Cmos Integrated Activepixel Sensor In Cryogenic Temperature

• doi: 10.1109/ICSENS.2014.6985012
• title: CMOS integrated aCtive-Pixel Sensor in cryogenic temperature
• publisher: IEEE
• isbn: 978-1-4799-0162-3
• issn: 1930-0395
• rank: 1857
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper will present experimental results of a slightly modified Active-Pixel Sensor (APS) circuit operating in cryogenic temperatures such as 77 K, 40 K, 20 K and 8.8 K. The optical sensor used was a silicon photodiode with its integrated electronics in a CMOS 0.35 μm technology. Active pixel circuitry with a small number of transistors is important and widely used in image sensors. A modified APS with five transistors was designed and tested under visible light at low temperatures in order to assess its hybrid further use with III-V infrared quantum detectors, which operate at these temperatures.
• article_number: 6985012
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6985012
• html_url: https://ieeexplore.ieee.org/document/6985012/
• abstract_url: https://ieeexplore.ieee.org/document/6985012/
• publication_title: SENSORS, 2014 IEEE
• conference_location: Valencia, Spain
• conference_dates: 2-5 Nov. 2014
• publication_number: 6971895
• is_number: 6984913
• publication_year: 2014
• publication_date: 2-5 Nov. 2014
• start_page: 374
• end_page: 377
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 361
• insert_date: 20141215
• index_terms:
  • ieee_terms:
    • CMOS integrated circuits
    • Optical imaging
    • Optical sensors
    • Temperature sensors
    • Optical variables measurement
    • Logic gates
    • Optical design
  • author_terms:
    • Active Pixel Sensor
    • cryogenic circuits
    • low temperature
    • CMOS analog integrated circuits
    • photodiode
    • optical sensor
    • integrated optoelectronics
  • dynamic_index_terms:
    • Cryogenic Temperatures
    • Active Pixel Sensor
    • Photodiode
    • Optical Sensors
    • Image Sensor
    • Camera Sensor
    • Temperature In Order
    • Cryopreservation
    • Cryostat
    • Infrared Imaging
    • Infrared Camera
    • Thermal Imaging
    • Thermal Camera
    • Printed Circuit Board
    • Voltage Variation
    • Power Meter
    • Parasitic Capacitance
    • Charge Mobility
    • P-n Junction
    • Optical Window
    • Pixel Array
    • Quantum Sensor
    • Sensor Pixel
    • Acceptor Concentration
    • Transistor Channel
    • Semiconductor Substrate
• isbn_formats:
  • format: Electronic ISBN, value: 978-1-4799-0162-3, isbnType: New-2005
• authors:
  • Author Name: Luciana P. Salles
    Affiliation: Graduate Program in Electrical Engineering (PPGEE), Federal University of Minas Gerais (UFMG), Belo Horizonte, MG, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37680845600
    ID: 37680845600
    Order: 1
    Author Affiliations:
    • Graduate Program in Electrical Engineering (PPGEE), Federal University of Minas Gerais (UFMG), Belo Horizonte, MG, Brazil
  • Author Name: Pedro V. F. do Rosário
    Affiliation: Graduate Program in Electrical Engineering (PPGEE), Federal University of Minas Gerais (UFMG), Belo Horizonte, MG, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37085423644
    ID: 37085423644
    Order: 2
    Author Affiliations:
    • Graduate Program in Electrical Engineering (PPGEE), Federal University of Minas Gerais (UFMG), Belo Horizonte, MG, Brazil
  • Author Name: Artur S. B. de Mello
    Affiliation: Graduate Program in Electrical Engineering (PPGEE), Federal University of Minas Gerais (UFMG), Belo Horizonte, MG, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37085415531
    ID: 37085415531
    Order: 3
    Author Affiliations:
    • Graduate Program in Electrical Engineering (PPGEE), Federal University of Minas Gerais (UFMG), Belo Horizonte, MG, Brazil
  • Author Name: Davies W. de Lima Monteiro
    Affiliation: Graduate Program in Electrical Engineering (PPGEE), Federal University of Minas Gerais (UFMG), Belo Horizonte, MG, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37680844500
    ID: 37680844500
    Order: 4
    Author Affiliations:
    • Graduate Program in Electrical Engineering (PPGEE), Federal University of Minas Gerais (UFMG), Belo Horizonte, MG, Brazil

Image Sensor

• sensor_type: CMOS
• resolution: not specified in the text
• dynamic_range: not specified in the text
• pixel_size: not specified in the text
• dark_current: not specified in the text

Optical Data

• focal_length: not specified in the text
• aperture: not specified in the text
• field_of_view: not specified in the text
• distortion: not specified in the text

Performance Metrics

• frame_rate: not specified in the text
• signal_to_noise_ratio: not specified in the text
• sensitivity: not specified in the text
• shutter_speed: not specified in the text
• power_consumption: not specified in the text
• noise: not specified in the text

Applications & Benefits

• cell_imaging: not specified in the text
• benefits: not specified in the text

Supporting Organizations

• supported_by: CAPES, FAPEMIG, CNPq

Manuscript Details

• publication_date: 2-5 Nov. 2014

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits

Processed JSON Filename

request_6c2b480d-a4c3-4e33-81d7-c35b2d488525-cmos_integrated_activepixel_sensor_in_cryogenic_temperature.json