Cmos Image Sensor With Shared Inpixel Amplifier And Calibration Facility

• doi: 10.1109/APCCAS.2002.1115132
• title: CMOS image sensor with shared in-pixel amplifier and calibration facility
• publisher: IEEE
• isbn: 0-7803-7690-0
• issn:
• partnum: 02EX636
• rank: 1839
• access_type: LOCKED
• content_type: Conferences
• abstract: A CMOS image sensor is presented which uses a feedback loop to keep the reverse bias voltage of the photo diode on a constant value in order to reduce the dark current. In order to preserve pixel cell area the amplifier required in the feedback loop is located partly in the pixel cell and partly in the readout circuit. The sensor has an on-chip calibration facility, the resulting fixed pattern noise is less than 0.02%. When operated in voltage mode it has a logarithmic response, but it can also be operated in current mode where it shows linear behavior. The proposed pixel cell has been implemented in a 0.6 /spl mu/m CMOS technology. With its size of (15 /spl times/ 15)/spl mu/m/sup 2/ it is only slightly larger than a standard integrating pixel cell with approximately the same photosensitivity while having approximately the same power dissipation. The fill factor is about 27%. The pixel cell is suited for video rate operation (50 fps) in image sensor arrays with moderate resolution.
• article_number: 1115132
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1115132
• html_url: https://ieeexplore.ieee.org/document/1115132/
• abstract_url: https://ieeexplore.ieee.org/document/1115132/
• publication_title: Asia-Pacific Conference on Circuits and Systems
• conference_location: Denpasar, Indonesia
• conference_dates: 28-31 Oct. 2002
• publication_number: 8182
• is_number: 24592
• publication_year: 2002
• publication_date: 28-31 Oct. 2002
• start_page: 93
• end_page: 96 vol.2
• citing_paper_count: 4
• citing_patent_count: 1
• download_count: 436
• insert_date: 20030106
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Calibration
    • Feedback loop
    • Voltage
    • CMOS technology
    • Sensor arrays
    • Diodes
    • Dark current
    • Feedback circuits
    • Circuit noise
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Calibration Facility
    • Feedback Loop
    • Photodiode
    • Fill Factor
    • Dark Current
    • Voltage Mode
    • CMOS Technology
    • Diode Voltage
    • Readout Circuit
    • Reverse Bias Voltage
    • Random Variables
    • Photocurrent
    • Threshold Voltage
    • Settling Time
    • Colonial Times
    • Minimum Voltage
    • Operational Amplifier
    • Op-amp
    • Differential Pair
    • Subthreshold Slope
    • Open-loop Gain
    • Silicon Area
    • Gate Source
• isbn_formats:
  • format: Print ISBN, value: 0-7803-7690-0, isbnType: Historical
• authors:
  • Author Name: A. Graupner
    Affiliation: Department of Electrical Engineering, Dresden University of Technology, Dresden, Germany
    Author URL: https://ieeexplore.ieee.org/author/37266954300
    ID: 37266954300
    Order: 1
    Author Affiliations:
    • Department of Electrical Engineering, Dresden University of Technology, Dresden, Germany
  • Author Name: M. Tanzer
    Affiliation: Advanced Micro Devices Saxony, Dresden, Germany
    Author URL: https://ieeexplore.ieee.org/author/37266950200
    ID: 37266950200
    Order: 2
    Author Affiliations:
    • Advanced Micro Devices Saxony, Dresden, Germany
  • Author Name: R. Schuffny
    Affiliation: Department of Electrical Engineering, Dresden University of Technology, Dresden, Germany
    Author URL: https://ieeexplore.ieee.org/author/37266953100
    ID: 37266953100
    Order: 3
    Author Affiliations:
    • Department of Electrical Engineering, Dresden University of Technology, Dresden, Germany

Image Sensor

• sensor_type: CMOS
• resolution: 288 x 352
• dynamic_range: Not explicitly mentioned in the text
• pixel_size: 15 x 15 µm²
• dark_current: < (Iph) where Iph is the photocurrent

Optical Data

• focal_length: Not mentioned
• aperture: Not mentioned
• field_of_view: Not mentioned
• distortion: Not mentioned

Performance Metrics

• frame_rate: 50 fps
• signal_to_noise_ratio: Not directly stated
• sensitivity: Not mentioned
• shutter_speed: Not mentioned
• power_consumption: Comparable to a simple logarithmic response pixel
• noise: Fixed-pattern noise of < 0.02% in voltage mode, 1-4% in current mode

Applications & Benefits

• cell_imaging: Suitable for video rate operation in image sensor arrays with moderate resolution.
• benefits: Reduces dark current and fixed pattern noise while maintaining small chip area and low power dissipation.

Supporting Organizations

• supported_by: Deutsche Forschungsgemeinschaft (DFG), Sonderforschungsbereich 358 - Teilprojekt A7

Manuscript Details

• publication_date: 28-31 Oct. 2002

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed

Processed JSON Filename

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