Cmos Aps With Inpixel Discrimination And Improved Rolling Shutter Architecture For Charged Particle Tracking

• doi: 10.1109/NSSMIC.2013.6829682
• title: CMOS APS with in-pixel discrimination and improved rolling shutter architecture for charged particle tracking
• publisher: IEEE
• isbn: 978-1-4799-3423-2
• issn: 1082-3654
• rank: 1754
• access_type: LOCKED
• content_type: Conferences
• abstract: The tradeoff between readout speed, granularity, power consumption, material budget and radiation hardness has balanced in favor of CMOS Active Pixel Sensor (APS) technology for the pixel detector of the incoming ALICE Muon Forward Tracker experiment. In order to avoid pile-up effects in HL-LHC, the classical rolling shutter readout system of CMOS APS, dedicated to charged particle tracking, should be improved to overcome the readout speed limit induced by the row by row signal processing. The proposed solution is based on a novel pixel design including the sensing diode, the analogue signal amplification, a correlated double sampling circuit and an auto-zeroed differential discriminator, all within a 25 μm pitch square pixel. The resulting Rolling Shutter Binary Pixel architecture (RSBPix) allows more than two rows being readout simultaneously. This paper presents a RSBPix prototype designed and fabricated in a 0.18 μm CMOS Image Sensor process. A description of the ASIC architecture is provided, followed by the detailed test results from laboratory measurements. First achievements of a low temporal and fixed pattern noise, fast readout speed (160 ns per row) digital pixel are shown.
• article_number: 6829682
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6829682
• html_url: https://ieeexplore.ieee.org/document/6829682/
• abstract_url: https://ieeexplore.ieee.org/document/6829682/
• publication_title: 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC)
• conference_location: Seoul, Korea (South)
• conference_dates: 27 Oct.-2 Nov. 2013
• publication_number: 6819718
• is_number: 6829008
• publication_year: 2013
• publication_date: 27 Oct.-2 Nov. 2013
• start_page: 1
• end_page: 6
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 187
• insert_date: 20140612
• index_terms:
  • ieee_terms:
    • Noise
    • Transistors
    • CMOS integrated circuits
    • Application specific integrated circuits
    • Sensors
    • Noise measurement
  • dynamic_index_terms:
    • Charged Particles
    • Rolling Shutter
    • Charged-particle Tracks
    • Active Pixel Sensor
    • Prototype
    • Signal Processing
    • Power Consumption
    • Laboratory Measurements
    • Image Sensor
    • Camera Sensor
    • Active Sensors
    • Analog Signal
    • Parallel Signaling
    • Square Pixels
    • Ratio Of Pixels
    • Radiation Tolerance
    • Radiation Hardness
    • Sensor Pixel
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Integration Time
    • Conversion Factor
    • Low Noise
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Charge Collection
    • Voltage Levels
    • Temporal Noise
    • Charge Collection Efficiency
    • Noise Suppression
    • Active Noise Control
    • Noise-canceling
    • Noise Distribution
    • Transistor Size
    • Transistor Count
    • High Energy Physics
    • Switching Noise
• isbn_formats:
  • format: DVD ISBN, value: 978-1-4799-3423-2, isbnType: New-2005
  • format: CD, value: 978-1-4799-0533-1, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4799-0534-8, isbnType: New-2005
• authors:
  • Author Name: F. Guilloux
    Affiliation: CEA Saclay, IRFU, France
    Author URL: https://ieeexplore.ieee.org/author/37398000600
    ID: 37398000600
    Order: 1
    Author Affiliations:
    • CEA Saclay, IRFU, France
  • Author Name: Y. Deǧerli
    Affiliation: CEA Saclay, IRFU, France
    Author URL: https://ieeexplore.ieee.org/author/38348452900
    ID: 38348452900
    Order: 2
    Author Affiliations:
    • CEA Saclay, IRFU, France
  • Author Name: C. Flouzat
    Affiliation: CEA Saclay, IRFU, France
    Author URL: https://ieeexplore.ieee.org/author/38017798300
    ID: 38017798300
    Order: 3
    Author Affiliations:
    • CEA Saclay, IRFU, France
  • Author Name: F. Orsini
    Affiliation: CEA Saclay, IRFU, France
    Author URL: https://ieeexplore.ieee.org/author/37268540800
    ID: 37268540800
    Order: 4
    Author Affiliations:
    • CEA Saclay, IRFU, France
  • Author Name: P. Venault
    Affiliation: CEA Saclay, IRFU, France
    Author URL: https://ieeexplore.ieee.org/author/38076365600
    ID: 38076365600
    Order: 5
    Author Affiliations:
    • CEA Saclay, IRFU, France

Image Sensor

• sensor_type: CMOS Active Pixel Sensor (APS)
• resolution: 96 x 64 pixels
• dynamic_range: Not explicitly mentioned
• pixel_size: 25 µm
• dark_current: Not explicitly mentioned

Optical Data

• focal_length: Not explicitly mentioned
• aperture: Not explicitly mentioned
• field_of_view: Not explicitly mentioned
• distortion: Not explicitly mentioned

Performance Metrics

• frame_rate: Readout Time < 25 µs
• signal_to_noise_ratio: 17 e- rms (temporal noise), 9 e- rms (fixed-pattern noise)
• sensitivity: Not explicitly mentioned
• shutter_speed: T row = 160 ns (for rolling shutter)
• power_consumption: 0.3 W/cm² (power dissipation)
• noise: Temporal noise: 17 e- rms; Fixed-pattern noise: 9 e- rms

Applications & Benefits

• cell_imaging: Not explicitly mentioned
• benefits: Low noise operation suitable for charged particle tracking applications, high detection efficiency (99.9%) and fast readout capability.

Supporting Organizations

• supported_by: CEA Saclay, IRFU, France; ALICE MFT collaboration

Manuscript Details

• publication_date: 27 Oct.-2 Nov. 2013

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • specific dark current value
  • focal length
  • aperture
  • field of view
  • distortion

Processed JSON Filename

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