 2017
• start_page: 1
• end_page: 4
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 208
• insert_date: 20171102
• index_terms:
  • ieee_terms:
    • Bridge circuits
    • Image sensors
    • Calibration
    • Detectors
    • System-on-chip
    • Logic gates
    • Sensor arrays
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Readout Integrated Circuit
    • On-chip Calibration
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Sensor Array
    • Silicon Area
    • Wheatstone Bridge
    • Impedance
    • Resistivity
    • Output Signal
    • Dark-field
    • Dark-field Microscopy
    • CMOS Technology
    • Amplifier Gain
    • Calibration Phase
    • Flat Field
    • Flat-field Correction
    • Common-mode Voltage
    • Gain Adjustment
    • Readout Circuit
    • Field Calibration
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5386-3975-7, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5386-3974-0, isbnType: New-2005
• authors:
  • Author Name: Cagatay Ozmen
    Affiliation: Electrical and Computer Engineering, University of Massachusetts, Lowell, Lowell, massachusetts
    Author URL: https://ieeexplore.ieee.org/author/37085664148
    ID: 37085664148
    Order: 1
    Author Affiliations:
    • Electrical and Computer Engineering, University of Massachusetts, Lowell, Lowell, massachusetts
  • Author Name: Aydin Dirican
    Affiliation: Electrical and Computer Engineering, University of Massachusetts, Lowell, Lowell, massachusetts
    Author URL: https://ieeexplore.ieee.org/author/37085671150
    ID: 37085671150
    Order: 2
    Author Affiliations:
    • Electrical and Computer Engineering, University of Massachusetts, Lowell, Lowell, massachusetts
  • Author Name: Hieu Nguyen
    Affiliation: Electrical and Computer Engineering, University of Massachusetts, Lowell, Lowell, massachusetts
    Author URL: https://ieeexplore.ieee.org/author/37085665354
    ID: 37085665354
    Order: 3
    Author Affiliations:
    • Electrical and Computer Engineering, University of Massachusetts, Lowell, Lowell, massachusetts
  • Author Name: Martin Margala
    Affiliation: Electrical and Computer Engineering, University of Massachusetts, Lowell, Lowell, massachusetts
    Author URL: https://ieeexplore.ieee.org/author/37271535300
    ID: 37271535300
    Order: 4
    Author Affiliations:
    • Electrical and Computer Engineering, University of Massachusetts, Lowell, Lowell, massachusetts

Image Sensor

• sensor_type: Photoresistive image sensor
• resolution: 1x16 line sensor
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 30 frames per second
• power_consumption: 250 µA (total for ROIC blocks)
• noise: Fixed-pattern noise due to resistance variation of detectors (±10%)

Applications & Benefits

• cell_imaging: Intended for endoscope camera
• benefits: Low power consumption and small silicon area.

Supporting Organizations

• supported_by: University of Massachusetts, Lowell

Manuscript Details

• publication_date: 4-6 Sept. 2017

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • use of microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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