Cmos Active Pixel Sensor With Onchip Successive Approximation
Analogtodigital Converter
- doi: 10.1109/16.628833
-
title: CMOS active pixel sensor with on-chip successive
approximation analog-to-digital converter
- publisher: IEEE
- isbn:
- issn: 1557-9646
- rank: 1806
- access_type: LOCKED
- content_type: Journals
-
abstract: The first CMOS active pixel sensor (APS) with
on-chip column-parallel successive-approximation analog-to-digital
converter (ADC) is reported. A 64/spl times/64 element CMOS APS
implemented in a 1.2-/spl mu/m n-well single-poly, double-metal process
with 24-/spl mu/m pixel pitch is integrated with a 64/spl times/1 array
of column parallel successive approximation 8-b ADCs. Good image quality
was observed. The capacitively-coupled ADCs dissipate approximately 1
/spl mu/W-s/ksample and occupy 0.05 mm/sup 2/ of chip area.
- article_number: 628833
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=628833
-
html_url:
https://ieeexplore.ieee.org/document/628833/
-
abstract_url:
https://ieeexplore.ieee.org/document/628833/
-
publication_title: IEEE Transactions on Electron
Devices
- conference_location:
- conference_dates:
- publication_number: 16
- is_number: 13675
- publication_year: 1997
- publication_date: Oct. 1997
- start_page: 1759
- end_page: 1763
- citing_paper_count: 70
- citing_patent_count: 5
- download_count: 938
- insert_date: 20020806
-
index_terms:
-
ieee_terms:
- Analog-digital conversion
- CMOS image sensors
- Sensor arrays
- Crosstalk
- Pain
- Image quality
- Image sensors
- CMOS technology
- Space technology
- CMOS process
-
dynamic_index_terms:
- Analog-to-digital Converter
- Analog-to-digital
- Digital-to-analog Converter
- Successive Approximation
- Active Pixel Sensor
- Dissipation
- Good Image Quality
- Good-quality Images
- Chip Area
- Quantitative Measures
- Inaccuracy
- Image Sensor
- Camera Sensor
- Dark Current
- Conversion Time
- Upper Plate
- Clock Cycles
- Capacitor Bank
- Conversion Gain
- Temporal Noise
- Capacitor Size
-
authors:
-
Author Name: Zhimin Zhou
Affiliation: Jet Propulsion Laboratory, California
Institute of Technology, Pasadena, CA, USA
Author URL:
https://ieeexplore.ieee.org/author/37087157307
ID: 37087157307
Order: 1
Author Affiliations:
-
Jet Propulsion Laboratory, California Institute of Technology,
Pasadena, CA, USA
-
Author Name: B. Pain
Affiliation: Jet Propulsion Laboratory, California
Institute of Technology, Pasadena, CA, USA
Author URL:
https://ieeexplore.ieee.org/author/37326642900
ID: 37326642900
Order: 2
Author Affiliations:
-
Jet Propulsion Laboratory, California Institute of Technology,
Pasadena, CA, USA
-
Author Name: E.R. Fossum
Affiliation: Photobit, La Crescenta, CA, USA
Author URL:
https://ieeexplore.ieee.org/author/37326789400
ID: 37326789400
Order: 3
Author Affiliations:
- Photobit, La Crescenta, CA, USA
Image Sensor
- sensor_type: CMOS active pixel sensor (APS)
- resolution: 64x64 pixels
- dynamic_range: Not specified
- pixel_size: 24 µm
- dark_current: 12-13 LSB counts/s (50 mV/s)
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
-
frame_rate: 1000 frames/s (up to average of 4 Mpixels/s
output)
- power_consumption: 50 µW at 50 ksamples/s
- noise: Less than 1 LSB for INL and DNL
Applications & Benefits
- cell_imaging: Not specified
-
benefits: Good gray scale reproduction, low power
dissipation, integration of ADC enhances digital interface performance.
Supporting Organizations
-
supported_by: Jet Propulsion Laboratory, California
Institute of Technology; Photobit
Manuscript Details
- publication_date: Oct. 1997
Relevancy Score
- score: 10
-
missing_fields:
- dynamic_range
- quantum_efficiency
- fill_factor
- focal_length
- aperture
- field_of_view
- distortion
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- noise
Processed JSON Filename
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