Cmos Aps Crosstalk Modeling Technology And Design Trends
- doi: 10.1109/ICSENS.2004.1426410
-
title: CMOS APS crosstalk: modeling, technology and
design trends
- publisher: IEEE
- isbn: 0-7803-8692-2
- issn:
- partnum: 04CH37603
- rank: 1751
- access_type: LOCKED
- content_type: Conferences
-
abstract: In this work based on a unique sub-micron
scanning system (S-cube system) measurements of the lateral
photoresponse and crosstalk (CTK) in CMOS active pixel sensor (APS) have
been investigated and an analytical model was developed for crosstalk
estimation in photodiode based CMOS APS arrays. Based on handy process
and design data only, our model estimates the CTK contribution to the
readout pixel from each particular neighbor. It reveals the photosignal
and the CTK dependence on the pixel's geometrical shape (the photodiode
active area and perimeter) and the pixel arrangement within the array
and brings out clearly the possibility of a design enabling minimum and
symmetrical CTK, and thus can be used as a predictive tool for design
optimization. The trends that promise to increase CMOS image sensor
performance are presented and design tradeoffs intended to optimize the
photoresponse and minimize crosstalk are discussed.
- article_number: 1426410
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1426410
-
html_url:
https://ieeexplore.ieee.org/document/1426410/
-
abstract_url:
https://ieeexplore.ieee.org/document/1426410/
- publication_title: SENSORS, 2004 IEEE
- conference_location: Vienna, Austria
- conference_dates: 24-27 Oct. 2004
- publication_number: 9624
- is_number: 30805
- publication_year: 2004
- publication_date: 24-27 Oct. 2004
- start_page: 1261
- end_page: 1264 vol.3
- citing_paper_count: 1
- citing_patent_count: 0
- download_count: 260
- insert_date: 20050509
-
index_terms:
-
ieee_terms:
- Crosstalk
- Semiconductor device modeling
- CMOS technology
- Sensor arrays
- Photodiodes
- Design optimization
- Sensor systems
- Analytical models
- Process design
- CMOS image sensors
-
dynamic_index_terms:
- Data Processing
- Photodiode
- Image Sensor
- Camera Sensor
- Optimization Tool
- Sensor Pixel
- Total Yield
- Total Output
- Design Points
- Scan Area
- Signaling Crosstalk
- Minority Carrier
- Contribution Of Diffusion
- Conversion Gain
-
isbn_formats:
-
format: Print ISBN,
value: 0-7803-8692-2,
isbnType: Historical
-
authors:
-
Author Name: I. Shcherback
Affiliation: Ben-Gurion University of the Negev,
Beer-Sheva, Southern, IL
Author URL:
https://ieeexplore.ieee.org/author/38271602200
ID: 38271602200
Order: 1
Author Affiliations:
-
Ben-Gurion University of the Negev, Beer-Sheva, Southern, IL
-
Author Name: A. Belenky
Affiliation: Ben-Gurion University of the Negev,
Beer-Sheva, Southern, IL
Author URL:
https://ieeexplore.ieee.org/author/38276353100
ID: 38276353100
Order: 2
Author Affiliations:
-
Ben-Gurion University of the Negev, Beer-Sheva, Southern, IL
-
Author Name: O. Yadid-Pecht
Affiliation: VLSI Syst. Center, Ben-Gurion Univ. of
the Negev, Beer-Sheva, Israel
Author URL:
https://ieeexplore.ieee.org/author/38298354100
ID: 38298354100
Order: 3
Author Affiliations:
-
VLSI Syst. Center, Ben-Gurion Univ. of the Negev, Beer-Sheva,
Israel
Image Sensor
- sensor_type: CMOS
- resolution: Not specified
- dynamic_range: Not specified
- pixel_size: Not specified
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
Applications & Benefits
- cell_imaging: Not specified
- benefits: Not specified
Supporting Organizations
- supported_by: Not specified
Manuscript Details
- publication_date: 24-27 Oct. 2004
Relevancy Score
- score: 8
-
missing_fields:
- resolution
- dynamic_range
- pixel_size
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
- cell_imaging
- benefits
- supporting_organizations
- publication_date
Processed JSON Filename
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