Cmos Image Sensor With Areaefficient Blockbased Compressive Sensing

• doi: 10.1109/JSEN.2015.2397874
• title: CMOS Image Sensor With Area-Efficient Block-Based Compressive Sensing
• publisher: IEEE
• isbn:
• issn: 2379-9153
• rank: 1772
• access_type: LOCKED
• content_type: Journals
• abstract: We have designed, fabricated, and measured the performance of a linear and area-efficient implementation of the compressive sensing (CS) method in CMOS image sensors. The use of an active pixel sensor (APS) with an integrator and in-pixel current switches are exploited to develop a compact implementation of CS encoding in analog domain. The intrinsic linearity of APS with integrator circuit guarantees the linearity of the CS encoding structure. The CS measurement process is performed for different blocks of the imager separately. This block-based implementation provides individual access to all the pixels from outside the array, resulting in a scalable design with relatively high fill-factor using only two transistors in each pixel. The CS-CMOS image sensor is designed and fabricated in 130-nm technology for 2 × 2, 4 × 4, and 16 × 16 arrays. The linearity of the extracted measurement is confirmed by the experimental results from 2 × 2 and 4 × 4 blocks. In addition, the block readout scheme and the scalability of the design is examined by fabricating a larger array of 4 × 4 blocks.
• article_number: 7029086
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7029086
• html_url: https://ieeexplore.ieee.org/document/7029086/
• abstract_url: https://ieeexplore.ieee.org/document/7029086/
• publication_title: IEEE Sensors Journal
• conference_location:
• conference_dates:
• publication_number: 7361
• is_number: 7106029
• publication_year: 2015
• publication_date: July 2015
• start_page: 3699
• end_page: 3710
• citing_paper_count: 26
• citing_patent_count: 0
• download_count: 981
• insert_date: 20150202
• index_terms:
  • ieee_terms:
    • Arrays
    • Sensors
    • Random sequences
    • Image sensors
    • Capacitors
    • Photoconductivity
    • Current measurement
  • author_terms:
    • Compressive sensing
    • CMOS imager
    • Active pixel sensor (APS) with integrator
    • Current switch
    • Block readout
    • Compressive sensing
    • CMOS imager
    • active pixel sensor (APS) with integrator
    • current switch
    • Block read-out
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Integrated Circuit
    • Sensor Pixel
    • Analog Domain
    • Measurement Values
    • Random Sequence
    • Integration Time
    • Random Generation
    • Random Number Generator
    • Noise Sources
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Light Levels
    • Signatures Of Selection
    • Reconstruction Quality
    • Shot Noise
    • Poisson Noise
    • Parasitic Capacitance
    • Signal-to-noise Ratio Values
    • Noisy Measurements
    • Image Block
    • Different Values Of Number
    • Random Bits
    • Light Intensity Levels
    • Integration Period
    • Random Projection
    • Shift Register
    • Measurement Circuit
    • Readout Time
    • Photodiode
    • Integration Interval
    • Photocurrent Values
    • Encoding Processes
• authors:
  • Author Name: Mohammadreza Dadkhah
    Affiliation: Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada
    Author URL: https://ieeexplore.ieee.org/author/38556486600
    ID: 38556486600
    Order: 1
    Author Affiliations:
    • Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada
  • Author Name: M. Jamal Deen
    Affiliation: Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada
    Author URL: https://ieeexplore.ieee.org/author/38557801900
    ID: 38557801900
    Order: 2
    Author Affiliations:
    • Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada
  • Author Name: Shahram Shirani
    Affiliation: Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada
    Author URL: https://ieeexplore.ieee.org/author/37270762600
    ID: 37270762600
    Order: 3
    Author Affiliations:
    • Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada

Image Sensor

• sensor_type: CMOS
• resolution: 2x2, 4x4, 16x16 arrays
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Various applications including radar imaging, DNA microarrays, MRI, fluorescent imaging, and biomedical applications.
• benefits: Efficient sampling strategy, reduced data transmission requirements through compressive sensing.

Supporting Organizations

• supported_by: Natural Science and Engineering Research Council of Canada, Canada Research Chair Program, CMC Microsystems

Manuscript Details

• publication_date: July 2015

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • temporal noise
  • fixed-pattern noise
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_b31b0850-9865-410b-af78-95eead01ca46-cmos_image_sensor_with_areaefficient_blockbased_compressive_sensing.json