Cmos Image Sensor Random Telegraph Noise Time Constant Extraction From Correlated To Uncorrelated Double Sampling

• doi: 10.1109/JEDS.2016.2623799
• title: CMOS Image Sensor Random Telegraph Noise Time Constant Extraction From Correlated To Uncorrelated Double Sampling
• publisher: IEEE
• isbn:
• issn: 2168-6734
• rank: 1771
• access_type: OPEN_ACCESS
• content_type: Journals
• abstract: A new method for on-chip random telegraph noise (RTN) characteristic time constant extraction using the double sampling circuit in an 8.3 Mpixel CMOS image sensor is described. The dependence of the measured RTN on the time difference between the double sampling and the key equation used for time constant extraction are derived from the continuous time RTN model and the discrete event RTN model. Both approaches lead to the same result and describe the data reasonably well. From the detailed study of the noisiest 1000 pixels, we find that about 75% to 85% of them show the signature of a single-trap RTN behavior with three distinct signal levels, and about 96% of the characteristic time constants fall between 1 μs and 500 μs with the median around 10 μs at room temperature.
• article_number: 7731134
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7731134
• html_url: https://ieeexplore.ieee.org/document/7731134/
• abstract_url: https://ieeexplore.ieee.org/document/7731134/
• publication_title: IEEE Journal of the Electron Devices Society
• conference_location:
• conference_dates:
• publication_number: 6245494
• is_number: 7792235
• publication_year: 2017
• publication_date: Jan. 2017
• start_page: 79
• end_page: 89
• citing_paper_count: 18
• citing_patent_count: 0
• download_count: 3881
• insert_date: 20161102
• index_terms:
  • ieee_terms:
    • Histograms
    • Circuit noise
    • Mathematical model
    • Noise measurement
    • Electron devices
    • Object recognition
    • CMOS image sensors
  • author_terms:
    • Random telegraph noise (RTN)
    • CMOS image sensor (CIS)
    • correlated double sampling (CDS)
  • dynamic_index_terms:
    • Time Constant
    • Random Noise
    • Channel Noise
    • Image Sensor
    • Camera Sensor
    • Double Sampling
    • Random Telegraph Noise
    • Uncorrelated Samples
    • Time Difference
    • Continuous-time
    • Continuous Signal
    • Continuous Model
    • Continuum Model
    • Statistical Distribution
    • Empirical Cumulative Distribution Function
    • Empirical Distribution Function
    • Probability Function
    • Probability Map
    • Long Tail
    • Tail Of Distribution
    • Laplace Transform
    • Complex Frequency
    • Laplace Domain
    • Explicit Expression
    • Noise Distribution
    • Quantile Function
    • Inverse Cumulative Distribution Function
    • Inverse Distribution Function
    • Continuous-time Model
    • Bias Conditions
    • Inverse Laplace Transform
    • Occupied States
    • Empty States
    • Flicker Noise
    • Switches S1
    • PIN Photodiode
    • Readout Circuit
    • Medium Noise
    • Test Chip
    • Pixel Noise
    • Circuit Simulation
• authors:
  • Author Name: Calvin Yi-Ping Chao
    Affiliation: Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37085699985
    ID: 37085699985
    Order: 1
    Author Affiliations:
    • Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
  • Author Name: Honyih Tu
    Affiliation: Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37849197500
    ID: 37849197500
    Order: 2
    Author Affiliations:
    • Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
  • Author Name: Thomas Wu
    Affiliation: Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37086202276
    ID: 37086202276
    Order: 3
    Author Affiliations:
    • Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
  • Author Name: Kuo-Yu Chou
    Affiliation: Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/38248164500
    ID: 38248164500
    Order: 4
    Author Affiliations:
    • Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
  • Author Name: Shang-Fu Yeh
    Affiliation: Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37708389500
    ID: 37708389500
    Order: 5
    Author Affiliations:
    • Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
  • Author Name: Fu-Lung Hsueh
    Affiliation: Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37355868900
    ID: 37355868900
    Order: 6
    Author Affiliations:
    • Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan

Image Sensor

• sensor_type: CMOS
• resolution: 8.3 Mpixels
• dynamic_range: 2-V differential input range
• pixel_size: 1.1 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 10 MHz
• signal_to_noise_ratio: about 0.21 e-rms at 8X gain and 1.72 e-rms at 1X gain
• noise: about 14.6 e-rms KTC noise

Applications & Benefits

• cell_imaging: used in smartphones, medical devices, automotive systems
• benefits: enables digital imaging, enhances image quality and sensor performance through various design considerations

Supporting Organizations

• supported_by: Taiwan Semiconductor Manufacturing Company

Manuscript Details

• publication_date: Jan. 2017

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • quantum_efficiency
  • fill_factor
  • dark_current
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_42ead50a-b551-49c0-9f3a-1668b6515fa4-cmos_image_sensor_random_telegraph_noise_time_constant_extraction_from_correlated_to_uncorrelated_double_sampling.json