Cmos Image Sensor Binning Circuit For Lowlight Imaging

• doi: 10.1109/ISIEA.2011.6108780
• title: CMOS image sensor binning circuit for low-light imaging
• publisher: IEEE
• isbn: 978-1-4577-1416-0
• issn:
• partnum: 11EX5722
• rank: 1820
• access_type: LOCKED
• content_type: Conferences
• abstract: This work presents a column level binning circuit for a CMOS image sensor for detecting low-light imaging. A 2×2 kernel pixel binning (averaging) is employed in this design reducing the spatial resolution to 1/4 of the original size and every two columns of the pixel array share one binning circuit. The output signal of each pixel is sampled unto the binning circuit basically composed of two adjacent correlated double sampling circuits averaged by means of a row average switch. A 0.18um CMOS process was used to simulate the circuit and simulation results reveal a kernel averaging error of ≤2% for low-light conditions with a power consumption of 123.9uW.
• article_number: 6108780
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6108780
• html_url: https://ieeexplore.ieee.org/document/6108780/
• abstract_url: https://ieeexplore.ieee.org/document/6108780/
• publication_title: 2011 IEEE Symposium on Industrial Electronics and Applications
• conference_location: Langkawi, Malaysia
• conference_dates: 25-28 Sept. 2011
• publication_number: 6098798
• is_number: 6108666
• publication_year: 2011
• publication_date: 25-28 Sept. 2011
• start_page: 586
• end_page: 589
• citing_paper_count: 5
• citing_patent_count: 2
• download_count: 991
• insert_date: 20111222
• index_terms:
  • ieee_terms:
    • Capacitors
    • Kernel
    • CMOS integrated circuits
    • Switches
    • CMOS image sensors
    • Integrated circuit modeling
  • author_terms:
    • formatting
    • CMOS image sensor
    • binning
    • kernel averaging
    • correlated double sampling
  • dynamic_index_terms:
    • Low-light Image
    • Simulation Results
    • Pixel Array
    • Pixel Binning
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Image Quality
    • Ideal Value
    • Translational Level
    • Level Shift
    • Sample Holder
    • Low Light
    • Values Of Ca
    • Gate Capacitance
• isbn_formats:
  • format: CD, value: 978-1-4577-1416-0, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4577-1418-4, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4577-1417-7, isbnType: New-2005
• authors:
  • Author Name: Hong-Yi Huang
    Affiliation: Graduate Institute of Electrical Engineering, National Taipei University, Sanshia, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37275099100
    ID: 37275099100
    Order: 1
    Author Affiliations:
    • Graduate Institute of Electrical Engineering, National Taipei University, Sanshia, Taiwan
  • Author Name: Patrick Adrian Conge
    Affiliation: Graduate Institute of Electrical Engineering, National Taipei University, Sanshia, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37088269084
    ID: 37088269084
    Order: 2
    Author Affiliations:
    • Graduate Institute of Electrical Engineering, National Taipei University, Sanshia, Taiwan
  • Author Name: Li-Wei Huang
    Affiliation: Institute of Computer and Communication, National Taipei University of Science and Technology, Taipei, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37088266259
    ID: 37088266259
    Order: 3
    Author Affiliations:
    • Institute of Computer and Communication, National Taipei University of Science and Technology, Taipei, Taiwan

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• power_consumption: 123.9uW

Applications & Benefits

• cell_imaging: Details about low-light imaging applications are implied
• benefits: Improved accuracy for low-light level conditions with kernel averaging technique.

Supporting Organizations

• supported_by: National Taipei University, National Taipei University of Science and Technology

Manuscript Details

• publication_date: 25-28 Sept. 2011

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • temporal noise
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_066caa03-e7d6-454f-8204-06e47531aa1a-cmos_image_sensor_binning_circuit_for_lowlight_imaging.json